Patents by Inventor Radek P. Chalupa

Radek P. Chalupa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11652067
    Abstract: Methods/structures of forming substrate tap structures are described. Those methods/structures may include forming a plurality of conductive interconnect structures on an epitaxial layer disposed on a substrate, wherein individual ones of the plurality of conductive interconnect structures are adjacent each other, forming a portion of a seed layer on at least one of the plurality of conductive interconnect structures, and forming a conductive trace on the seed layer.
    Type: Grant
    Filed: December 28, 2016
    Date of Patent: May 16, 2023
    Assignee: Intel Corporation
    Inventors: Christopher J. Jezewski, Radek P. Chalupa, Flavio Griggio, Inane Meric, Jiun-Chan Yang
  • Publication number: 20200402921
    Abstract: Methods/structures of forming substrate tap structures are described. Those methods/structures may include forming a plurality of conductive interconnect structures on an epitaxial layer disposed on a substrate, wherein individual ones of the plurality of conductive interconnect structures are adjacent each other, forming a portion of a seed layer on at least one of the plurality of conductive interconnect structures, and forming a conductive trace on the seed layer.
    Type: Application
    Filed: December 28, 2016
    Publication date: December 24, 2020
    Applicant: Intel Corporation
    Inventors: Christopher J. Jezewski, Radek P. Chalupa, Flavio Griggio, Inanc Meric, Jiun-Chan Yang
  • Publication number: 20080213995
    Abstract: In one embodiment, the present invention includes a method for forming a dielectric layer on a semiconductor wafer and patterning at least one opening in the dielectric layer, depositing a barrier layer over the dielectric layer, depositing a conductive layer over the barrier layer, and electropolishing the conductive layer while ultrasonically agitating the semiconductor wafer until a predetermined amount of the conductive layer remains over the barrier layer. Other embodiments are described and claimed.
    Type: Application
    Filed: March 2, 2007
    Publication date: September 4, 2008
    Inventors: Tatyana N. Andryushchenko, Radek P. Chalupa, Anne E. Miller, Lei Jiang
  • Patent number: 7279084
    Abstract: A method for an electroplating cell which includes providing an anode chamber with at least two concentric anodes including an inner anode and an outer anode; generating a computer generated model with a simulation computer program; and selecting at least one current ratio from the computer generated model, with the computer generated model having a plurality of current ratios from which the at least one current ratio is selected and the one current ratio being a ratio of an inner electrical current to an outer electrical current. The method further includes applying the inner electrical current to the inner anode and the outer electrical current to the outer anode and adjusting the inner and outer electrical currents to incorporate the one current ratio. The generating of the computer generated model with the simulation computer program includes using a first iterative loop to determine a potential field in the anode chamber.
    Type: Grant
    Filed: February 6, 2004
    Date of Patent: October 9, 2007
    Assignee: Intel Corporation
    Inventors: Radek P. Chalupa, Harsono Siem Simka, Sadasivan Shankar, Daniel J. Zierath, Iouri Lantassov, Terry T. Buckley, Anand Durairajan