Patents by Inventor Qiu-Yue Duan

Qiu-Yue Duan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240094292
    Abstract: A system of performing boundary scan test on pin through test point and a method thereof are disclosed. When an under-test pin of a target connector is determined to be unable to perform a boundary scan test, a test point connected to and closest to the under-test pin is searched, a test signal is transmitted to a target connector, a result signal from the target connector in response to the test signal is received, an expected result and the result signal are compared to generate a test result, so that a boundary scan function can be applied to test a connector of a computer product, to achieve the technical effect of providing a better test range and a better test coverage to improve test efficiency and reduce test cost, compared to conventional boundary scan test.
    Type: Application
    Filed: September 20, 2022
    Publication date: March 21, 2024
    Applicant: Inventec (Pudong) Technology Corporation
    Inventors: Qiu-Yue Duan, Xin-Ying Xie
  • Patent number: 11435400
    Abstract: A test coverage rate improvement system for pins of tested circuit board and a method thereof are disclosed. In the system, partial pins of a circuit board connector in a tested circuit board are not electrically connected to the boundary scan chip, test pins of the test pin board are pressed with the partial pins by a fixture of a boundary scan interconnect testing workstation to electrically connect the test pins to the partial pins. A test access port controller receives a detection signal for detecting the partial pins, which are not electrically connected to the boundary scan chip, of the circuit board connector through the test pin board from the test adapter card, and determines whether conduction is formed based on the detection signal, thereby achieving the technical effect of improving a test coverage rate for the pins of the tested circuit board.
    Type: Grant
    Filed: June 24, 2021
    Date of Patent: September 6, 2022
    Assignees: Inventec (Pudong) Technology Corporation, Inventec Corporation
    Inventors: Qiu-Yue Duan, Ben Han, Xin-Ying Xie
  • Publication number: 20210389368
    Abstract: A design system for a test adapter card is provided. The circuitry to be tested on a motherboard is divided to form multiple modules to be tested, each of which corresponds to an interface to be tested. According to specifications of preset interfaces, the preset interface corresponding to each interface to be tested is selected, wherein the specifications of the preset interfaces conform to connector specifications of commercially available cables, multiple preset pins included in the selected preset interface completely cover the pins to be tested included in the corresponding interface to be tested, and the number of the preset pins included in the selected preset interface is greater than or equal to the number of the pins to be tested included in the corresponding interface to be tested. Design information required for producing the test adapter card is output based on the selection result and the division result.
    Type: Application
    Filed: June 18, 2020
    Publication date: December 16, 2021
    Inventors: Lin Zhang, Qiu-Yue Duan, Xiao-Xiao Mao
  • Publication number: 20190178940
    Abstract: A system for using different scan chains to test differential circuit and a method thereof are disclosed. In the system, two scan chains are set up for two electronic components on a target circuit board, and test data for the two scan chains are sequentially pushed to the two scan chains respectively according to a data flow direction between the two scan chains, and after the electronic components output result data, a test result can be determined according to the test data for the two scan chains and the result data. This testing manner can be performed on all electronic components, so as to achieve the technical effect of stably performing differential signal test on all electronic components of the target circuit board.
    Type: Application
    Filed: June 15, 2018
    Publication date: June 13, 2019
    Inventor: Qiu- Yue Duan
  • Patent number: 8381034
    Abstract: A testing method for a server supporting an intelligent platform management interface (IPMI) is applied to test a server before an operating system (OS) of the server operates. The test method includes the following steps. A baseboard management controller (BMC) of the server is activated. The server is activated, and a monitoring module is operated. Real-time status data of the server stored in the BMC of the server is obtained. The monitoring module executes a pre-test procedure according to the real-time status data of the server before the OS operates. A test result of the pre-test procedure is stored.
    Type: Grant
    Filed: December 21, 2010
    Date of Patent: February 19, 2013
    Assignee: Inventec Corporation
    Inventors: Zhen Chen, Qiu Yue Duan, Chih Feng Chen
  • Publication number: 20120011402
    Abstract: A testing method for a server supporting an intelligent platform management interface (IPMI) is applied to test a server before an operating system (OS) of the server operates. The test method includes the following steps. A baseboard management controller (BMC) of the server is activated. The server is activated, and a monitoring module is operated. Real-time status data of the server stored in the BMC of the server is obtained. The monitoring module executes a pre-test procedure according to the real-time status data of the server before the OS operates. A test result of the pre-test procedure is stored.
