Abstract: High density-information storage is accomplished by the use of novel, near-field optical devices in combination with high-density storage media. The near-field optical devices are configured to focus light to nanoscale spot sizes and may employ negative index of refraction materials for focusing. The high-density storage media may include protein-based storage media, such as photochromic proteins, and high-coercivity magnetic storage media. Light energy provided the optical devices may enable exposed protein molecules to transition between stable molecular states that may be distinguished on the basis of their respective spectral maxima. Light energy provided by the optical device may also be used to heat localized regions of magnetic media to a selected temperature, effecting local changes in coercivity of the magnetic media.

Abstract: High density-information storage is accomplished by the use of novel, near-field optical devices in combination with high-density storage media. The near-field optical devices are configured to focus light to nanoscale spot sizes and may employ negative index of refraction materials for focusing. The high-density storage media may include protein-based storage media, such as photochromic proteins, and high-coercivity magnetic storage media. Light energy provided the optical devices may enable exposed protein molecules to transition between stable molecular states that may be distinguished on the basis of their respective spectral maxima. Light energy provided by the optical device may also be used to heat localized regions of magnetic media to a selected temperature, effecting local changes in coercivity of the magnetic media.

Abstract: Magnetic Force Microscopy (MFM) probe tips that provide enhanced spatial resolution and methods of manufacture are provided. In one aspect, two or more magnetically-decoupled layers may be deposited on an AFM probe in order to create an active magnetic region at about the apex of the probe tip with dimensions less than about 10 nanometers. In another aspect, nanoscale patterning techniques may be employed to fabricate probe tips that possess plateau features. These plateau features may serve as substrates for the deposition of magnetic films having properties similar to magnetic recording media. Machining techniques, such as Focused Ion Beam (FIB) may be further employed to reduce the size of the magnetic materials deposited upon the substrate.

Abstract: A multilayered three-dimensional media having a plurality of magnetic sublayers, each of the magnetic sublayers being separated from one another by a non-magnetic layer. The plurality of magnetic sublayers can be a stack of one or more coupled Co/Pd or Co/Pt layers; a layer of Co—Cr alloys optionally containing TiO2, SiO2, C, Pt, and B; a stack of one or more Co—Cr—Pt/Pt layers; a stack of one or more Co—Cr—Pd/Pd layers; and/or a stack of one or more layers of Fe—Pt, Fe—Pd, Co—Pt, and Co—Pd materials in an L10 phase. The non-magnetic layers are Pd, Pt, Ti, Ta, Cu, Au, Ag, MgO, or/and ITO. In addition, a multilayered three-dimensional recording system is disclosed, which includes a three-dimensional media, the three-dimensional media includes a plurality of magnetic sublayers, wherein each magnetic sublayer is adapted for writing data to; and a recording head having a trailing edge, and wherein the trailing edge has a higher permeability than the recording head.

Abstract: Magnetic Force Microscopy (MFM) probe tips that provide enhanced spatial resolution and methods of manufacture are provided. In one aspect, two or more magnetically-decoupled layers may be deposited on an AFM probe in order to create an active magnetic region at about the apex of the probe tip with dimensions less than about 10 nanometers. In another aspect, nanoscale patterning techniques may be employed to fabricate probe tips that possess plateau features. These plateau features may serve as substrates for the deposition of magnetic films having properties similar to magnetic recording media. Machining techniques, such as Focused Ion Beam (FIB) may be further employed to reduce the size of the magnetic materials deposited upon the substrate.