Patents by Inventor Rae Knowles

Rae Knowles has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High pressure charged particle beam system
    Patent number: 8921811
    Abstract: The current invention includes methods and apparatuses for processing, that is, altering and imaging, a sample in a high pressure charged particle beam system. Embodiments of the invention include a cell in which the sample is positioned during high pressure charged particle beam processing. The cell reduces the amount of gas required for processing, thereby allowing rapid introduction, exhaustion, and switching between gases and between processing and imaging modes. Maintaining the processes gases within the cell protects the sample chamber and column from contact with the gases. In some embodiments, the temperature of the cell walls and the sample can be controlled.
    Type: Grant
    Filed: February 6, 2008
    Date of Patent: December 30, 2014
    Assignee: FEI Company
    Inventors: Milos Toth, Rae Knowles
  • Scanning transmission electron microscope using gas amplification
    Patent number: 8299432
    Abstract: A scanning transmission electron microscope operated with the sample in a high pressure environment. A preferred detector uses gas amplification by converting either scattered or unscattered transmitted electrons to secondary electrons for efficient gas amplification.
    Type: Grant
    Filed: November 4, 2008
    Date of Patent: October 30, 2012
    Assignee: FEI Company
    Inventors: Milos Toth, William Ralph Knowles, Rae Knowles, legal representative
  • HIGH PRESSURE CHARGED PARTICLE BEAM SYSTEM
    Publication number: 20110031394
    Abstract: The current invention includes methods and apparatuses for processing, that is, altering and imaging, a sample in a high pressure charged particle beam system. Embodiments of the invention include a cell in which the sample is positioned during high pressure charged particle beam processing. The cell reduces the amount of gas required for processing, thereby allowing rapid introduction, exhaustion, and switching between gases and between processing and imaging modes. Maintaining the processes gases within the cell protects the sample chamber and column from contact with the gases. In some embodiments, the temperature of the cell walls and the sample can be controlled.
    Type: Application
    Filed: February 6, 2008
    Publication date: February 10, 2011
    Applicant: FEI COMPANY
    Inventors: William Ralph Knowles, Rae Knowles, Milos Toth
  • SCANNING TRANSMISSION ELECTRON MICROSCOPE USING GAS AMPLIFICATION
    Publication number: 20100108881
    Abstract: A scanning transmission electron microscope operated with the sample in a high pressure environment. A preferred detector uses gas amplification by converting either scattered or unscattered transmitted electrons to secondary electrons for efficient gas amplification.
    Type: Application
    Filed: November 4, 2008
    Publication date: May 6, 2010
    Applicant: FEI COMPANY
    Inventors: MILOS TOTH, Rae Knowles, William Ralph Knowles