Patents by Inventor Qinjiar Zhang

Qinjiar Zhang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8406375
    Abstract: The present invention discloses an article inspection device, comprising: an x-ray machine, a collimation unit, a transmission detector array and a scattering detector array. The scattering detector array comprising a plurality of same scattering detector modules arranged in a matrix of i-rows and j-columns. A transmission cross section of the article transmitted by the x-rays is divided into a plurality of same sub-regions arranged in a matrix of i-rows and j-columns. The plurality of scattering detector modules arranged in i-rows and j-columns correspond to the plurality of sub-regions arranged in i-rows and j-columns one by one for detecting pair production effect annihilation photons and Compton-effect scattering photons from the respective sub-regions. Obtaining atomic numbers of the respective sub-regions based on a ratio of the pair production effect annihilation photon count to the Compton-effect scattering photon count, so as to form a three-dimensional image of the article.
    Type: Grant
    Filed: December 28, 2010
    Date of Patent: March 26, 2013
    Assignees: Tsinghua University, Nuctech Company Limited
    Inventors: Yigang Yang, Tiezhu Li, Qinjiar Zhang, Yi Zhang, Yingkang Jin, Qinghao Chen, Yuanjing Li, Yinong Liu