Abstract: A direct TOF optic sensor is based on CMOS pixels, wherein a pixel structure comprises a photodetector PhD, a non linear resistance R and a transfer MOS transistor in series, and delivers an output signal at a sensing node SN between the resistor and the transfer transistors. The photogenerated current is continuously drained into the nonlinear resistance and converted to a voltage signal by the RC circuit formed by the nonlinear resistance and a capacitance at the sense node SN. The voltage signal is continuously transmitted to a readout circuitry 300 having a fast analog to digital converter. The RC circuit within the pixel structure has a low pass filtering function and a high frequency integrating function, so that noise, in particular thermal noise due to the nonlinear resistance is mainly shifted in a low frequency range, separate from a high frequency range of the main signal component corresponding to a pulse light signal received at the photodetector.

Abstract: A CMOS optical sensor comprises spare readout channels to replace readout channels found defective at the end of the manufacturing process. These spare readout channels are dispatched over the width of the optical sensor (corresponding to the row direction) in the form of spare groups Gm1, Gm2, Gm3 of m spare readout channels each, m integer at least equal to 1. Each spare group is inserted between two successive default groups Gn1 and Gn2 of n default readout channels each and coupling means SW1 are configured to replace a defective default readout channel in a default group as well as any default readout channels of the group between the defective one and the spare group next to the default group of concern.

Abstract: A CMOS optical sensor comprises spare readout channels to replace readout channels found defective at the end of the manufacturing process. These spare readout channels are dispatched over the width of the optical sensor (corresponding to the row direction) in the form of spare groups Gm1, Gm2, Gm3 of m spare readout channels each, m integer at least equal to 1. Each spare group is inserted between two successive default groups Gn1 and Gn2 of n default readout channels each and coupling means SW1 are configured to replace a defective default readout channel in a default group as well as any default readout channels of the group between the defective one and the spare group next to the default group of concern.

Abstract: A direct TOF optic sensor is based on CMOS pixels, wherein a pixel structure comprises a photodetector PhD, a non linear resistance R and a transfer MOS transistor in series, and delivers an output signal at a sensing node SN between the resistor and the transfer transistors. The photogenerated current is continuously drained into the nonlinear resistance and converted to a voltage signal by the RC circuit formed by the nonlinear resistance and a capacitance at the sense node SN. The voltage signal is continuously transmitted to a readout circuitry 300 having a fast analog to digital converter. The RC circuit within the pixel structure has a low pass filtering function and a high frequency integrating function, so that noise, in particular thermal noise due to the nonlinear resistance is mainly shifted in a low frequency range, separate from a high frequency range of the main signal component corresponding to a pulse light signal received at the photodetector.

Abstract: An optical safety scanner system comprises a first illumination source for detecting presence and distances of people or other objects within a hazardous industrial area based on triangulation, and a second illumination source that verifies accurate and reliable detection by the first illumination source. The first illumination source can project LED or laser light for triangulation of objects, and the second illumination source can project a wide beam of light for detection of other intrusive objects that may be blocking the scanner system's camera and preventing accurate triangulation of people or vehicles. If the image frame generated based on the second light identifies presence of an object that is not detected by the triangulation analysis of the laser light, the safety scanner system assumes that an object is obstructing the safety scanner system's camera, and performs a suitable safety action.

Abstract: An optical safety scanner system comprises a first illumination source for detecting presence and distances of people or other objects within a hazardous industrial area based on triangulation, and a second illumination source that verifies accurate and reliable detection by the first illumination source. The first illumination source can project LED or laser light for triangulation of objects, and the second illumination source can project a wide beam of light for detection of other intrusive objects that may be blocking the scanner system's camera and preventing accurate triangulation of people or vehicles. If the image frame generated based on the second light identifies presence of an object that is not detected by the triangulation analysis of the laser light, the safety scanner system assumes that an object is obstructing the safety scanner system's camera, and performs a suitable safety action.

