Abstract: A drying system contains a dryer unit for a web of goods passing through and eliminates solvents during the drying. The dryer unit has nozzles, which apply a drying gas to both paper web sides. The paper web passes through a first dryer region of the dryer unit and there drying gas is applied onto a first paper web site. A deflection roller is disposed between the first dryer region and a second dryer region. The deflection roller deflects the paper web to a second dryer region, where drying gas nozzles are directed at the second paper web side. Support gas nozzles that are directed at the second paper web side are provided at least in the first dryer region. A support gas is conducted through the nozzle at the second paper web side and has a lower pressure than the drying gas applied to the first paper web side.

Abstract: A method and a device for determining the distance from the sample to be examined to at least one reference point which function independently of the type of sample. A signal is modulated to a first potential of a sample and a primary particle beam is directed at the sample, resulting in a secondary particle beam being formed by an interaction, the particles of this beam having the modulated signal. The particles of the secondary particle beam and the signal modulated to the potential of the particles of the secondary particle beam are detected. By comparing the detected modulated signal to a reference signal, the distance is determined from the relationship between the reference signal and the detected modulated signal. The device has the corresponding components for implementing the method.

Abstract: A method and a device for determining the distance from the sample to be examined to at least one reference point which function independently of the type of sample. A signal is modulated to a first potential of a sample and a primary particle beam is directed at the sample, resulting in a secondary particle beam being formed by an interaction, the particles of this beam having the modulated signal. The particles of the secondary particle beam and the signal modulated to the potential of the particles of the secondary particle beam are detected. By comparing the detected modulated signal to a reference signal, the distance is determined from the relationship between the reference signal and the detected modulated signal. The device has the corresponding components for implementing the method.

Abstract: The present invention relates to methods and apparatuses for the purification and reuse of waste air mixed with additives (for example, solvents) or impurities, in particular for the purification and reuse of waste air mixed with solvents from dryer appliances of web-fed offset printing machines, in a first method step the waste air being led through at least one condenser in order to condense out additives or impurities contained in the waste air, in a second method step the waste air, treated according to the first method stop, being led through at least one separator element for the further purification of the waste air to remove condensed additives or impurities contained in it, and, finally, the waste air, treated according to the second method step, being recirculated for the renewed absorption or suction-removal of additives and impurities.

Abstract: A process for the purification of gases loaded in particular with chemical residues, in particular of the exhaust air from printing equipment, in which process the gas to be purified is drawn off from the regions producing the impurities and led via piping to an arrangement of adsorber-filter cartridges that serve for the separation of the impurities from the gas and are periodically separated in a cyclical manner from the exhaust flow for the carrying out of a regeneration process.

Abstract: The invention is directed to a method for controlling the emission current of an electron source and to a correspondingly controlled electron source. For this purpose, a parallel circuit comprising resistors 6 and field-effect transistors 7 is connected in the high-voltage circuit between the cathode 1 and the control electrode 2. The supply voltage for the field-effect transistors 7 is generated by voltage dividing the voltage across the resistors 6. The measurement of the emission current takes place at low-voltage potential and a control signal obtained from the measuring signal is optically transmitted via a light-conducting fiber or a light waveguide to the control circuit in the high-voltage part. The emission current control at high-voltage potential is provided without additional voltage supplies. Additional insulating transformers are therefore not required.