Patents by Inventor Qiuhong Tian

Qiuhong Tian has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11939503
    Abstract: Disclosed are a preparation method for manganese-doped red phosphor, a device and a backlight module including the product. The method includes: 1) mixing A2BF6 polycrystalline particles with mill balls; 2) mixing A2BF6 powder obtained after ball-milling with a hydrofluoric acid for secondary crystallization; 3) filtering out solid particles in A2BF6 and hydrofluoric acid solution after the secondary crystallization; 4) performing ion exchange between A2BF6 particles and A2BF6; and 5) filtering out solid particles to obtain a filter cake, and performing drying treatment to obtain manganese-doped red phosphor.
    Type: Grant
    Filed: October 26, 2018
    Date of Patent: March 26, 2024
    Assignees: Hefei University of Technology, Intelligent Manufacturing Institute of HFUT
    Inventors: Lei Chen, Peng Cheng, Jie Chen, Yunfei Tian, Jialong Wang, Liangrui He, Qiuhong Zhang, Haiyong Ni
  • Patent number: 8665452
    Abstract: Measuring refractive index of air based on laser synthetic wavelength interferometry. The Apparatus includes a dual-frequency laser that emits orthogonal linear polarized light of wavelengths ?1 and ?2, a beamsplitter, two polarizing beamsplitters, two corner-cube retroreflectors, a quartz vacuum cavity of length L disposed in the measuring optical path in parallel to the light propagation direction, and two detectors. The apparatus is used to measure the refractive index of air using the dual-frequency laser to emit orthogonal linear polarized light with wavelengths ?1 and ?2, using the beamsplitters, corner-cube retroreflectors, quartz vacuum cavity, and detectors. The integer N and fraction ? of interference fringes of wavelength ?2 are determined. The refractive index of air n is obtained by using the length L of the vacuum cavity, integer N and fraction ? of the interference fringes of wavelength ?2.
    Type: Grant
    Filed: May 18, 2011
    Date of Patent: March 4, 2014
    Assignee: Zhejiang Sci-Tech University
    Inventors: Liping Yan, Benyong Chen, Qiuhong Tian, Zhengrong Sun
  • Publication number: 20130258348
    Abstract: The present invention discloses a method and an apparatus for measuring the refractive index of air based on the laser synthetic wavelength interferometry, wherein a laser synthetic wavelength interferometer comprises a dual-frequency laser, a beamsplitter, a first polarizing beamsplitter, a second polarizing beamsplitter, a first corner-cube retroreflector and a second corner-cube retroreflector; a quartz vacuum cavity is disposed in the measuring optical path in parallel to the light propagation direction; when the measurement is performed, air is introduced into the quartz vacuum cavity until it is consistent with outside environment; the variation of the refractive index of air inside the cavity will cause change of the interference signal of the wavelength ?2; the first detector of photoelectric type is used to directly detect the integer N of the interference fringes of the wavelength ?2; then the first corner-cube retroreflector is moved to make the phase difference between the interference signals of
    Type: Application
    Filed: May 18, 2011
    Publication date: October 3, 2013
    Inventors: Liping Yan, Benyong Chen, Qiuhong Tian, Zhengrong Sun