Abstract: There is provided, a method for clock recovery in a RFID tag, the method includes receiving a RF field from a RFID reader. A field clock is generated from the received RF field, from which a clock recovery signal is generated. The RF field is modulated to produce a RF modulation. Generation of the clock recovery signal is paused while the RF field is being modulated. A modulation envelope signal is generated and used for load modulation. Generation of the clock recovery signal at the end of the RF modulation is resumed after a delay of one clock cycle from a falling edge of the modulation envelope signal. In another embodiment of the method, instead of adding the delay, a differential amplifier is used to increase RF field detection sensitivity. The method and the RFID tag ensures synchronized resumption of a PLL clock and the clock recovery signal.

Abstract: In accordance with a first aspect of the present disclosure, an integrated circuit is provided, comprising a current source and a reference capacitor, the integrated circuit being configured to: inject, using said current source, a first current in an external measurement capacitor and determine a first amount of time within which a resulting voltage on the measurement capacitor reaches a voltage threshold; inject, using said current source, a second current in the reference capacitor and determine a second amount of time within which a resulting voltage on the reference capacitor reaches said voltage threshold; detect a change of the capacitance on the measurement capacitor using a difference between the first amount of time and the second amount of time. In accordance with a second aspect of the present disclosure, a corresponding measurement method is conceived.

Abstract: It is described a leakage compensation circuit for a measurement device which comprises a measurement circuit with a leaking device that is connected to a measurement path and causes a leakage current. The leakage compensation circuit comprises: i) a replica device of the leaking device, wherein the replica device is connected to a replica path, and wherein the replica device is configured to cause a replica leakage current that is essentially equal to the leakage current of the leaking device, ii) a voltage regulator which is connected to the measurement path and to the replica path, wherein the voltage regulator is configured to regulate the voltage in the replica path based on the voltage of the measurement path, and iii) a current mirror which is connected to the measurement path and to the replica path, wherein the current mirror is configured to mirror the replica leakage current of the replica device into the measurement path.

Abstract: It is described a leakage compensation circuit for a measurement device which comprises a measurement circuit with a leaking device that is connected to a measurement path and causes a leakage current. The leakage compensation circuit comprises: i) a replica device of the leaking device, wherein the replica device is connected to a replica path, and wherein the replica device is configured to cause a replica leakage current that is essentially equal to the leakage current of the leaking device, ii) a voltage regulator which is connected to the measurement path and to the replica path, wherein the voltage regulator is configured to regulate the voltage in the replica path based on the voltage of the measurement path, and iii) a current mirror which is connected to the measurement path and to the replica path, wherein the current mirror is configured to mirror the replica leakage current of the replica device into the measurement path.

Abstract: In accordance with a first aspect of the present disclosure, an integrated circuit is provided, comprising a current source and a reference capacitor, the integrated circuit being configured to: inject, using said current source, a first current in an external measurement capacitor and determine a first amount of time within which a resulting voltage on the measurement capacitor reaches a voltage threshold; inject, using said current source, a second current in the reference capacitor and determine a second amount of time within which a resulting voltage on the reference capacitor reaches said voltage threshold; detect a change of the capacitance on the measurement capacitor using a difference between the first amount of time and the second amount of time. In accordance with a second aspect of the present disclosure, a corresponding measurement method is conceived.