Patents by Inventor Rainer Fackert

Rainer Fackert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8499821
    Abstract: A method for the detection and classification of surface defects on continuously cast products using topographical information about the appearance of continuously cast surface defects and/or flaws are determined with respect to their exact position, evaluated with respect to their location and dimensions, and eliminated in accordance with the evaluation prior to further machining of the product, or are prevented by optimizing the process. The defects and/or flaws on the slab surface of the continuously cast preliminary product are detected and are stored with respect to their exact position and a detection of defects and/or flaws on the finished product is carried out and stored with respect to their exact position, and in that the information from the preliminary product is then compared with the information from the surface inspection on the finished product.
    Type: Grant
    Filed: April 2, 2008
    Date of Patent: August 6, 2013
    Assignee: SMS Siemag AG
    Inventors: Dieter Rosenthal, Stephan Schulze, Ingo Schuster, Peter Sudau, Rainer Fackert, Andreas Weinert, Wilfried Schumacher
  • Publication number: 20100132910
    Abstract: A method for the detection and classification of surface defects on continuously cast products using topographical information about the appearance of continuously cast surface defects and/or flaws are determined with respect to their exact position, evaluated with respect to their location and dimensions, and eliminated in accordance with the evaluation prior to further machining of the product, or are prevented by optimizing the process. The defects and/or flaws on the slab surface of the continuously cast preliminary product are detected and are stored with respect to their exact position and a detection of defects and/or flaws on the finished product is carried out and stored with respect to their exact position, and in that the information from the preliminary product is then compared with the information from the surface inspection on the finished product.
    Type: Application
    Filed: April 2, 2008
    Publication date: June 3, 2010
    Applicant: SMS Siemag AG
    Inventors: Dieter Rosenthal, Stephan Schulze, Ingo Schuster, Peter Sudau, Rainer Fackert, Andreas Weinert, Wilfried Schumacher
  • Patent number: 7026620
    Abstract: The invention relates to a method for the geometrical measurement of a material strip (2), whereby the material strip (2) defines a longitudinal direction, whereby, by means of a first measuring device with at least one radiation source (6) and with at least one detector (8), the strip thickness of the material strip (2) is determined, whereby for this purpose the radiation (10) from the radiation source (6) penetrates the material strip (2) at at least one measurement point (12) arranged in the material strip (2), and the resultant weakening of the intensity of the radiation (10) is determined by the corresponding detector (8). It is proposed that, by means of a second measuring device, the transverse contour of the material strip (2) is determined. In this situation, the measurement of the strip thickness and the transverse contour is effected at the same place on the material strip. The measured values of the thickness measurement are corrected with the measured values of the transverse contour.
    Type: Grant
    Filed: March 22, 2004
    Date of Patent: April 11, 2006
    Assignee: IMS Messsysteme GmbH
    Inventor: Rainer Fackert
  • Publication number: 20040201859
    Abstract: The invention relates to a method for the geometrical measurement of a material strip (2), whereby the material strip (2) defines a longitudinal direction, whereby, by means of a first measuring device with at least one radiation source (6) and with at least one detector (8), the strip thickness of the material strip (2) is determined, whereby for this purpose the radiation (10) from the radiation source (6) penetrates the material strip (2) at at least one measurement point (12) arranged in the material strip (2), and the resultant weakening of the intensity of the radiation (10) is determined by the corresponding detector (8). It is proposed that, by means of a second measuring device, the transverse contour of the material strip (2) is determined. In this situation, the measurement of the strip thickness and the transverse contour is effected at the same place on the material strip. The measured values of the thickness measurement are corrected with the measured values of the transverse contour.
    Type: Application
    Filed: March 22, 2004
    Publication date: October 14, 2004
    Applicant: IMS Messsysteme GmbH
    Inventor: Rainer Fackert