Patents by Inventor Quek Leong Choo

Quek Leong Choo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9915944
    Abstract: A method and system for providing simultaneous localization of defects in both the time and frequency domain. A high frequency repeating pattern is written on media, and the pattern is read to generate a readback signal, which is converted into ADC samples. The ADC samples are analyzed, in-line, to determine the type of wavelet, level of decomposition, and threshold level for a wavelet transform of the particular readback signal. The wavelet transform provides details and/or approximations (wavelet coefficients) that are analyzed to determine the type, location, and duration of any identified defects. Any noise in the details and/or approximations (wavelet coefficients) is removed by a wavelet based denoising operation. Flags indicating the type, location, and duration of any defects are generated so that the defects may be mapped.
    Type: Grant
    Filed: August 17, 2011
    Date of Patent: March 13, 2018
    Assignee: SEAGATE TECHNOLOGY LLC
    Inventors: Mathuranathan Viswanathan, Myint Ngwe, Quek Leong Choo
  • Patent number: 9495987
    Abstract: The disclosed technology provides techniques for mitigating write-to-write bit error rate fluctuations that decrease accuracy of write precompensation (WPC) tuning. According to one implementation, such write-to-write bit error rate fluctuations are mitigated if a predetermined pattern is written at a particular radial offset from a target data track prior to testing a WPC register in association with the target data track. Selection of the particular radial offset can be performed according to an iterative offset track clean-up disclosed herein.
    Type: Grant
    Filed: May 1, 2015
    Date of Patent: November 15, 2016
    Assignee: SEAGATE TECHNOLOGY LLC
    Inventors: Ben Niu, Lan Xia, Fong Kheon Chong, Quek Leong Choo, Song Wee Teo
  • Publication number: 20160322074
    Abstract: The disclosed technology provides techniques for mitigating write-to-write bit error rate fluctuations that decrease accuracy of write precompensation (WPC) tuning According to one implementation, such write-to-write bit error rate fluctuations are mitigated if a predetermined pattern is written at a particular radial offset from a target data track prior to testing a WPC register in association with the target data track. Selection of the particular radial offset can be performed according to an iterative offset track clean-up disclosed herein.
    Type: Application
    Filed: May 1, 2015
    Publication date: November 3, 2016
    Inventors: Ben Niu, Lan Xia, Fong Kheon Chong, Quek Leong Choo, Song Wee Teo
  • Patent number: 8780679
    Abstract: Techniques for data recovery from a data block wherein portions of the data block are written at different off-track positions are described. For example, portions of a data block can be read separately for each on-track and off-track position in the data block; then, the separately read portions can be recombined into a recovered data block.
    Type: Grant
    Filed: July 31, 2007
    Date of Patent: July 15, 2014
    Assignee: Seagate Technology LLC
    Inventors: Myint Maung Ngwe, Hong Li Sun, Hiau Choon Kee, Quek Leong Choo, Kian Wai Ng, Zhi Ye
  • Publication number: 20130046491
    Abstract: A method and system for providing simultaneous localization of defects in both the time and frequency domain. A high frequency repeating pattern is written on media, and the pattern is read to generate a readback signal, which is converted into ADC samples. The ADC samples are analyzed, in-line, to determine the type of wavelet, level of decomposition, and threshold level for a wavelet transform of the particular readback signal. The wavelet transform provides details and/or approximations (wavelet coefficients) that are analyzed to determine the type, location, and duration of any identified defects. Any noise in the details and/or approximations (wavelet coefficients) is removed by a wavelet based denoising operation. Flags indicating the type, location, and duration of any defects are generated so that the defects may be mapped.
    Type: Application
    Filed: August 17, 2011
    Publication date: February 21, 2013
    Applicant: SEAGATE TECHNOLOGY LLC
    Inventors: Mathuranathan Viswanathan, Myint Ngwe, Quek Leong Choo
  • Publication number: 20090034380
    Abstract: Techniques for data recovery from a data block wherein portions of the data block are written at different off-track positions are described. For example, portions of a data block can be read separately for each on-track and off-track position in the data block; then, the separately read portions can be recombined into a recovered data block.
    Type: Application
    Filed: July 31, 2007
    Publication date: February 5, 2009
    Applicant: Seagate Technology LLC
    Inventors: Myint Maung Ngwe, Hong Li Sun, Hiau Choon Kee, Quek Leong Choo, Kian Wai Ng, Zhi Ye
  • Patent number: 6920001
    Abstract: A method of categorizing magnitudes of thermal asperities in a read-back signal of a data storage system includes receiving the read-back signal from a location containing a thermal asperity. A peak magnitude signal is generated from the read-back signal. A threshold signal is generated using a variable threshold generator. The peak magnitude signal is compared to the threshold signal and a magnitude of the thermal asperity is categorized as a function of the comparison.
