Patents by Inventor Rafael Mendez

Rafael Mendez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10520400
    Abstract: A device for obtaining samples from a flowing powder stream and performing their immediate analysis using a spectroscopic method is provided. Systematic sample size reduction is achieved to provide representative samples and their immediate (real-time) analysis. The powder blends may come from pharmaceutical, vitamin and nutraceutical products, which must fulfill blend homogeneity requirements. All parts of the batch will have the same probability of being selected as a sample. Samples are obtained without disturbing or changing the composition of the powder blend during the sampling process. Unlike the sample thief commonly used in the pharmaceutical industry, the device of the invention does not disturb the powder blend and does not change the properties of the powder blend during the sampling.
    Type: Grant
    Filed: September 19, 2018
    Date of Patent: December 31, 2019
    Assignee: University of Puerto Rico
    Inventors: Rodolfo J. Romanach, Rafael Mendez
  • Patent number: 9169975
    Abstract: A method and system are disclosed for verifying the flow rate of gas through a mass flow controller, such as a mass flow controller used with a tool for semiconductor or solar cell fabrication. To verify the mass flow rate measured by the mass flow controller, gas passing through the mass flow controller is also passed through a mass flow meter. The measured flow rate through the mass flow controller is compared to the measured flow rate through the mass flow meter and any difference between the two measured flow rates is determined. Depending upon the magnitude of any difference, the flow of gas to the mass flow controller may be altered.
    Type: Grant
    Filed: August 28, 2012
    Date of Patent: October 27, 2015
    Assignee: ASM IP Holding B.V.
    Inventors: Michael Christopher Sarin, Rafael Mendez, Gregory M. Bartlett, Eric Hill, Keith R. Lawson, Andy Rosser
  • Publication number: 20140060147
    Abstract: A method and system are disclosed for verifying the flow rate of gas through a mass flow controller, such as a mass flow controller used with a tool for semiconductor or solar cell fabrication. To verify the mass flow rate measured by the mass flow controller, gas passing through the mass flow controller is also passed through a mass flow meter. The measured flow rate through the mass flow controller is compared to the measured flow rate through the mass flow meter and any difference between the two measured flow rates is determined. Depending upon the magnitude of any difference, the flow of gas to the mass flow controller may be altered.
    Type: Application
    Filed: August 28, 2012
    Publication date: March 6, 2014
    Applicant: ASM IP Holding B.V.
    Inventors: Michael Christopher Sarin, Rafael Mendez, Gregory Bartlett, Eric Hill, Keith R. Lawson, Andy Rosser
  • Publication number: 20020151987
    Abstract: The invention is a method and apparatus for interconnecting a plurality of control systems used to planarize wafers in a CMP tool. Example control systems that may be used with the invention are the back-fill pressure of a carrier, carrier down-force, carrier rotation and platen rotation. A controller is used to automate the CMP tool by communicating desired set-points to the various control systems. The instability or fluctuations in control systems caused by a desired change in one or more other control systems are reduced by allowing the affected control systems to receive information regarding the intended actions by the control systems that affect them. In this manner the affected control systems may take proactive steps to reduce fluctuations in their output caused by changes in the other control systems.
    Type: Application
    Filed: April 13, 2001
    Publication date: October 17, 2002
    Inventor: Rafael Mendez
  • Publication number: 20010039462
    Abstract: A system and method for predicting software models used in chemical mechanical polishing (CMP) of workpieces using material-centric process instrumentation. One embodiment is a system which includes a feed forward loop for computing predictive calculations, a feed back loop for computing run-to-run calculations, a historical database which links together the feed forward and feed back loops, and a computational engine used to calculate new or adjusted CMP process parameters.
    Type: Application
    Filed: April 2, 2001
    Publication date: November 8, 2001
    Inventors: Rafael Mendez, Randy Smith, Matthew Weldon, Adithya Mokshagundam, David G. Wasinger