Patents by Inventor Radel Ben-Av

Radel Ben-Av has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110286960
    Abstract: Neutropenia is the dose-limiting toxicity of the tri-weekly docetaxel (Taxotere®) schedule. Here, we evaluate in Metastatic Breast Cancer (MBC) patients (N=38) a computerized method for predicting docetaxel-induced neutropenia, and use the model to identify improved docetaxel and Granulocyte Colony Stimulating Factor (G-CSF) regimens. Pharmacokinetics/pharmacodynamics (PK/PD) models were created and simulated concomitantly with a mathematical granulopoiesis model. Individual baseline neutrophil counts and docetaxel schedules served as inputs. Our trial validated the model accuracy in predicting nadir timings (r=0.99), grade 3/4 neutropenia (86% success) and neutrophil profiles (r=0.62). Model was robust to CYP3A-induced variability, except for slightly less accurate grade 3/4 neutropenia predictions.
    Type: Application
    Filed: November 2, 2009
    Publication date: November 24, 2011
    Applicant: OPTIMATA LTD.
    Inventors: Oded Vainas, Vladimir Vainstein, Ori Inbar, Marina Kleiman, Radel Ben-av, Zvia Agur
  • Patent number: 7800062
    Abstract: The present invention provides, according to a first aspect, a method for the examination of specimen with a beam of charged particles. The method provides one or more images of the specimen made with different view angles, so that, compared to a single image of the specimen, a lot of additional information about the specimen can be accessed. The different view angles (angles of incidence) are achieved by tilting the beam between the two images and moving the specimen to a new position so that the displacement of the beam caused by the tilting of the beam is compensated. Accordingly, while displaying/recording the second image the beam scans over the same area as it has scanned while displaying/recording the first image.
    Type: Grant
    Filed: August 6, 2004
    Date of Patent: September 21, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Alex Goldenshtein, Radel Ben-Av, Asher Pearl, Igor Petrov, Nadav Haas, Pavel Adamec, Yaron Gold
  • Publication number: 20050116164
    Abstract: The present invention provides, according to a first aspect, a method for the examination of specimen with a beam of charged particles. The method provides one or more images of the specimen made with different view angles, so that, compared to a single image of the specimen, a lot of additional information about the specimen can be accessed. The different view angles (angles of incidence) are achieved by tilting the beam between the two images and moving the specimen to a new position so that the displacement of the beam caused by the tilting of the beam is compensated. Accordingly, while displaying/recording the second image the beam scans over the same area as it has scanned while displaying/recording the first image.
    Type: Application
    Filed: August 6, 2004
    Publication date: June 2, 2005
    Inventors: Alex Goldenshtein, Radel Ben-Av, Asher Pearl, Igor Petrov, Nadav Haas
  • Patent number: 6894435
    Abstract: A method for scanning a specimen 105 with beams 102 of charged particles of a source group. Thereby, a plurality of target points 402 is scanned with a charged particle beam emitted by a source 106 and the same plurality of target points is scanned with at least one further charged particle beam emitted by at least one further source. Further, the charged particle beams from the source and the at least one further source are emitted on the same target point at different times. Additionally, a multiple charged particle beam source and a data feed system are provided. A source array 104 comprises at least one logical emitting unit 106, wherein patterning information is shifted in a shift circuit 140, and redundancy emitting units 106, wherein individual redundancy emitting units obtain patterning information from the shift register.
    Type: Grant
    Filed: November 6, 2002
    Date of Patent: May 17, 2005
    Assignee: Applied Materials, Inc.
    Inventors: David Aviel, Jimmy Vishnipolsky, Radel Ben-Av
  • Publication number: 20040085024
    Abstract: A method for scanning a specimen 105 with beams 102 of charged particles of a source group. Thereby, a plurality of target points 402 is scanned with a charged particle beam emitted by a source 106 and the same plurality of target points is scanned with at least one further charged particle beam emitted by at least one further source. Further, the charged particle beams from the source and the at least one further source are emitted on the same target point at different times. Additionally, a multiple charged particle beam source and a data feed system are provided. A source array 104 comprises at least one logical emitting unit 106, wherein patterning information is shifted in a shift circuit 140, and redundancy emitting units 106, wherein individual redundancy emitting units obtain patterning information from the shift register.
    Type: Application
    Filed: November 6, 2002
    Publication date: May 6, 2004
    Inventors: David Aviel, Jimmy Vishnipolsky, Radel Ben-Av