Patents by Inventor Qinling Zheng
Qinling Zheng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12260347Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.Type: GrantFiled: May 15, 2023Date of Patent: March 25, 2025Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Qinling Zheng, Nima Elyasi, Vikas Sinha, Changho Choi
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Patent number: 12197259Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.Type: GrantFiled: June 23, 2023Date of Patent: January 14, 2025Assignee: Samsung Electronics Co., Ltd.Inventors: Zhan Ping, Qinling Zheng
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Patent number: 11902092Abstract: Provided are systems, methods, and apparatuses for latency-aware edge computing to optimize network traffic. A method can include: determining network parameters associated with a network architecture, the network architecture comprising a data center and an edge data center; determining, using the network parameters, a first programmatically expected latency associated with the data center and a second programmatically expected latency associated with the edge data center; and determining, based at least in part on a difference between the first programmatically expected latency or the second programmatically expected latency, a distribution of a workload to be routed between the data center and the edge data center.Type: GrantFiled: February 13, 2020Date of Patent: February 13, 2024Assignee: Samsung Electronics Co., Ltd.Inventors: Qinling Zheng, Ehsan Najafabadi, Yasser Zaghloul
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Publication number: 20230333613Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.Type: ApplicationFiled: June 23, 2023Publication date: October 19, 2023Inventors: Zhan Ping, Qinling Zheng
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Publication number: 20230281489Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.Type: ApplicationFiled: May 15, 2023Publication date: September 7, 2023Inventors: Qinling ZHENG, Nima ELYASI, Vikas SINHA, Changho CHOI
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Publication number: 20230274166Abstract: In a method for training a machine learning model, the method includes: segmenting, by a processor, a dataset from a database into one or more datasets based on time period windows; assigning, by the processor, one or more weighted values to the one or more datasets according to the time period windows of the one or more datasets; generating, by the processor, a training dataset from the one or more datasets according to the one or more weighted values; and training, by the processor, the machine learning model using the training dataset.Type: ApplicationFiled: May 5, 2023Publication date: August 31, 2023Inventors: Nima Elyasi, Vikas Sinha, Qinling Zheng, Changho Choi
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Patent number: 11709528Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.Type: GrantFiled: September 23, 2020Date of Patent: July 25, 2023Assignee: Samsung Electronics Co., Ltd.Inventors: Zhan Ping, Qinling Zheng
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Patent number: 11669754Abstract: In a method for training a machine learning model, the method includes: segmenting, by a processor, a dataset from a database into one or more datasets based on time period windows; assigning, by the processor, one or more weighted values to the one or more datasets according to the time period windows of the one or more datasets; generating, by the processor, a training dataset from the one or more datasets according to the one or more weighted values; and training, by the processor, the machine learning model using the training dataset.Type: GrantFiled: May 11, 2020Date of Patent: June 6, 2023Assignee: Samsung Electronics Co., Ltd.Inventors: Nima Elyasi, Vikas Sinha, Qinling Zheng, Changho Choi
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Patent number: 11657300Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.Type: GrantFiled: May 13, 2020Date of Patent: May 23, 2023Inventors: Qinling Zheng, Nima Elyasi, Vikas Sinha, Changho Choi
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Publication number: 20210264298Abstract: In a method for training a machine learning model, the method includes: segmenting, by a processor, a dataset from a database into one or more datasets based on time period windows; assigning, by the processor, one or more weighted values to the one or more datasets according to the time period windows of the one or more datasets; generating, by the processor, a training dataset from the one or more datasets according to the one or more weighted values; and training, by the processor, the machine learning model using the training dataset.Type: ApplicationFiled: May 11, 2020Publication date: August 26, 2021Inventors: Nima Elyasi, Vikas Sinha, Qinling Zheng, Changho Choi
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Publication number: 20210264294Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.Type: ApplicationFiled: May 13, 2020Publication date: August 26, 2021Inventors: Qinling ZHENG, Nima ELYASI, Vikas SINHA, Changho CHOI
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Publication number: 20210004067Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.Type: ApplicationFiled: September 23, 2020Publication date: January 7, 2021Inventors: Zhan Ping, Qinling Zheng
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Patent number: 10809780Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.Type: GrantFiled: April 24, 2018Date of Patent: October 20, 2020Assignee: Samsung Electronics Co., Ltd.Inventors: Zhan Ping, Qinling Zheng
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Publication number: 20200267053Abstract: Provided are systems, methods, and apparatuses for latency-aware edge computing to optimize network traffic. A method can include: determining network parameters associated with a network architecture, the network architecture comprising a data center and an edge data center; determining, using the network parameters, a first programmatically expected latency associated with the data center and a second programmatically expected latency associated with the edge data center; and determining, based at least in part on a difference between the first programmatically expected latency or the second programmatically expected latency, a distribution of a workload to be routed between the data center and the edge data center.Type: ApplicationFiled: February 13, 2020Publication date: August 20, 2020Inventors: Qinling Zheng, Ehsan Najafabadi, Yasser Zaghloul
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Publication number: 20180260008Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.Type: ApplicationFiled: April 24, 2018Publication date: September 13, 2018Inventors: Zhan Ping, Qinling Zheng