Abstract: The present invention relates to reading-out sensor array pixels. In particular, the present invention provides an approach according to which only a region of interest is may be read out from the sensor array, thus leading to substantial time savings. In order to achieve this, a circuitry for configuring a region of interest for the sensor array is provided as well as a reading-out circuitry for reading-out pixels belonging to the region of interest. In addition, the corresponding methods for programming the region of interest and for reading-out the region of interest are provided. The circuitry for programming and/or reading-out the region of interest includes per pixel provided storage elements for storing an indication of whether a pixel belongs to a region of interest (ROI). These are configured by the programming circuitry and using when reading-out the ROI for only reading out the pixels of the ROI.

Abstract: A time-of-flight (TOF) sensor device is provided that is capable of accurately recovering waveforms of reflected light pulses incident on the sensor's photo-receiver array using a low sampling rate. A number of samples for a received light pulse incident on a given photo-receiver are obtained by emitting a light pulse to the viewing field, integrating the electrical output generated by the photo receiver over an integration period, and adding the integral values for respective integration cycles to yield an accumulation value. This process is repeated for multiple accumulation cycles; however, for each consecutive accumulation cycle the start of the integration period is delayed relative the start time of the integration period for the previous cycle by a delay period. Sampled values for the waveform are obtained by determining the difference values between consecutive accumulation values for the respective accumulation cycles.

Abstract: The present invention relates to reading-out sensor array pixels. In particular, the present invention provides an approach according to which only a region of interest with arbitrary geometry may be read out from the sensor array, thus leading to substantial time savings. In order to achieve this, a circuitry is provided for automatic determining of a ROI and reading out the ROI from the sensor array. The circuitry includes a fast reading-out circuitry which is less precise but faster than the accurate reading-out circuitry for reading-out the pixels of the sensor array. The fast reading-out circuitry reads out the pixels with low-level precision and determines by the processing of the fast read-out pixels the ROI which is then provided to an in-pixel ROI programming circuit for storing the ROI identification and by means thereof to the accurate reading-out circuit which then reads out only the pixels determined to belong to the ROI. The accurate read-out circuit is slower than the fast read-out circuit.

Abstract: The present invention relates to reading-out sensor array pixels. In particular, the present invention provides an approach according to which only a region of interest with arbitrary geometry may be read out from the sensor array, thus leading to substantial time savings. In order to achieve this, a circuitry is provided for automatic determining of a ROI and reading out the ROI from the sensor array. The circuitry includes a fast reading-out circuitry which is less precise but faster than the accurate reading-out circuitry for reading-out the pixels of the sensor array. The fast reading-out circuitry reads out the pixels with low-level precision and determines by the processing of the fast read-out pixels the ROI which is then provided to an in-pixel ROI programming circuit for storing the ROI identification and by means thereof to the accurate reading-out circuit which then reads out only the pixels determined to belong to the ROI. The accurate read-out circuit is slower than the fast read-out circuit.

Abstract: The present invention relates to reading-out sensor array pixels. In particular, the present invention provides an approach according to which only a region of interest is may be read out from the sensor array, thus leading to substantial time savings. In order to achieve this, a circuitry for configuring a region of interest for the sensor array is provided as well as a reading-out circuitry for reading-out pixels belonging to the region of interest. In addition, the corresponding methods for programming the region of interest and for reading-out the region of interest are provided. The circuitry for programming and/or reading-out the region of interest includes per pixel provided storage elements for storing an indication of whether a pixel belongs to a region of interest (ROI). These are configured by the programming circuitry and using when reading-out the ROI for only reading out the pixels of the ROI.

Abstract: A time-of-flight (TOF) sensor device is provided that is capable of accurately recovering waveforms of reflected light pulses incident on the sensor's photo-receiver array using a low sampling rate. A number of samples for a received light pulse incident on a given photo-receiver are obtained by emitting a light pulse to the viewing field, integrating the electrical output generated by the photo receiver over an integration period, and adding the integral values for respective integration cycles to yield an accumulation value. This process is repeated for multiple accumulation cycles; however, for each consecutive accumulation cycle the start of the integration period is delayed relative the start time of the integration period for the previous cycle by a delay period. Sampled values for the waveform are obtained by determining the difference values between consecutive accumulation values for the respective accumulation cycles.