Abstract: An adaptable sorter unit includes an attachment mechanism, a sorting device that is capable of deflecting a sample, a data port that is capable of receiving information, and a power port that is connectable to a power source. The attachment mechanism, the sorting device, the data port, and the power port are physically connected together. The adaptable sorter unit also includes a memory circuit and a processor circuit configured to read information received via the data port and control the sorting device. The sorting device is a vacuum system, a mechanical pedal system, or an air jet system. The attachment mechanism is a mounting bracket, a mounting bracket receptacle, a weldable material, a clamp, a bolt, or a screw. The attachment mechanism connects the adaptable sorter unit to a processing line such that the adaptable sorter unit is capable of deflecting a sample traveling along the processing line.

Abstract: A method for generating a quality inspection data block for a distributed ledger includes: determining an identification code associated with a sample to be inspected, inspecting the sample and thereby generating quality inspection data associated with the sample, and after completion of the inspecting of the sample combining the identification code and the quality inspection data into the quality inspection data block. The method also includes adding the quality inspection data block to the distributed ledger. An inspector including a sensor that senses a characteristic of a sample, a memory that stores sensor output data, and a processor configured to: determine an identification code associated with a sample to be inspected, generate quality inspection data based on the sensor output data, and combine the identification code and the quality inspection data into a quality inspection data block. In one example, the inspector is an in-flight 3D inspector.

Abstract: An adaptable sorter unit includes an attachment mechanism, a device that is capable of moving a first sample by use of a vacuum, a pressurized air inlet, and a valve. The pressurized air inlet is connected to the valve that controls a flow of pressurized air through the device. The valve may be electronically controlled or pneumatically controlled. The location of the adaptable sorter unit may be adjustable based, at least in part, on data captured by an optical inspector. An array of adaptable sorter units may be configured side-by-side to cover the width of the processing line. The device may be a venturi vacuum. The adaptable sorter unit may include a baseline vacuum control valve that causes a baseline vacuum force to be applied. An electrical control signal may be used to open the valve, the frequency of which may control the amount of time the valve is opened.

Abstract: An adaptable inspection unit includes an attachment mechanism, an inspection sensor device, a data port that is capable of transmitting information, and a power port that is connectable to a power source, all of which are physically connected together. The adaptable inspection unit also includes a memory circuit and a processor circuit. The processing circuit controls the inspection sensor device and writes information transmitted via the data port. The attachment mechanism is a mounting bracket, a mounting bracket receptacle, a weldable material, a clamp, an adhesive, a magnet, a latch, a lock, a locating pin, a rail, a slide, locking pin, a bolt, a screw, gravity or friction. The attachment mechanism is used to connect the adaptable inspection unit to a processing line such that the adaptable inspection unit is capable of capturing an image of a sample traveling along the processing line.

Abstract: An in-flight 3D inspector includes a sample input funnel, a sample chute, a trigger, a plurality of cameras, a light source and storage device. A sample is placed in the sample input funnel and is caused to travel down the sample chute. The trigger is located on the sample chute and detects when the sample passes the trigger. In response to detecting the passing of the sample, the trigger outputs a trigger signal that indicates when the sample will pass through a focal plane on which all the plurality of cameras are focused. In response to the trigger signal, the sample is illuminated by the light source and the plurality of cameras capture an image of the sample as the sample passes through the focal plane. The captured images are stored on the storage device and used to generate a 3D image of the sample.

Abstract: An adaptable inspection unit includes an attachment mechanism, an inspection sensor device, a data port that is capable of transmitting information, and a power port that is connectable to a power source, all of which are physically connected together. The adaptable inspection unit also includes a memory circuit and a processor circuit. The processing circuit controls the inspection sensor device and writes information transmitted via the data port. The attachment mechanism is a mounting bracket, a mounting bracket receptacle, a weldable material, a clamp, an adhesive, a magnet, a latch, a lock, a locating pin, a rail, a slide, locking pin, a bolt, a screw, gravity or friction. The attachment mechanism is used to connect the adaptable inspection unit to a processing line such that the adaptable inspection unit is capable of capturing an image of a sample traveling along the processing line.

