Patents by Inventor Rainer Golenhofen

Rainer Golenhofen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7991109
    Abstract: An X-ray multichannel spectrometer comprising a polychromatic source (2), a holding means (3) for holding a sample (1), a fluorescence channel (4) that selects X-ray beams of a special wavelength and energy, and a detector (5) for measuring the selected X-ray beams, a diffractometry channel (6) that selects, by means of a monochromator (7), an X-ray beam wavelength of the source subsequent to diffraction of the X-ray beams by the sample, and a detector (8) for measuring the selected X-ray beams, is characterized in that a single slit device (9) is provided between the source and the sample, which can be moved transversely with respect to the direction of the beam from the source, and the monochromator of the diffractometry channel is stationarily disposed with respect to the source and the sample and has an entry single slit (10) which defines, together with the movable single slit device and the sample position, the characteristic diffraction angle 2? of a predetermined crystal structure of the polycrystalli
    Type: Grant
    Filed: January 27, 2010
    Date of Patent: August 2, 2011
    Assignee: Bruker AXS GmbH
    Inventor: Rainer Golenhofen
  • Publication number: 20100195795
    Abstract: An X-ray multichannel spectrometer comprising a polychromatic source (2), a holding means (3) for holding a sample (1), a fluorescence channel (4) that selects X-ray beams of a special wavelength and energy, and a detector (5) for measuring the selected X-ray beams, a diffractometry channel (6) that selects, by means of a monochromator (7), an X-ray beam wavelength of the source subsequent to diffraction of the X-ray beams by the sample, and a detector (8) for measuring the selected X-ray beams, is characterized in that a single slit device (9) is provided between the source and the sample, which can be moved transversely with respect to the direction of the beam from the source, and the monochromator of the diffractometry channel is stationarily disposed with respect to the source and the sample and has an entry single slit (10) which defines, together with the movable single slit device and the sample position, the characteristic diffraction angle 2? of a predetermined crystal structure of the polycrystalli
    Type: Application
    Filed: January 27, 2010
    Publication date: August 5, 2010
    Applicant: Bruker AXS GmbH
    Inventor: Rainer Golenhofen
  • Patent number: 6477226
    Abstract: An X-ray analysis device (1) having an X-ray source (2) for illuminating a sample (6) with X-radiation (4), a sample support for receiving the sample (6) and a detector (12,14) for detecting the diffracted or scattered X-radiation or fluorescent X-radiation (4′) emitted by the sample, wherein an X-ray optical construction element of semi-conductor material having a plurality of channels which are essentially transparent to X-radiation (4,4′) is provided in the path of rays between the X-ray source (2) and the detector (12,14), is characterized in that the X-ray optical construction element comprises a semi-conductor wafer (20;30a;30b;40;50) into which micropores (21;31;41) are etched which extend essentially in parallel in the direction of the rays and have diameters of 0.1 to 100 &mgr;m, preferably 0.5 and 20 &mgr;m.
    Type: Grant
    Filed: November 17, 1999
    Date of Patent: November 5, 2002
    Assignee: Bruker AXS Analytical X-Ray Systems GmbH
    Inventors: Volker Lehmann, Rainer Golenhofen
  • Patent number: 6233307
    Abstract: An X-ray fluorescence spectrometer (1) for the analysis of a solid or liquid sample (4) arranged in a measuring position on a sample holder (3) in a compact sample chamber (2), the sample having a maximum linear extension of 1 dm, with an X-ray tube (6) projecting into the sample chamber for irradiating the sample and with a detector (13) being arranged in a detector chamber (9), wherein the detector chamber can be separated in a vacuum-tight manner from the sample chamber by means of a closing element (8), is characterized in that the sample chamber comprises a moveable wall element (5) which, in an “open” state, permits direct access to the sample (4) in its measuring position in the sample chamber (2) and, in a “closed” state, seals the sample chamber (2) with respect to the surrounding atmosphere.
    Type: Grant
    Filed: April 26, 1999
    Date of Patent: May 15, 2001
    Assignee: Bruker AXS Analytical X-Ray Systems GmbH
    Inventor: Rainer Golenhofen
  • Patent number: 6226347
    Abstract: A spectrometer for the simultaneous measurement of several spectral lines from a sample (2) with several wavelength selectors (5a, 6a, 7; 5b, 6b, 7) which supply light of a certain wavelength selectively to a detector (9), wherein each wavelength selector selects a different wavelength, is characterized in that at least two different wavelength selectors (5a, 6a, 7; 5b, 6b, 7) can supply light from the sample (2) to the same detector (9) and that the detector (9) is energy-dispersive and has sufficiently large resolution in order to energy separate the detected light of the various wavelengths from the at least two different wavelength selectors.
    Type: Grant
    Filed: April 26, 1999
    Date of Patent: May 1, 2001
    Assignee: Bruker AXS Analytical X-ray Systems GmbH
    Inventor: Rainer Golenhofen