Patents by Inventor Qiyi YANG

Qiyi YANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Resistance test method using kelvin structure
    Patent number: 11428722
    Abstract: The disclosure discloses a resistance test method using a Kelvin structure, which includes the following steps: step 1: providing a Kelvin test structure including a tested resistor, a first parasitic resistor, and a second parasitic resistor connected in series; step 2: applying first current to the two current test terminals and simultaneously testing first voltage in the two voltage test terminals; step 3: applying second current in a direction opposite to the direction of the first current to the two current test terminals and simultaneously testing second voltage in the two voltage test terminals; step 4: dividing a difference value obtained by subtracting the second voltage from the first voltage by a difference value between the first current and the second current to obtain the final test value of the tested resistor. The disclosure can reduce the resistance test error.
    Type: Grant
    Filed: December 15, 2020
    Date of Patent: August 30, 2022
    Assignee: Hua Hong Semiconductor (Wuxi) Limited
    Inventors: Hao Wu, Bin Han, Xudong Li, Qiyi Yang
  • RESISTANCE TEST METHOD USING KELVIN STRUCTURE
    Publication number: 20210190843
    Abstract: The disclosure discloses a resistance test method using a Kelvin structure, which includes the following steps: step 1: providing a Kelvin test structure including a tested resistor, a first parasitic resistor, and a second parasitic resistor connected in series; step 2: applying first current to the two current test terminals and simultaneously testing first voltage in the two voltage test terminals; step 3: applying second current in a direction opposite to the direction of the first current to the two current test terminals and simultaneously testing second voltage in the two voltage test terminals; step 4: dividing a difference value obtained by subtracting the second voltage from the first voltage by a difference value between the first current and the second current to obtain the final test value of the tested resistor. The disclosure can reduce the resistance test error.
    Type: Application
    Filed: December 15, 2020
    Publication date: June 24, 2021
    Applicant: Hua Hong Semiconductor (Wuxi) Limited
    Inventors: Hao WU, Bin HAN, Xudong LI, Qiyi YANG