Patents by Inventor Qun RAO

Qun RAO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fully-automatic closed-loop detection method and device for intelligent substation
    Patent number: 11327114
    Abstract: The fully-automatic closed-loop detection method includes: comparing a SCD file of a to-be-tested substation with a device-type data template file, so as to determine whether configuration information about the to-be-tested substation is correct; when the configuration information about the to-be-tested substation is correct, parsing the SCD file of the to-be-tested substation and generating a SSD topological diagram of the to-be-tested substation; and acquiring a testing item from a predetermined testing item library in accordance with the SSD topological diagram of the to-be-tested substation, generating a testing scheme for the to-be-tested substation, performing a testing operation and outputting a testing result.
    Type: Grant
    Filed: January 22, 2019
    Date of Patent: May 10, 2022
    Assignees: STATE GRID HEBEI ELECTRIC POWER RESEARCH INSTITUTE, STATE GRID CORPORATION OF CHINA, WUHAN KEMOV ELECTRIC CO., LTD, STATE GRID HEBEI ENERGY TECHNOLOGY SERVICE CO., LT D
    Inventors: Peng Luo, Hui Fan, Jingchao Yang, Xiaoguang Hao, Yuhao Zhao, Lei He, Qun Rao
  • FULLY-AUTOMATIC CLOSED-LOOP DETECTION METHOD AND DEVICE FOR INTELLIGENT SUBSTATION
    Publication number: 20190170822
    Abstract: The fully-automatic closed-loop detection method includes: comparing a SCD file of a to-be-tested substation with a device-type data template file, so as to determine whether configuration information about the to-be-tested substation is correct; when the configuration information about the to-be-tested substation is correct, parsing the SCD file of the to-be-tested substation and generating a SSD topological diagram of the to-be-tested substation; and acquiring a testing item from a predetermined testing item library in accordance with the SSD topological diagram of the to-be-tested substation, generating a testing scheme for the to-be-tested substation, performing a testing operation and outputting a testing result.
    Type: Application
    Filed: January 22, 2019
    Publication date: June 6, 2019
    Applicants: STATE GRID HEBEI ELECTRIC POWER RESEARCH INSTITUTE, STATE GRID CORPORATION OF CHINA, WUHAN KEMOV ELECTRIC CO., LTD, STATE GRID HEBEI ENERGY TECHNOLOGY SERVICE CO., LT D
    Inventors: Peng LUO, Hui FAN, Jingchao YANG, Xiaoguang HAO, Yuhao ZHAO, Lei HE, Qun RAO