Abstract: A lens system for use with a phase plate in a transmission electron microscope comprises a phase plate placed after the back-focal plane of the objective lens in an imaging system mounted downstream of the objective lens. Phase lenses image the back-focal plane of the objective lens onto the phase plate such that the position and tilt of the electron beam relative to the optical axis are made conjugate. An alignment coil may direct the electron beam going out of the phase lenses toward the phase plate. A second alignment coil may direct the electron beam going out of the phase plate toward the imaging lenses located after the phase plate.

Abstract: Phase manipulation is used to produce a high contrast electron microscope image. A phase plate is placed at the back focal plane of an objective lens and used to form a differential contrast image.

Abstract: Phase manipulation is used to produce a high contrast electron microscope image. A phase plate is placed at the back focal plane of an objective lens and used to form a differential contrast image.

Abstract: A lens system for use with a phase plate in a transmission electron microscope comprises a phase plate placed after the back-focal plane of the objective lens in an imaging system mounted downstream of the objective lens. Phase lenses image the back-focal plane of the objective lens onto the phase plate such that the position and tilt of the electron beam relative to the optical axis are made conjugate. An alignment coil may direct the electron beam going out of the phase lenses toward the phase plate. A second alignment coil may direct the electron beam going out of the phase plate toward the imaging lenses located after the phase plate.

Abstract: An antistatic phase plate for use in a phase-contrast electron microscope. The phase plate is made of a thin film held on the objective aperture of the microscope for shifting the phases of incident and scattered electron waves by a uniform amount. The thin film is a conductive amorphous material typified by amorphous carbon and amorphous gold or a composite of such conductive amorphous materials. A genuinely circular, microscopic electron passage hole is formed in the center of the opening in the objective aperture. Alternatively, a genuinely circular amorphous material is deposited on the center of the opening in the objective aperture to delay the phase of electron waves by &pgr;.