Abstract: An adaptable sorter unit includes an attachment mechanism, a sorting device that is capable of deflecting a sample, a data port that is capable of receiving information, and a power port that is connectable to a power source. The attachment mechanism, the sorting device, the data port, and the power port are physically connected together. The adaptable sorter unit also includes a memory circuit and a processor circuit configured to read information received via the data port and control the sorting device. The sorting device is a vacuum system, a mechanical pedal system, or an air jet system. The attachment mechanism is a mounting bracket, a mounting bracket receptacle, a weldable material, a clamp, a bolt, or a screw. The attachment mechanism connects the adaptable sorter unit to a processing line such that the adaptable sorter unit is capable of deflecting a sample traveling along the processing line.

Abstract: An optical inspector with feedback capability includes an optical device that captures an image when a sample is within the field of view of the optical device, a storage device that stores the captured image, a processor that determines a quality characteristic value of the sample based on the captured image, and an interface circuit that outputs inspection data or a command based on the quality characteristic value. A method of controlling a sample processing line is also disclosed, the method including capturing an image of a sample traversing the processing line, determining a quality characteristic of the sample based at least in part on the captured image, and causing the operation of a device included in the processing line to be adjusted based at least in part on the quality characteristic value. In one example, the optical inspector is an in-flight 3D inspector located in the processing line.

Abstract: A method for generating a quality inspection data block for a distributed ledger includes: determining an identification code associated with a sample to be inspected, inspecting the sample and thereby generating quality inspection data associated with the sample, and after completion of the inspecting of the sample combining the identification code and the quality inspection data into the quality inspection data block. The method also includes adding the quality inspection data block to the distributed ledger. An inspector including a sensor that senses a characteristic of a sample, a memory that stores sensor output data, and a processor configured to: determine an identification code associated with a sample to be inspected, generate quality inspection data based on the sensor output data, and combine the identification code and the quality inspection data into a quality inspection data block. In one example, the inspector is an in-flight 3D inspector.

Abstract: A method for generating a quality inspection data block for a distributed ledger includes: determining an identification code associated with a sample to be inspected, inspecting the sample and thereby generating quality inspection data associated with the sample, and after completion of the inspecting of the sample combining the identification code and the quality inspection data into the quality inspection data block. The method also includes adding the quality inspection data block to the distributed ledger. An inspector including a sensor that senses a characteristic of a sample, a memory that stores sensor output data, and a processor configured to: determine an identification code associated with a sample to be inspected, generate quality inspection data based on the sensor output data, and combine the identification code and the quality inspection data into a quality inspection data block. In one example, the inspector is an in-flight 3D inspector.

Abstract: An in-flight 3D inspector includes a sample input funnel, a sample chute, a trigger, a plurality of cameras, a light source and storage device. A sample is placed in the sample input funnel and is caused to travel down the sample chute. The trigger is located on the sample chute and detects when the sample passes the trigger. In response to detecting the passing of the sample, the trigger outputs a trigger signal that indicates when the sample will pass through a focal plane on which all the plurality of cameras are focused. In response to the trigger signal, the sample is illuminated by the light source and the plurality of cameras capture an image of the sample as the sample passes through the focal plane. The captured images are stored on the storage device and used to generate a 3D image of the sample.

Abstract: An optical inspector with feedback capability includes an optical device that captures an image when a sample is within the field of view of the optical device, a storage device that stores the captured image, a processor that determines a quality characteristic value of the sample based on the captured image, and an interface circuit that outputs inspection data or a command based on the quality characteristic value. A method of controlling a sample processing line is also disclosed, the method including capturing an image of a sample traversing the processing line, determining a quality characteristic of the sample based at least in part on the captured image, and causing the operation of a device included in the processing line to be adjusted based at least in part on the quality characteristic value. In one example, the optical inspector is an in-flight 3D inspector located in the processing line.