Abstract: A device under test (DUT) may be tested using a radio-frequency test station. The DUT may include at least one antenna, wireless communications circuitry associated with the antenna, and other peripheral components such as a camera module, a display module, and audio circuitry. The test station may include a shielded enclosure in which the DUT is placed during testing. The DUT need not be electrically wired to any test equipment. The DUT may be configured to operate in self test mode. The DUT may be configured to obtain baseline noise floor measurements while all the peripheral components are deactivated and may be configured to obtain elevated noise floor measurements while selectively activating desired subsets of the peripheral components. The difference between the elevated and baseline noise floor measurements may be computed to determine whether at least some of the peripheral components negatively impact the antenna performance by an excessive amount.

Abstract: Apparatus and methods for radio co-existence and/or component testing in wireless-enabled electronic devices. In one embodiment, a wireless-enabled electronic device (ED) is coupled to a user interface. Test personnel or other supervisory entities can execute test scripts from the user interface. Unlike prior art testing configurations, the disclosed embodiments are configured to perform testing without requiring additional equipment, configuration changes, etc. to the device being evaluated. In one exemplary case, the test scripts are configured to test various co-existence scenarios. The resulting data can be used to quickly identify problem devices via highly accurate results, as well as provide useful statistical data.

Abstract: A wireless electronic device may be used to communicate using multiple wireless standards in adjacent frequency bands. The wireless standards may include Wi-Fi® and cellular standards such as Long Term Evolution (LTE). The wireless electronic device may be provided with wireless communications circuitry that handles Wi-Fi® and cellular signals in adjacent frequency bands such as the Wi-Fi® 2.4 GHz frequency band and LTE bands 38 and 40. The wireless communications circuitry may include a triplexer interposed between transceiver circuitry and an antenna. The triplexer may be used to handle radio-frequency signals in adjacent frequency bands by separating the radio-frequency signals into signals associated with each frequency band. The triplexer may include filters that each pass signals in a respective one of the frequency bands between the transceiver circuitry and the antenna.

Abstract: Electronic devices such as computers and handheld devices are provided. The electronic devices may have electrical components such as displays that are driven by driver circuitry. During operation, the driver circuitry may generate radio-frequency noise. Communications circuitry in the electronic devices may be shielded from the radio-frequency noise by radio-frequency shielding structures. The shielding structures may be mounted on portions of the display module, on a cover glass layer, or on other structures such as housing structures. The radio-frequency shielding structures may be formed from one or more metal segments. The metal segments may run along edges of the display. A device housing may have a ground formed from a conductive peripheral member that runs around peripheral edges of the housing and a conductive plate that is connected to the conductive peripheral member. The radio-frequency shielding structure may be connected to the ground using conductive structures.

Abstract: A device under test (DUT) may be tested using a radio-frequency test station. The DUT may include at least one antenna, wireless communications circuitry associated with the antenna, and other peripheral components such as a camera module, a display module, and audio circuitry. The test station may include a shielded enclosure in which the DUT is placed during testing. The DUT need not be electrically wired to any test equipment. The DUT may be configured to operate in self test mode. The DUT may be configured to obtain baseline noise floor measurements while all the peripheral components are deactivated and may be configured to obtain elevated noise floor measurements while selectively activating desired subsets of the peripheral components. The difference between the elevated and baseline noise floor measurements may be computed to determine whether at least some of the peripheral components negatively impact the antenna performance by an excessive amount.

Abstract: Electronic devices such as computers and handheld devices are provided. The electronic devices may have electrical components such as displays that are driven by driver circuitry. During operation, the driver circuitry may generate radio-frequency noise. Communications circuitry in the electronic devices may be shielded from the radio-frequency noise by radio-frequency shielding structures. The shielding structures may be mounted on portions of the display module, on a cover glass layer, or on other structures such as housing structures. The radio-frequency shielding structures may be formed from one or more metal segments. The metal segments may run along edges of the display. A device housing may have a ground formed from a conductive peripheral member that runs around peripheral edges of the housing and a conductive plate that is connected to the conductive peripheral member. The radio-frequency shielding structure may be connected to the ground using conductive structures.