Patents by Inventor Rachel Eisenhower

Rachel Eisenhower has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray reflectometry system with multiple sample holder and individual sample lifting mechanism
    Patent number: 7746980
    Abstract: An X-ray reflectometry apparatus comprises an X-ray source (1) configured to emit an incident X-ray beam directed onto a sample measuring position and an X-ray detector (2) configured to detect an X-ray beam (3) reflected from a surface of a selected sample (4) located in said sample measuring position and with a multiple sample holder (5) comprising an essentially horizontal one- or two-dimensional array of sample resting positions into which solid samples can be placed from above. A drive mechanism (6) moves the sample holder in one or two directions within a horizontal plane underneath the sample measuring position in order to place a selected sample (4) directly beneath the measuring position and a sample lift mechanism (7) has a vertically movable piston (8) located below the multiple sample holder (5) beneath the sample measuring position.
    Type: Grant
    Filed: December 16, 2008
    Date of Patent: June 29, 2010
    Assignee: Bruker AXS GmbH
    Inventors: Rolf-Dieter Schipper, Eduard Konusch, Rachel Eisenhower, Lutz Bruegemann
  • X-RAY REFLECTOMETRY SYSTEM WITH MULTIPLE SAMPLE HOLDER AND INDIVIDUAL SAMPLE LIFTING MECHANISM
    Publication number: 20100150310
    Abstract: An X-ray reflectometry apparatus comprises an X-ray source (1) configured to emit an incident X-ray beam directed onto a sample measuring position and an X-ray detector (2) configured to detect an X-ray beam (3) reflected from a surface of a selected sample (4) located in said sample measuring position and with a multiple sample holder (5) comprising an essentially horizontal one- or two-dimensional array of sample resting positions into which solid samples can be placed from above. A drive mechanism (6) moves the sample holder in one or two directions within a horizontal plane underneath the sample measuring position in order to place a selected sample (4) directly beneath the measuring position and a sample lift mechanism (7) has a vertically movable piston (8) located below the multiple sample holder (5) beneath the sample measuring position.
    Type: Application
    Filed: December 16, 2008
    Publication date: June 17, 2010
    Applicant: Bruker AXS GmbH
    Inventors: Rolf-Dieter Schipper, Eduard Konusch, Rachel Eisenhower, Lutz Bruegemann
  • Analysis device with variably illuminated strip detector
    Patent number: 7263161
    Abstract: An X-ray or neutron-optical analysis device comprising means for directing radiation from a source (1) onto a sample (2), and a detector (7) with n substantially identical detector elements (Di) which are disposed parallel, next to each other in a first direction x and which extend in strips in a second direction y, wherein i=1, . . .
    Type: Grant
    Filed: September 28, 2005
    Date of Patent: August 28, 2007
    Assignee: Bruker AXS GmbH
    Inventors: Ekkehard Gerndt, Pawel Grybos, Lutz Bruegemann, Rachel Eisenhower, Arne Kasten
  • Analysis device with variably illuminated strip detector
    Publication number: 20060083350
    Abstract: An X-ray or neutron-optical analysis device comprising means for directing radiation from a source (1) onto a sample (2), and a detector (7) with n substantially identical detector elements (Di) which are disposed parallel, next to each other in a first direction x and which extend in strips in a second direction y, wherein i=1, . . .
    Type: Application
    Filed: September 28, 2005
    Publication date: April 20, 2006
    Applicant: Bruker AXS GmbH
    Inventors: Ekkehard Gerndt, Pawel Grybos, Lutz Bruegemann, Rachel Eisenhower, Arne Kasten