Abstract: A new approach is proposed that contemplates systems and methods to support post reset fuse reload for latency reduction. First, values of fuses are read once and stored into one or more load registers on an electronic device, wherein the load registers are protected. Once the values of the fuse are loaded into the load registers, a valid indicator of the load registers is set indicating that the values have been successfully loaded into the load registers. When other components of the electronic device need to access these values, the other components will check the load registers first. If it is determined that the valid indicator of the load registers is set, the stored values are read from the load registers instead of from the fuses. If the valid indicator of the load registers is not set, the values are loaded again from the fuses into the load registers.

Abstract: A system includes a test access port (TAP) configured to provide internal joint test action group (IJTAG) access to one or more test data registry (TDR). The system further includes a plurality of hierarchical electronic components, wherein each hierarchical electronic component includes a de-asserted segment inserted bit (D-SIB) register, an asserted segment inserted bit (A-SIB) register, and a TDR associated with the D-SIB register. Each D-SIB register is configured to prevent access to its associated TDR when a reset signal is asserted and each A-SIB register is configured to provide access to its subsequent A-SIB register or D-SIB register coupled thereto when the reset signal is asserted.