Abstract: A method for operating a microscopy system includes irradiating a region segment of a first region by a light source with light at a first wavelength ?1 and a first luminous intensity L1, determining a substance-specific parameter within the region segment as a response to being irradiated by the light source, and repeating the steps for all region segments within the first region. In addition, the disclosure relates to a microscopy system, and a calibration method for a microscopy system.

Abstract: The invention relates to a method for controlling a semiconductor-laser-diode-based SS-interferometer system (SS=swept source), which allows for a wide range of application and is suitable for use in ophthalmology, in particular for imaging and for determining biometric measurement values of the eye. In the method according to the invention, by means of periodic current modulation, the operation of single semiconductor laser diodes is designed such that a highly coherent spectral laser line can be adjusted with a highest possible repetition rate and over a wide wavelength range. In addition, the following parameters: centre wavelength, sweep rate, sweep range, optical power in the eye and coherence length are adjusted such that the method is suitable for imaging and biometric applications via whole-eye scans. The proposed semiconductor-laser-diode-based SS-interferometer system is provided, in particular, for biometric measuring of the eye.

Abstract: A method for compensating the artifacts generated by moving measurement objects in measurement signals of swept-source OCT systems by moving measurement objects. Signal reconstruction is implemented without the aid of additional reference signals in respect of the movement of the measurement object and only by way of especially adapted algorithms. Example methods relate firstly to the especially adapted, Fourier transform-based algorithms for processing the captured measurement signals and secondly to the measurement signals to be captured, in particular to the optical coherence interferometry-based measurement systems used for the production thereof. Although the proposed method is provided for applications in ophthalmology in particular, it can be used, in principle, wherever signals reflected by curved surfaces or backscattered from structures are analyzed.

Abstract: A source module suitable for an optical coherence tomography system. The source module comprises a source operable to emit a divergent, source output beam either of circular cross-section (e.g. as output by a vertical cavity surface emitting laser) or of elliptical cross-section (e.g. as output by an edge-emitting semiconductor laser or diode). Collimation optics are provided to convert the source output beam into a non-divergent, collimated beam of elliptical cross-section having a major axis and a minor axis. A cylindrical lens is arranged with its plano axis aligned with the major axis of the elliptical collimated beam and its power axis aligned with the minor axis of the elliptical collimated beam so as to form a line focus extending along the major axis of the elliptical collimated beam.

Abstract: A source module suitable for an optical coherence tomography system. The source module comprises a source operable to emit a divergent, source output beam either of circular cross-section (e.g. as output by a vertical cavity surface emitting laser) or of elliptical cross-section (e.g. as output by an edge-emitting semiconductor laser or diode). Collimation optics are provided to convert the source output beam into a non-divergent, collimated beam of elliptical cross-section having a major axis and a minor axis. A cylindrical lens is arranged with its plano axis aligned with the major axis of the elliptical collimated beam and its power axis aligned with the minor axis of the elliptical collimated beam so as to form a line focus extending along the major axis of the elliptical collimated beam.

Abstract: Systems and methods for sub-aperture correlation based wavefront measurement in a thick sample and correction as a post processing technique for interferometric imaging to achieve near diffraction limited resolution are described. Theory, simulation and experimental results are presented for the case of full field interference microscopy. The inventive technique can be applied to any coherent interferometric imaging technique and does not require knowledge of any system parameters. In one embodiment of the present application, a fast and simple way to correct for defocus aberration is described. A variety of applications for the method are presented.

Abstract: Systems and methods for sub-aperture correlation based wavefront measurement in a thick sample and correction as a post processing technique for interferometric imaging to achieve near diffraction limited resolution are described. Theory, simulation and experimental results are presented for the case of full field interference microscopy. The inventive technique can be applied to any coherent interferometric imaging technique and does not require knowledge of any system parameters. In one embodiment of the present application, a fast and simple way to correct for defocus aberration is described. A variety of applications for the method are presented.

Abstract: Systems and methods for sub-aperture correlation based wavefront measurement in a thick sample and correction as a post processing technique for interferometric imaging to achieve near diffraction limited resolution are described. Theory, simulation and experimental results are presented for the case of full field interference microscopy. The inventive technique can be applied to any coherent interferometric imaging technique and does not require knowledge of any system parameters. In one embodiment of the present application, a fast and simple way to correct for defocus aberration is described. A variety of applications for the method are presented.

Abstract: Systems and methods for sub-aperture correlation based wavefront measurement in a thick sample and correction as a post processing technique for interferometric imaging to achieve near diffraction limited resolution are described. Theory, simulation and experimental results are presented for the case of full field interference microscopy. The inventive technique can be applied to any coherent interferometric imaging technique and does not require knowledge of any system parameters. In one embodiment of the present invention, a fast and simple way to correct for defocus aberration is described. A variety of applications for the inventive method are presented.

Abstract: Systems and methods for sub-aperture correlation based wavefront measurement in a thick sample and correction as a post processing technique for interferometric imaging to achieve near diffraction limited resolution are described. Theory, simulation and experimental results are presented for the case of full field interference microscopy. The inventive technique can be applied to any coherent interferometric imaging technique and does not require knowledge of any system parameters. In one embodiment of the present application, a fast and simple way to correct for defocus aberration is described. A variety of applications for the method are presented.

