Patents by Inventor Rainer Simons

Rainer Simons has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12130178
    Abstract: The invention relates to an optical emission spectrometer (1) being easily adjustable, and to a method (100) to set-up and operate such a spectrometer (1) comprising a plasma stand (2) to establish a light emitting plasma from sample material, and an optical system (3) to measure the spectrum of the light (L) emitted by the plasma being characteristic to the sample material, where the optical system (3) comprises at least one light entrance aperture (31), at least one diffraction grating (32) to split up the light (L) coming from the plasma (A) and one or more detectors (33) to measure the spectrum of the light (L), wherein the plasma stand (2) and the optical system (3) are directly and fixedly mounted on respective a plasma stand flange (2B) and an optical system flange (3B) which are directly and fixedly connected to each other and wherein the optical emission spectrometer (1) further comprises an analyzing unit (34) adapted to analyze the measured spectrum and to compensate for a drift of the spectrum rel
    Type: Grant
    Filed: November 4, 2020
    Date of Patent: October 29, 2024
    Assignee: HITACHI HIGH-TECH ANALYTICAL SCIENCE GMBH
    Inventors: André Peters, Rainer Simons
  • Patent number: 12000734
    Abstract: Spectrometer device (100) with entrance aperture (2), diffraction grating (3), two detectors (5a, 5b) to spectrally measuring the incoming light (L), the detectors being located on the same side of the dispersion plane. Two vertically focusing mirrors (4, 4a, 4b) focus the light onto detectors, the minors being arranged as front row mirrors (4b) and back row minors (4a) along two polygon graphs (6a, 6b) offset to each other and to the focal curve. The angles of deflection (cp, 91) for the front row mirrors are <90°, allowing to minimize the offset (dl) of the front row minors (4b) to the focal curve. The distances (d) between the front row minors and corresponding detectors (5b) is minimized while still avoiding collisions between the detectors (5b) and their mounts with back row detectors (5a) and their mounts. The front row mirror elements are overlapping the adjacent back row mirror element.
    Type: Grant
    Filed: November 6, 2020
    Date of Patent: June 4, 2024
    Assignee: HITACHI HIGH-TECH ANALYTICAL SCIENCE GMBH
    Inventors: Heinz Jürgen Graf, Rainer Simons
  • Publication number: 20220397455
    Abstract: Spectrometer device (100) with entrance aperture (2), diffraction grating (3), two detectors (5a, 5b) to spectrally measuring the incoming light (L), the detectors being located on the same side of the dispersion plane. Two vertically focusing mirrors (4, 4a, 4b) focus the light onto detectors, the minors being arranged as front row mirrors (4b) and back row minors (4a) along two polygon graphs (6a, 6b) offset to each other and to the focal curve. The angles of deflection (cp, 91) for the front row mirrors are <90°, allowing to minimize the offset (dl) of the front row minors (4b) to the focal curve. The distances (d) between the front row minors and corresponding detectors (5b) is minimized while still avoiding collisions between the detectors (5b) and their mounts with back row detectors (5a) and their mounts. The front row mirror elements are overlapping the adjacent back row mirror element.
    Type: Application
    Filed: November 6, 2020
    Publication date: December 15, 2022
    Inventors: Heinz Jürgen Graf, Rainer Simons
  • Publication number: 20220390279
    Abstract: The invention relates to an optical emission spectrometer (1) being easily adjustable, and to a method (100) to set-up and operate such a spectrometer (1) comprising a plasma stand (2) to establish a light emitting plasma from sample material, and an optical system (3) to measure the spectrum of the light (L) emitted by the plasma being characteristic to the sample material, where the optical system (3) comprises at least one light entrance aperture (31), at least one diffraction grating (32) to split up the light (L) coming from the plasma (A) and one or more detectors (33) to measure the spectrum of the light (L), wherein the plasma stand (2) and the optical system (3) are directly and fixedly mounted on respective a plasma stand flange (2B) and an optical system flange (3B) which are directly and fixedly connected to each other and wherein the optical emission spectrometer (1) further comprises an analyzing unit (34) adapted to analyze the measured spectrum and to compensate for a drift of the spectrum rel
    Type: Application
    Filed: November 4, 2020
    Publication date: December 8, 2022
    Inventors: André PETERS, Rainer SIMONS
  • Patent number: 11162842
    Abstract: The invention relates to an optical system, to a spectrometer device comprising such optical system and to a method to operate such an optical system comprising an entrance aperture for entering primary light containing both a first, lower wavelength range and a second, higher wavelength range into said optical system, a grating for spectral dispersion of the primary light beam into a first fan of diffracted light within the first wavelength range and a primary zero order light beam, a mirror element suitably positioned to reflect the primary zero order light beam back as secondary light beam to the grating where it is dispersed into a second fan of diffracted light within the second wavelength range, a detector arrangement with detectors, an absorber element to be reversibly placed within the primary zero order light beam, and a filter element to be reversibly placed within the primary light beam.
    Type: Grant
    Filed: November 5, 2020
    Date of Patent: November 2, 2021
    Assignee: HITACHI HIGH-TECH ANALYTICAL SCIENCE GMBH
    Inventors: Marzena Beata Rak, Rainer Simons
  • Publication number: 20210131871
    Abstract: The invention relates to an optical system, to a spectrometer device comprising such optical system and to a method to operate such an optical system comprising an entrance aperture for entering primary light containing both a first, lower wavelength range and a second, higher wavelength range into said optical system, a grating for spectral dispersion of the primary light beam into a first fan of diffracted light within the first wavelength range and a primary zero order light beam, a mirror element suitably positioned to reflect the primary zero order light beam back as secondary light beam to the grating where it is dispersed into a second fan of diffracted light within the second wavelength range, a detector arrangement with detectors, an absorber element to be reversibly placed within the primary zero order light beam, and a filter element to be reversibly placed within the primary light beam.
