Patents by Inventor R. Blanton

R. Blanton has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SYSTEM AND METHOD TO TEST INTEGRATED CIRCUITS ON A WAFER
    Publication number: 20050138499
    Abstract: A system to test integrated circuits on a wafer may include a transceiver formed on the wafer. The system may also include an antenna system couplable to the transceiver. The transceiver may be formed in one of a scribe line on the wafer, a chip on the wafer or on an usable portion of the wafer. The antenna system may be formed in at least one of the same scribe line as the transceiver or in at least one other scribe line formed in the wafer. Alternatively, the antenna system may include an antenna external to the wafer.
    Type: Application
    Filed: November 26, 2003
    Publication date: June 23, 2005
    Inventors: Lawrence Pileggi, Chik Yue, R. Blanton, Thomas Vogels