Patents by Inventor Rajasekar Reddy

Rajasekar Reddy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6483938
    Abstract: A method and system for generating and managing a knowledgebase for use in identifying anomalies on a manufactured object, such as a semiconductor wafer, includes measures for adding, deleting, and organizing data from the knowledgebase.
    Type: Grant
    Filed: March 6, 2000
    Date of Patent: November 19, 2002
    Assignee: Texas Instruments Incorporated
    Inventors: A. Kathleen Hennessey, YouLing Lin, Rajasekar Reddy, C. Rinn Cleavelin, Howard V. Hastings, II, Pinar Kinikoglu, Wan S. Wong
  • Patent number: 6292582
    Abstract: A system and method allow for associating a descriptive label with an anomaly on a manufactured object, such as a semiconductor wafer. The method includes placing the manufactured device on a moveable stage; capturing and preparing a digital-pixel-based representation of the image; symbolically decomposing the digital-pixel-based representation of the image to create a primitive-based representation of the image; analyzing the primitive-based representation of the image to detect and locate the anomaly; isolating primitives associated with the anomaly; comparing the isolated primitives associated with the anomaly with primitives in a knowledge base to locate a set of primitives in the knowledge base most like the isolated primitives associated with the anomaly; and assigning a label associated with the set of primitives in the knowledge base that was most similar to the isolated primitives associated with the anomaly.
    Type: Grant
    Filed: May 30, 1997
    Date of Patent: September 18, 2001
    Inventors: YouLing Lin, A. Kathleen Hennessey, Ramachandra R. Katragadda, Ramakrishna Pattikonda, Rajasekar Reddy, C. Rinn Cleavelin, Howard V. Hastings, II, Wan S. Wong
  • Patent number: 6246787
    Abstract: A method and system for generating and managing a knowledgebase for use in identifying anomalies on a manufactured object, such as a semiconductor wafer, includes measures for adding, deleting, and organizing data from the knowledgebase.
    Type: Grant
    Filed: May 30, 1997
    Date of Patent: June 12, 2001
    Assignee: Texas Instruments Incorporated
    Inventors: A. Kathleen Hennessey, YouLing Lin, Rajasekar Reddy, C. Rinn Cleavelin, Howard V. Hastings, II, Pinar Kinokoglu, Wan S. Wong
  • Patent number: 6205239
    Abstract: A system and method for repairing a defect on a manufactured object, which may be a semiconductor wafer, uses a computer and a repair tool.
    Type: Grant
    Filed: May 30, 1997
    Date of Patent: March 20, 2001
    Assignee: Texas Instruments Incorporated
    Inventors: YouLing Lin, A. Kathleen Hennessey, Ramakrishna Pattikonda, Rajasekar Reddy, Veera S. Khaja, C. Rinn Cleavelin
  • Patent number: 6091846
    Abstract: A system and method for detecting anomalies on a manufactured device includes or utilizes a moveable stage for holding and positioning the device, a camera for capturing an image of the device on the stage, a digitizer coupled to the camera for producing a digital-pixel-based representation of the image, and a computer having a processor and memory. The computer is coupled to the digitizer for receiving the digital-pixel-based representation from the digitizer and coupled to the stage for selectively moving the stage to align the device. The computer is programmed to be operable to symbolically decompose a digital-pixel-based representation of an image to create a primitive-based representation of the image. The image may be aligned by the computer with respect to the rotation of geometric objects in the image by developing a histogram of angles and lengths and matching them to determine a rotational shift.
    Type: Grant
    Filed: May 30, 1997
    Date of Patent: July 18, 2000
    Assignee: Texas Instruments Incorporated
    Inventors: YouLing Lin, A. Kathleen Hennessey, Ramakrishna Pattikonda, Veera S. Khaja, Rajasekar Reddy
  • Patent number: 6014461
    Abstract: An apparatus and method for automatic knowledge-based object or anomaly classification is provided by capturing a pixel map of an image and from that generating high level descriptors of the object or anomaly such as size, shape, color and sharpness. These descriptors are compared with sets of descriptors in a knowledge-base to classify the object or anomaly.
    Type: Grant
    Filed: December 24, 1997
    Date of Patent: January 11, 2000
    Assignee: Texas Instruments Incorporated
    Inventors: Audrey Kathleen Hennessey, YouLing Lin, Veera V. S. Khaja, Ramakrishna Pattikonda, Rajasekar Reddy, Huitian Lu, Ramachandra Katragadda