Patents by Inventor Raghavendra PUTTI

Raghavendra PUTTI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Magnetic resonance imaging apparatus and method for detecting error of magnetic resonance imaging apparatus
    Patent number: 10310036
    Abstract: A magnetic resonance imaging (MRI) apparatus and a method of detecting an error of the MRI apparatus are provided. The MRI apparatus includes a radio frequency (RF) coil configured to transmit and receive an RF signal, a bias circuit configured to tune and detune the RF coil, and a monitoring circuit configured to monitor a parameter among a bias voltage and a bias current of the bias circuit, based on a monitoring pattern. The MRI apparatus further includes a controller configured to determine whether the bias circuit is in an abnormal state, based on a determination criteria and the monitored parameter, and either one or both of the monitoring pattern and the determination criteria vary based on a status of the bias circuit.
    Type: Grant
    Filed: January 18, 2017
    Date of Patent: June 4, 2019
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jin-sub Kim, Raghavendra Putti
  • MAGNETIC RESONANCE IMAGING APPARATUS AND METHOD FOR DETECTING ERROR OF MAGNETIC RESONANCE IMAGING APPARATUS
    Publication number: 20170205481
    Abstract: A magnetic resonance imaging (MRI) apparatus and a method of detecting an error of the MRI apparatus are provided. The MRI apparatus includes a radio frequency (RF) coil configured to transmit and receive an RF signal, a bias circuit configured to tune and detune the RF coil, and a monitoring circuit configured to monitor a parameter among a bias voltage and a bias current of the bias circuit, based on a monitoring pattern. The MRI apparatus further includes a controller configured to determine whether the bias circuit is in an abnormal state, based on a determination criteria and the monitored parameter, and either one or both of the monitoring pattern and the determination criteria vary based on a status of the bias circuit.
    Type: Application
    Filed: January 18, 2017
    Publication date: July 20, 2017
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jin-sub KIM, Raghavendra PUTTI