    Type: Application
    Filed: November 5, 2020
    Publication date: May 6, 2021
    Inventors: Marzena Beata Rak, Rainer Simons
  • Patent number: 10712201
    Abstract: An optical emission spectrometer has an excitation device for a sample to be examined, a dispersive element for spectrally decomposing light emitted by an excited sample, a multiplicity of photodiodes, which are arranged such that different spectral components of the emitted, decomposed light are detectable with different photodiodes, and a multiplicity of electronic readout systems for the photodiodes. A respective electronic readout system has a charge storage assembly comprising a plurality of individual charge storage devices, wherein the charge storage devices are interconnectable in cascading fashion, with the result that charges flowing in from an associated photodiode successively fill the charge storage devices. The respective electronic readout system can be used to read the charges of the individual charge storage devices of the charge storage assembly and/or the charges of subsets of the charge storage devices of the charge storage assembly.
    Type: Grant
    Filed: November 29, 2018
    Date of Patent: July 14, 2020
    Inventors: Alexej Witzig, Martin Van Stuijvenberg, Rainer Simons
  • Publication number: 20190170580
    Abstract: An optical emission spectrometer has an excitation device for a sample to be examined, a dispersive element for spectrally decomposing light emitted by an excited sample, a multiplicity of photodiodes, which are arranged such that different spectral components of the emitted, decomposed light are detectable with different photodiodes, and a multiplicity of electronic readout systems for the photodiodes. A respective electronic readout system has a charge storage assembly comprising a plurality of individual charge storage devices, wherein the charge storage devices are interconnectable in cascading fashion, with the result that charges flowing in from an associated photodiode successively fill the charge storage devices. The respective electronic readout system can be used to read the charges of the individual charge storage devices of the charge storage assembly and/or the charges of subsets of the charge storage devices of the charge storage assembly.
    Type: Application
    Filed: November 29, 2018
    Publication date: June 6, 2019
    Inventors: Alexej WITZIG, Martin VAN STUIJVENBERG, Rainer SIMONS
  • Patent number: 10048126
    Abstract: A optical base body for a spectrometer for mounting other components of a spectrometer, wherein the optical base body is produced as a sandwich construction from at least three flat elements layered on top of each other and interconnected, in particular bonded, wherein each of the flat elements has a low coefficient of thermal expansion which is substantially isotropic, at least in one isotropic plane and wherein the flat elements are layered on top of each other and interconnected such that their isotropic planes run substantially parallel to one another.
    Type: Grant
    Filed: September 5, 2014
    Date of Patent: August 14, 2018
    Assignee: BRUKER AXS GMBH
    Inventors: Armin Schmidt, Jennifer Simons, Rainer Simons
  • Publication number: 20160202120
    Abstract: A optical base body for a spectrometer for mounting other components of a spectrometer, wherein the optical base body is produced as a sandwich construction from at least three flat elements layered on top of each other and interconnected, in particular bonded, wherein each of the flat elements has a low coefficient of thermal expansion which is substantially isotropic, at least in one isotropic plane and wherein the flat elements are layered on top of each other and interconnected such that their isotropic planes run substantially parallel to one another.
    Type: Application
    Filed: September 5, 2014
    Publication date: July 14, 2016
    Inventors: Armin Schmidt, Jennifer Simons, Rainer Simons
  • Patent number: 8891082
    Abstract: The invention relates to a spectrometer comprising a hollow main optical body having at least one light channel, a light source, a diffraction grating having a grating central point, a light inlet opening, and a detector unit, which are arranged in such a way that the focal curve of the spectrometer satisfies the back focus equation. In order to create a spectrometer having sufficient spectral resolution from a low-price, light, and easy-to-process material, which spectrometer is able to operate in a large temperature interval even without thermostatic control, according to the invention the light inlet opening is arranged on a compensation body, the compensation body is arranged in the light channel and fastened to the main optical body between the light source and the diffraction grating, and the compensation body is dimensioned in such a way that the compensation body changes the distance between the light inlet opening and the grating central point when the main optical body thermally expands.
    Type: Grant
    Filed: February 15, 2011
    Date of Patent: November 18, 2014
    Assignee: Bruker Elemental GmbH
    Inventors: Rainer Simons, Armin Schmidt
  • Publication number: 20120327416
    Abstract: The invention relates to a spectrometer comprising a hollow main optical body having at least one light channel, a light source, a diffraction grating having a grating central point, a light inlet opening, and a detector unit, which are arranged in such a way that the focal curve of the spectrometer satisfies the back focus equation. In order to create a spectrometer having sufficient spectral resolution from a low-price, light, and easy-to-process material, which spectrometer is able to operate in a large temperature interval even without thermostatic control, according to the invention the light inlet opening is arranged on a compensation body, the compensation body is arranged in the light channel and fastened to the main optical body between the light source and the diffraction grating, and the compensation body is dimensioned in such a way that the compensation body changes the distance between the light inlet opening and the grating central point when the main optical body thermally expands.
    Type: Application
    Filed: February 15, 2011
    Publication date: December 27, 2012
    Applicant: BRUKER ELEMENTAL GMBH
    Inventors: Rainer Simons, Armin Schmidt