Patents by Inventor Rainer Brodmann

Rainer Brodmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10180316
    Abstract: A method and a device for contactless assessment of the surface quality of a workpiece (W) according to the angle-resolved scattered light measuring technique comprises an optical sensor (10) which illuminates a measuring spot (14). The intensity of the radiation which is reflected back is detected by means of a line sensor (16), and an intensity characteristic value (Ig) is determined therefrom. A horizontal initial rotation angle (?) at which the intensity characteristic value is at a maximum is determined. In a measuring operating mode, surface characteristic values are calculated taking into account this initial rotational angle (?). The measuring method is defined by extremely high lateral and vertical spatial resolution, extending into the subnanometer range, and by a high measuring speed.
    Type: Grant
    Filed: August 25, 2016
    Date of Patent: January 15, 2019
    Assignee: Brodmann Technologies GmbH
    Inventors: Rainer Brodmann, Boris Brodmann
  • Publication number: 20180245911
    Abstract: A method and a device for contactless assessment of the surface quality of a workpiece (W) according to the angle-resolved scattered light measuring technique comprises an optical sensor (10) which illuminates a measuring spot (14). The intensity of the radiation which is reflected back is detected by means of a line sensor (16), and an intensity characteristic value (Ig) is determined therefrom. A horizontal initial rotation angle (?) at which the intensity characteristic value is at a maximum is determined. In a measuring operating mode, surface characteristic values are calculated taking into account this initial rotational angle (?). The measuring method is defined by extremely high lateral and vertical spatial resolution, extending into the subnanometer range, and by a high measuring speed.
    Type: Application
    Filed: August 25, 2016
    Publication date: August 30, 2018
    Applicant: Brodmann Technologies GmbH
    Inventors: Rainer Brodmann, Boris Brodmann
  • Patent number: 4763006
    Abstract: A device is provided for the optical detection of form errors of a low order, for example of roughness. The device possesses a light source whose light probes the body to be examined and a light-receiving device for the light reflected by the body. The device is characterized by the fact that the light-receiving device consists of a number of light-receiving elements arranged in linear array and that an evaluation unit determines the inclination angle of the probed surface element of the body from all output signals of the light-receiving elements. Shifts in the core of the reflected light beam can be measured which are substantially below the width of a light-receiving element. The measuring results remain practically unaffected by form deviations of a higher order such as roughness etc.
    Type: Grant
    Filed: December 3, 1986
    Date of Patent: August 9, 1988
    Assignee: Optische Werke G. Rodenstock
    Inventors: Norbert Rau, Gerd Hubner, Wolfgang Staiger, Rainer Brodmann, Oskar Gerstorfer