Patents by Inventor Quyen Duc Chu

Quyen Duc Chu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System, apparatus and method for dispensed adhesive material inspection
    Patent number: 10769775
    Abstract: Apparatus, system and method for detecting defects in an adhesion area that includes an adhesive mixed with a fluorescent material. One or more illumination devices may illuminate the fluorescent material in the adhesion area with a light of a predetermined wavelength. A camera may be configured to capture an image of the illuminated adhesion area. A processing device, communicatively coupled to the camera, may be configured to process the captured image by applying one or more boundary areas to the captured image and determining an image characteristic within each of the boundary areas, wherein the image characteristic is used by the processing device to determine the presence of a defect in the adhesive, such as an excess of adhesive or an insufficient application of adhesive.
    Type: Grant
    Filed: February 11, 2019
    Date of Patent: September 8, 2020
    Assignee: JABIL INC.
    Inventors: Quyen Duc Chu, Nazir Ahmad
  • SYSTEM, APPARATUS AND METHOD FOR DISPENSED ADHESIVE MATERIAL INSPECTION
    Publication number: 20190244344
    Abstract: Apparatus, system and method for detecting defects in an adhesion area that includes an adhesive mixed with a fluorescent material. One or more illumination devices may illuminate the fluorescent material in the adhesion area with a light of a predetermined wavelength. A camera may be configured to capture an image of the illuminated adhesion area. A processing device, communicatively coupled to the camera, may be configured to process the captured image by applying one or more boundary areas to the captured image and determining an image characteristic within each of the boundary areas, wherein the image characteristic is used by the processing device to determine the presence of a defect in the adhesive, such as an excess of adhesive or an insufficient application of adhesive.
    Type: Application
    Filed: February 11, 2019
    Publication date: August 8, 2019
    Applicant: Jabil Inc.
    Inventors: Quyen Duc Chu, Nazir Ahmad
  • System, apparatus and method for dispensed adhesive material inspection
    Patent number: 10204408
    Abstract: Apparatus, system and method for detecting defects in an adhesion area that includes an adhesive mixed with a fluorescent material. One or more illumination devices may illuminate the fluorescent material in the adhesion area with a light of a predetermined wavelength. A camera may be configured to capture an image of the illuminated adhesion area. A processing device, communicatively coupled to the camera, may be configured to process the captured image by applying one or more boundary areas to the captured image and determining an image characteristic within each of the boundary areas, wherein the image characteristic is used by the processing device to determine the presence of a defect in the adhesive, such as an excess of adhesive or an insufficient application of adhesive.
    Type: Grant
    Filed: January 23, 2017
    Date of Patent: February 12, 2019
    Assignee: Jabil Inc.
    Inventors: Quyen Duc Chu, Nazir Ahmad
  • SYSTEM, APPARATUS AND METHOD FOR DISPENSED ADHESIVE MATERIAL INSPECTION
    Publication number: 20170161890
    Abstract: Apparatus, system and method for detecting defects in an adhesion area that includes an adhesive mixed with a fluorescent material. One or more illumination devices may illuminate the fluorescent material in the adhesion area with a light of a predetermined wavelength. A camera may be configured to capture an image of the illuminated adhesion area. A processing device, communicatively coupled to the camera, may be configured to process the captured image by applying one or more boundary areas to the captured image and determining an image characteristic within each of the boundary areas, wherein the image characteristic is used by the processing device to determine the presence of a defect in the adhesive, such as an excess of adhesive or an insufficient application of adhesive.
    Type: Application
    Filed: January 23, 2017
    Publication date: June 8, 2017
    Applicant: Jabil Circuit, Inc.
    Inventors: Quyen Duc Chu, Nazir Ahmad
  • System, apparatus and method for dispensed adhesive material inspection
    Patent number: 9626754
    Abstract: Apparatus, system and method for detecting defects in an adhesion area that includes an adhesive mixed with a fluorescent material. One or more illumination devices may illuminate the fluorescent material in the adhesion area with a light of a predetermined wavelength. A camera may be configured to capture an image of the illuminated adhesion area. A processing device, communicatively coupled to the camera, may be configured to process the captured image by applying one or more boundary areas to the captured image and determining an image characteristic within each of the boundary areas, wherein the image characteristic is used by the processing device to determine the presence of a defect in the adhesive, such as an excess of adhesive or an insufficient application of adhesive.
    Type: Grant
    Filed: May 28, 2015
    Date of Patent: April 18, 2017
    Assignee: JABIL CIRCUIT, INC.
    Inventors: Quyen Duc Chu, Nazir Ahmad
  • SYSTEM, APPARATUS AND METHOD FOR DISPENSED ADHESIVE MATERIAL INSPECTION
    Publication number: 20160350909
    Abstract: Apparatus, system and method for detecting defects in an adhesion area that includes an adhesive mixed with a fluorescent material. One or more illumination devices may illuminate the fluorescent material in the adhesion area with a light of a predetermined wavelength. A camera may be configured to capture an image of the illuminated adhesion area. A processing device, communicatively coupled to the camera, may be configured to process the captured image by applying one or more boundary areas to the captured image and determining an image characteristic within each of the boundary areas, wherein the image characteristic is used by the processing device to determine the presence of a defect in the adhesive, such as an excess of adhesive or an insufficient application of adhesive.
    Type: Application
    Filed: May 28, 2015
    Publication date: December 1, 2016
    Applicant: JABIL CIRCUIT, INC.
    Inventors: Quyen Duc Chu, Nazir Ahmad