    Type: Grant
    Filed: June 12, 2003
    Date of Patent: July 19, 2005
    Assignee: Seagate Technology LLC
    Inventors: Teng Hou Sebastian Chua, Myint Ngwe, Lan Xia, Beng Wee Quak, Quek Leong Choo
  • Patent number: 6903889
    Abstract: A method of tuning a bias parameter for a magnetoresistive head in a data storage system includes the step of identifying, from multiple possible bias parameter values, a smallest bias parameter value for the magnetoresistive head which both maintains a bit error rate above a predetermined threshold bit error rate, and which satisfies a second criteria. The method then includes the step of setting an operational bias parameter value for the magnetoresistive head to the identified smallest bias parameter value. Also disclosed are data storage systems, or controllers which are connectable to or included with data storage systems, configured to implement the methods.
    Type: Grant
    Filed: June 11, 2003
    Date of Patent: June 7, 2005
    Assignee: Seagate Technology
    Inventors: Liu Li, Quek Leong Choo, Song Wee Teo, Myint Ngwe, Beng Wee Quak
  • Patent number: 6839193
    Abstract: A method for optimizing the read-to-write offset of a disk drive system in respect of a track is provided. In one aspect the method includes the step of determining a first read position amongst a range of test positions offset relative to the track on the basis of read signal strength. The method further includes the steps of calculating a subrange of test positions about the first read position, selecting a second read position from the subrange on the basis of bit error rates and setting the read-to-write offset as a function of the second read position. In addition a disk drive system including means for optimally setting the read-to-write offset in respect of a track is provided.
    Type: Grant
    Filed: December 11, 2001
    Date of Patent: January 4, 2005
    Assignee: Seagate Technology LLC
    Inventors: Fong Kheon Chong, Quek Leong Choo, Myint Ngwe, Jun Wang, Kah Liang Gan
  • Publication number: 20040252392
    Abstract: A method of categorizing magnitudes of thermal asperities in a read-back signal of a data storage system includes receiving the read-back signal from a location containing a thermal asperity. A peak magnitude signal is generated from the read-back signal. A threshold signal is generated using a variable threshold generator. The peak magnitude signal is compared to the threshold signal and a magnitude of the thermal asperity is categorized as a function of the comparison.
    Type: Application
    Filed: June 12, 2003
    Publication date: December 16, 2004
    Applicant: Seagate Technology LLC
    Inventors: Teng Hou Sebastian Chua, Myint Ngwe, Lan Xia, Beng Wee Quak, Quek Leong Choo
  • Publication number: 20040252398
    Abstract: A method of tuning a bias parameter for a magnetoresistive head in a data storage system includes the step of identifying, from multiple possible bias parameter values, a smallest bias parameter value for the magnetoresistive head which both maintains a bit error rate above a predetermined threshold bit error rate, and which satisfies a second criteria. The method then includes the step of setting an operational bias parameter value for the magnetoresistive head to the identified smallest bias parameter value. Also disclosed are data storage systems, or controllers which are connectable to or included with data storage systems, configured to implement the methods.
    Type: Application
    Filed: June 11, 2003
    Publication date: December 16, 2004
    Applicant: Seagate Technology LLC
    Inventors: Liu Li, Quek Leong Choo, Song Wee Teo, Myint Ngwe, Beng Wee Quak
  • Patent number: 6798596
    Abstract: A guardband portion is written on a disc surface in a disc drive. A predetermined data pattern is written on at least one data track adjacent to the guardband portion. A predetermined guardband pattern is written at a plurality of different guardband frequencies in the guardband portion. For each guardband frequency, at least one performance criterion is measured for the data track. A desired guardband pattern is written on the guardband portion of the disc surface at a guardband frequency chosen based on the measured performance criterion.
    Type: Grant
    Filed: November 27, 2001
    Date of Patent: September 28, 2004
    Assignee: Seagate Technology LLC
    Inventors: Eng Hock Lim, Quek Leong Choo, Kok Leong Loh, Myint Ngwe, Kah Liang Gan
  • Patent number: 6731442
    Abstract: A method is disclosed for detecting defects in a recordable medium such as a hard disc drive based on error energy. The method may include the steps of writing test data to the medium and reading back the test data. The method may also include the steps of computing an error energy based on the square of the difference between the read back data and an ideal version of the test data and comparing the error energy with an energy threshold. The method generates a defect signal when the error energy exceeds the energy threshold. The method may also be used to identify the media defect according to its error energy profile. An apparatus for detecting defects in a recordable medium is also disclosed.
