Patents by Inventor Qinling Zheng

Qinling Zheng has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12260347
    Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.
    Type: Grant
    Filed: May 15, 2023
    Date of Patent: March 25, 2025
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Qinling Zheng, Nima Elyasi, Vikas Sinha, Changho Choi
  • Patent number: 12197259
    Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.
    Type: Grant
    Filed: June 23, 2023
    Date of Patent: January 14, 2025
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Zhan Ping, Qinling Zheng
  • Patent number: 11902092
    Abstract: Provided are systems, methods, and apparatuses for latency-aware edge computing to optimize network traffic. A method can include: determining network parameters associated with a network architecture, the network architecture comprising a data center and an edge data center; determining, using the network parameters, a first programmatically expected latency associated with the data center and a second programmatically expected latency associated with the edge data center; and determining, based at least in part on a difference between the first programmatically expected latency or the second programmatically expected latency, a distribution of a workload to be routed between the data center and the edge data center.
    Type: Grant
    Filed: February 13, 2020
    Date of Patent: February 13, 2024
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Qinling Zheng, Ehsan Najafabadi, Yasser Zaghloul
  • Publication number: 20230333613
    Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.
    Type: Application
    Filed: June 23, 2023
    Publication date: October 19, 2023
    Inventors: Zhan Ping, Qinling Zheng
  • Publication number: 20230281489
    Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.
    Type: Application
    Filed: May 15, 2023
    Publication date: September 7, 2023
    Inventors: Qinling ZHENG, Nima ELYASI, Vikas SINHA, Changho CHOI
  • Publication number: 20230274166
    Abstract: In a method for training a machine learning model, the method includes: segmenting, by a processor, a dataset from a database into one or more datasets based on time period windows; assigning, by the processor, one or more weighted values to the one or more datasets according to the time period windows of the one or more datasets; generating, by the processor, a training dataset from the one or more datasets according to the one or more weighted values; and training, by the processor, the machine learning model using the training dataset.
    Type: Application
    Filed: May 5, 2023
    Publication date: August 31, 2023
    Inventors: Nima Elyasi, Vikas Sinha, Qinling Zheng, Changho Choi
  • Patent number: 11709528
    Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.
    Type: Grant
    Filed: September 23, 2020
    Date of Patent: July 25, 2023
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Zhan Ping, Qinling Zheng
  • Patent number: 11669754
    Abstract: In a method for training a machine learning model, the method includes: segmenting, by a processor, a dataset from a database into one or more datasets based on time period windows; assigning, by the processor, one or more weighted values to the one or more datasets according to the time period windows of the one or more datasets; generating, by the processor, a training dataset from the one or more datasets according to the one or more weighted values; and training, by the processor, the machine learning model using the training dataset.
    Type: Grant
    Filed: May 11, 2020
    Date of Patent: June 6, 2023
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Nima Elyasi, Vikas Sinha, Qinling Zheng, Changho Choi
  • Patent number: 11657300
    Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.
    Type: Grant
    Filed: May 13, 2020
    Date of Patent: May 23, 2023
    Inventors: Qinling Zheng, Nima Elyasi, Vikas Sinha, Changho Choi
  • Publication number: 20210264298
    Abstract: In a method for training a machine learning model, the method includes: segmenting, by a processor, a dataset from a database into one or more datasets based on time period windows; assigning, by the processor, one or more weighted values to the one or more datasets according to the time period windows of the one or more datasets; generating, by the processor, a training dataset from the one or more datasets according to the one or more weighted values; and training, by the processor, the machine learning model using the training dataset.
    Type: Application
    Filed: May 11, 2020
    Publication date: August 26, 2021
    Inventors: Nima Elyasi, Vikas Sinha, Qinling Zheng, Changho Choi
  • Publication number: 20210264294
    Abstract: A method for predicting a time-to-failure of a target storage device may include training a machine learning scheme with a time-series dataset, and applying the telemetry data from the target storage device to the machine learning scheme which may output a time-window based time-to-failure prediction. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include applying a data quality improvement framework to a time-series dataset of operational and failure data from multiple storage devices, and training the scheme with the pre-processed dataset. A method for training a machine learning scheme for predicting a time-to-failure of a storage device may include training the scheme with a first portion of a time-series dataset of operational and failure data from multiple storage devices, testing the machine learning scheme with a second portion of the time-series dataset, and evaluating the machine learning scheme.
    Type: Application
    Filed: May 13, 2020
    Publication date: August 26, 2021
    Inventors: Qinling ZHENG, Nima ELYASI, Vikas SINHA, Changho CHOI
  • Publication number: 20210004067
    Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.
    Type: Application
    Filed: September 23, 2020
    Publication date: January 7, 2021
    Inventors: Zhan Ping, Qinling Zheng
  • Patent number: 10809780
    Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.
    Type: Grant
    Filed: April 24, 2018
    Date of Patent: October 20, 2020
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Zhan Ping, Qinling Zheng
  • Publication number: 20200267053
    Abstract: Provided are systems, methods, and apparatuses for latency-aware edge computing to optimize network traffic. A method can include: determining network parameters associated with a network architecture, the network architecture comprising a data center and an edge data center; determining, using the network parameters, a first programmatically expected latency associated with the data center and a second programmatically expected latency associated with the edge data center; and determining, based at least in part on a difference between the first programmatically expected latency or the second programmatically expected latency, a distribution of a workload to be routed between the data center and the edge data center.
    Type: Application
    Filed: February 13, 2020
    Publication date: August 20, 2020
    Inventors: Qinling Zheng, Ehsan Najafabadi, Yasser Zaghloul
  • Publication number: 20180260008
    Abstract: A system and method for active disturbance rejection based thermal control is configured to receive, at a first active disturbance rejection thermal control (ADRC) controller, a first temperature measurement from a first thermal zone. The ADRC controller generates a first output control signal for controlling a first cooling element, wherein the first output control signal is generated according a first estimated temperature and a first estimated disturbance calculated by a first extended state observer (ESO) of the first ADRC controller.
    Type: Application
    Filed: April 24, 2018
    Publication date: September 13, 2018
    Inventors: Zhan Ping, Qinling Zheng