Abstract: Methods for determining improving quantitative and qualitative motion contrast information collected with optical coherence tomography (OCT) data are presented. In one embodiment, flow within a cross-sectional area of a sample is calculated independent of the Doppler and en face angles using a bidirectional OCT system. In another embodiment, motion contrast images are improved by averaging motion contrast information collected from a bidirectional OCT system.

Abstract: Methods for determining improving quantitative and qualitative motion contrast information collected with optical coherence tomography (OCT) data are presented. In one embodiment, flow within a cross-sectional area of a sample is calculated independent of the Doppler and en face angles using a bidirectional OCT system. In another embodiment, motion contrast images are improved by averaging motion contrast information collected from a bidirectional OCT system.

Abstract: Systems and methods for sub-aperture correlation based wavefront measurement in a thick sample and correction as a post processing technique for interferometric imaging to achieve near diffraction limited resolution are described. Theory, simulation and experimental results are presented for the case of full field interference microscopy. The inventive technique can be applied to any coherent interferometric imaging technique and does not require knowledge of any system parameters. In one embodiment of the present invention, a fast and simple way to correct for defocus aberration is described. A variety of applications for the inventive method are presented.

Abstract: A device for the interferometric measurement of a sample, in particular the eye, including an interferometer arrangement with a first measurement beam path, through which a measurement beam falls onto the sample, and a first reference beam path, through which a reference beam runs, which is applied to the measuring beam for interference. The interferometer arrangement includes a second measuring beam path and/or second reference beam path. The optical path lengths of the second measuring beam path and/or second reference beam path are different from one of the first beam paths. The wave length difference is selected according to a distance of two measuring areas which are arranged at a distance in the depth direction of the sample.

Abstract: A device for the interferometric measurement of a sample, in particular the eye, including an interferometer arrangement with a first measurement beam path, through which a measurement beam falls onto the sample, and a first reference beam path, through which a reference beam runs, which is applied to the measuring beam for interference. The interferometer arrangement includes a second measuring beam path and/or second reference beam path. The optical path lengths of the second measuring beam path and/or second reference beam path are different from one of the first beam paths. The wave length difference is selected according to a distance of two measuring areas which are arranged at a distance in the depth direction of the sample.

Abstract: A device for the interferometric measurement of a sample, in particular the eye, including an interferometer arrangement with a first measurement beam path, through which a measurement beam falls onto the sample, and a first reference beam path, through which a reference beam runs, which is applied to the measuring beam for interference. The interferometer arrangement includes a second measuring beam path and/or second reference beam path. The optical path lengths of the second measuring beam path and/or second reference beam path are different from one of the first beam paths. The wave length difference is selected according to a distance of two measuring areas which are arranged at a distance in the depth direction of the sample.

Abstract: The present invention relates to an apparatus and a method combining achromatic complex FDOCT signal reconstruction with a common path and dual beam configuration. The complex signal reconstruction allows resolving the complex ambiguity of the Fourier transform and to enhance the achievable depth range by a factor of two. The dual beam configuration shares the property of high phase stability with common path FDOCT. This is of importance for a proper complex signal reconstruction and is in particular useful in combination with handheld probes such as in endoscopy and catheter applications. The advantages of the present invention are in particular the flexibility to choose arbitrarily positioned interfaces in the sample arm as reference together with the possibility to compensate for dispersion.

Abstract: The invention concerns an optical imaging apparatus comprising (o) a light source (1), (p) sample holding means, (q) an interferometer, (r) reference means, (s) an objective (8) which is adapted to have its sample side focal plane crossing a sample held in said sample holding means, (t) optical or electro-optical means (2, 3, 5, 16) adapted to produce a ring shaped or multi-spot light source in the front focal plane (17) or any conjugated plane (17?) of said objective (8), at least one detector. The invention also includes a method for using said apparatus where the sample is illuminated by an interference pattern and the depth information is obtained by using optical Coherence Tomography.

Abstract: Optical Coherence Tomography (OCT) is an imaging technique with high axial resolution in the micro-meter-scale range combined with a high sensitivity allowing for example to probe weakly back-scattering structures beneath the surface of biological tissues up to several millimeters. A major improvement of this conventional technique represents Fourier Domain OCT with a further decrease in image acquisition time and additional sensitivity. The apparatus including appropriate signal processing reconstructs the depth profile from the spectrally resolved light signal generated by a broadband source and an interferometric imaging system. By frequency shifting the light fields with frequency shifting means in the reference and sample arm a phase resolved signal at high speed can be registered. Therefore the reference arm does not rely on arm length changes or delays. The beating signal generated in this way shows high phase stability.

Abstract: A device for the interferometric measurement of a sample, in particular the eye, including an interferometer arrangement with a first measurement beam path, through which a measurement beam falls onto the sample, and a first reference beam path, through which a reference beam runs, which is applied to the measuring beam for interference. The interferometer arrangement includes a second measuring beam path and/or second reference beam path. The optical path lengths of the second measuring beam path and/or second reference beam path are different from one of the first beam paths. The wave length difference is selected according to a distance of two measuring areas which are arranged at a distance in the depth direction of the sample.