    Type: Application
    Filed: December 21, 2010
    Publication date: January 12, 2012
    Applicant: INVENTEC CORPORATION
    Inventors: Zhen Chen, Qiu Yue Duan, Chih Feng Chen
  • Publication number: 20100205420
    Abstract: A system and a method for realizing a remote test on a computer apparatus without a storage device are described, in which a client is enabled to select a desired operating system image file from a server and use the operating system image file to provide an initial processing on an operating system of the client. The testing method includes initializing a virtual disk in the client, registering the virtual disk to a basic input and output system (BIOS) of the client, connecting to a server over network according to connection information in the virtual disk, loading boot information into the client from the server, and performing a boot procedure on the client according to the boot information. Therefore, during a booting process of the client, a virtual disk is initialized in the server, so as to be used for booting the client.
    Type: Application
    Filed: February 9, 2009
    Publication date: August 12, 2010
    Applicant: INVENTEC CORPORATION
    Inventors: Town Chen, Qiu-Yue Duan, Tom Chen
  • Patent number: 7730358
    Abstract: A stress testing method of a file system includes traversing local or network storage devices with a drive letter; detecting a network mapping path of the network storage devices; calculating an absolute path of all the storage devices through a mounted point and a system volume; collecting the above information to update the path information of the file system; and then calling a corresponding test algorithm and stressing strategy according to different types of storage devices, so as to perform the stress test. The stress testing method can make the file system display storage devices without a drive letter, and call appropriate testing methods and stressing strategies for different types of storage devices, so the depth and scope of the stress testing for file system are expanded, the accuracy of the test is enhanced, and the problem of occupying too many system resources is avoided.
    Type: Grant
    Filed: October 24, 2007
    Date of Patent: June 1, 2010
    Assignee: Inventec Corporation
    Inventors: Tao Liu, Qiu-Yue Duan, Tom Chen, Win-Harn Liu
  • Publication number: 20090113249
    Abstract: A stress testing method of a file system includes traversing local or network storage devices with a drive letter; detecting a network mapping path of the network storage devices; calculating an absolute path of all the storage devices through a mounted point and a system volume; collecting the above information to update the path information of the file system; and then calling a corresponding test algorithm and stressing strategy according to different types of storage devices, so as to perform the stress test. The stress testing method can make the file system display storage devices without a drive letter, and call appropriate testing methods and stressing strategies for different types of storage devices, so the depth and scope of the stress testing for file system are expanded, the accuracy of the test is enhanced, and the problem of occupying too many system resources is avoided.
    Type: Application
    Filed: October 24, 2007
    Publication date: April 30, 2009
    Applicant: INVENTEC CORPORATION
    Inventors: Tao Liu, Qiu-Yue Duan, Tom Chen, Win-Harn Liu
  • Publication number: 20090083585
    Abstract: A method of pressure testing for peripheral component interconnect (PCI) bus stage that is used in the overall pressure testing of PCI bus. The method includes the steps of reviewing all the PCI buses in a system; obtaining a tree-shaped structure of the all the PCI buses and PCI devices of the entire system, and selecting from them a branch of PCI bus as an object of testing; performing peripheral component interconnect function test, input/output function test, and memory mapping function test of the PCI bus relative to this object of testing; and selecting a branch of PCI bus from among the remaining branches of PCI buses of the system as an object of testing to proceed with the related tests of PCI bus mentioned above, until all the branches of PCI buses to be tested have finished testing.
    Type: Application
    Filed: September 21, 2007
    Publication date: March 26, 2009
    Applicant: INVENTEC CORPORATION
    Inventors: Tao LIU, Qiu-Yue DUAN, Tom CHEN, Win-Harn LIU
  • Publication number: 20080201605
    Abstract: A Dead man timer detecting method, a multiprocessor switching method, and a processor hot plug support method are provided. A hot spare boot control register communicated with the Dead man timer is used to detect functions of the Dead man timer, such as enabling, timing, disabling, and responding. After an operation system is booted, the Dead man timer is used to achieve automatic switch among multiple processors and the support for the processor hot plug. The method can detect various functions of the Dead man timer, and be switched among multiple processors automatically and periodically, without being limited by the type of operation systems and processors, and realize the support to the processor hot plug, thereby improving the safety for the hot plug operation.
    Type: Application
    Filed: February 21, 2007
    Publication date: August 21, 2008
    Applicant: INVENTEC CORPORATION
    Inventors: Qiu-Yue Duan, Tom Chen, Win-Harn Liu