    Type: Grant
    Filed: January 31, 2002
    Date of Patent: May 4, 2004
    Assignee: Seagate Technologies LLC
    Inventors: Ming Jin, Myint Ngwe, David Loh, Quek Leong Choo, Mingyou Hu
  • Patent number: 6657803
    Abstract: A method and apparatus are provided for reading from a storage medium to form data values. A signal is generated from a sector on the storage medium and a section of that signal is identified as having a change in amplitude. A gain multiplier is activated to multiply that section of the signal by a gain value. The gain multiplier is deactivated at the end of the section so that the remaining portion of the sector signal is not multiplied by the gain value. This results in a defect adjusted signal that is applied to a detector to detect data values.
    Type: Grant
    Filed: November 21, 2000
    Date of Patent: December 2, 2003
    Assignee: Seagate Technology LLC
    Inventors: Khong Mau Ling, Myint Ngwe, Kah Liang Gan, Lakshmi Anantha Challa, Quek Leong Choo
  • Patent number: 6549020
    Abstract: A method for characterizing a bearing cartridge based on a preload applied to the bearing cartridge used in a disc drive, to increase disc drive yield rates. The method begins by loading the bearing cartridge on to a test fixture and to an actuator assembly such that the actuator is rotatably attached to the base by the bearing cartridge. Then, the method includes inducing a steady swing in the actuator. Then, the method includes measuring a voltage drop that occurs across the bearing cartridge during the steady swing to characterize the preload applied to the bearing cartridge.
    Type: Grant
    Filed: February 23, 2001
    Date of Patent: April 15, 2003
    Assignee: Seagate Technology LLC
    Inventors: Eng Hock Lim, Quek Leong Choo, Myint Ngwe, Kah Liang Gan, Beng Wee Quak
  • Publication number: 20030063405
    Abstract: A method is disclosed for detecting defects in a recordable medium such as a hard disc drive based on error energy. The method may include the steps of writing test data to the medium and reading back the test data. The method may also include the steps of computing an error energy based on the square of the difference between the read back data and an ideal version of the test data and comparing the error energy with an energy threshold. The method generates a defect signal when the error energy exceeds the energy threshold. The method may also be used to identify the media defect according to its error energy profile. An apparatus for detecting defects in a recordable medium is also disclosed.
    Type: Application
    Filed: January 31, 2002
    Publication date: April 3, 2003
    Inventors: Ming Jin, Myint Ngwe, David Loh, Quek Leong Choo, Mingyou Hu
  • Publication number: 20030053236
    Abstract: A representation of the signal level on a data head is obtained by combining the signal level values corresponding to more than one sector of a track on a disc surface. This makes it much easier to lock on to a relatively accurate representation of the actual head signal amplitude, even in the presence of servo disturbances.
    Type: Application
    Filed: May 22, 2002
    Publication date: March 20, 2003
    Inventors: David Kok Leong Loh, Victor Chew Weng Khin, Quek Leong Choo, Myint Ngwe, KahLiang Gan
  • Publication number: 20030026017
    Abstract: A method for optimizing the read-to-write offset of a disk drive system in respect of a track is provided. In one aspect the method includes the step of determining a first read position amongst a range of test positions offset relative to the track on the basis of read signal strength. The method further includes the steps of calculating a subrange of test positions about the first read position, selecting a second read position from the subrange on the basis of bit error rates and setting the read-to-write offset as a function of the second read position. In addition a disk drive system including means for optimally setting the read-to-write offset in respect of a track is provided.
    Type: Application
    Filed: December 11, 2001
    Publication date: February 6, 2003
    Inventors: Fong Kheon Chong, Quek Leong Choo, Myint Ngwe, Jun Wang, Kah Liang Gan
  • Publication number: 20030011921
    Abstract: A guardband portion is written on a disc surface in a disc drive. A predetermined data pattern is written on at least one data track adjacent to the guardband portion. A predetermined guardband pattern is written at a plurality of different guardband frequencies in the guardband portion. For each guardband frequency, at least one performance criterion is measured for the data track. A desired guardband pattern is written on the guardband portion of the disc surface at a guardband frequency chosen based on the measured performance criterion.
    Type: Application
    Filed: November 27, 2001
    Publication date: January 16, 2003
    Inventors: Eng Hock Lim, Quek Leong Choo, Kok Leong Loh, Myint Ngwe, Kah Liang Gan
  • Publication number: 20030002190
    Abstract: A method is provided in which an optimal read gate delay duration for reading from a track of a hard disk drive is determined. The disk drive is of the type having read and write elements separated by an inter-element spacing and a platter including a plurality of radially spaced tracks. In one aspect the method comprises the steps of writing a bit pattern to a track, reading the bit pattern with each of a range of read gate delay durations, calculating a read bit error rate for each said duration and setting the optimal read gate delay to the delay duration corresponding to the lowest read bit error rate. In addition a computer program product, readable by a computer system for implementing the method is also provided.
    Type: Application
    Filed: December 11, 2001
    Publication date: January 2, 2003
    Inventors: Song Wee Teo, Quek Leong Choo