Abstract: A circuit includes a load circuit and a voltage regulator circuit. The load circuit includes a load voltage input, a first transistor and a second transistor. The first transistor has a first threshold voltage, and the second transistor has a second threshold voltage. The voltage regulator circuit includes a load voltage output and a tracking circuit. The load voltage output is coupled to the load voltage input. The tracking circuit is configured to provide a load voltage at the load voltage output in which the load voltage tracks the first threshold voltage and the second threshold voltage.

Abstract: A float detector includes a latch and a float detection circuit. The latch includes a latch output and an input/output (I/O) terminal. The I/O terminal is coupled to an input terminal. The float detection circuit includes a detection input, a drive output, and a float detection circuit. The detection input is coupled to the latch output. The drive output is coupled to the I/O terminal. The float detector is configured to provide a drive signal at the drive output, and determine that the input terminal is floating based on a latch output signal received at the detection input responsive to the drive signal.

Abstract: One example includes an integrated circuit with a sense amplifier that includes a first inverter having a first positive power terminal, a first input and a first output; and a second inverter having a second positive power terminal, a second input connected to the first output and a second output connected to the first input. The integrated circuit also includes a reference resistor connected between a positive voltage rail and the second positive power terminal. A fuse is connected between the positive voltage rail and the first positive power terminal.

Abstract: Described embodiments include a circuit for controlling a voltage drop. The circuit includes a resistor coupled between an output voltage terminal and a reference voltage terminal. First, second and third switches each have respective first, second and third switch terminals. The respective second switch terminals are connected together and are coupled to the output voltage terminal. The respective third switch terminals are connected together and are coupled to the reference voltage terminal. A first transistor is coupled between a supply voltage terminal and the first switch. A second transistor is coupled between the supply voltage terminal and the second switch. A third transistor is coupled between the supply voltage terminal and the third switch. Control terminals of the first, second and third transistors are coupled to a gate control terminal.

Abstract: One example relates to a monitoring circuit that includes a capacitive digital-to-analog converter that receives a binary code, a reference voltage, a monitored voltage, and a ground reference, the capacitive digital-to-analog converter outputting an analog signal based on the binary code, the reference voltage, the monitored voltage, and the ground reference. The monitoring circuit further includes a comparator including a first input coupled to receive the analog signal and a second input coupled to the reference voltage, the comparator comparing the analog signal to the reference voltage and outputting a comparator signal based on the comparison. The monitoring circuit yet further includes a binary code generator that generates the binary code based on the comparator signal, the binary code approximating a magnitude of the monitored voltage.

Abstract: A circuit comprising a NMOS having a gate coupled to a first node and a source terminal coupled to a second node, a second NMOS having a gate coupled to the second node and a source terminal coupled to an output node, a PMOS having a gate coupled to a third node, a drain terminal coupled to a fourth node, and a source terminal coupled to a fifth node, and a second PMOS having a gate coupled to the fourth node, a drain terminal coupled to the output node, and a source terminal coupled to the fifth node. The circuit also includes a voltage protection sub-circuit coupled to the first node, a fast turn-off sub-circuit coupled to the output node, a fast turn-on sub-circuit coupled to the third and fourth nodes, and a node initialization sub-circuit coupled to the first, second, and fourth nodes and the fast turn-on sub-circuit.

Abstract: A trim/test interface in a packaged integrated circuit device prevents high through-current between pins of the IC device and trim/test interface digital logic within the IC device using a floating-pin-tolerant always-on CMOS input buffer. The always-on buffer uses a coupling capacitor at its input to block signals at DC and a weak-latch feedback path to ensure that intermediate or floating inputs are provided through the buffer only at one of two digital levels (e.g., those provided by a ground pin GND and by a high supply voltage pin VDD). The described interfaces and methods provide for false-entry-free test mode activation for IC devices with a low pin count, where there are a limited number of pins to cover all test/trim functions, or in which only analog, no-connect, or failsafe pins are available for trim or test mode entry control or trim or test data input.

Abstract: A circuit comprising a NMOS having a gate coupled to a first node and a source terminal coupled to a second node, a second NMOS having a gate coupled to the second node and a source terminal coupled to an output node, a PMOS having a gate coupled to a third node, a drain terminal coupled to a fourth node, and a source terminal coupled to a fifth node, and a second PMOS having a gate coupled to the fourth node, a drain terminal coupled to the output node, and a source terminal coupled to the fifth node. The circuit also includes a voltage protection sub-circuit coupled to the first node, a fast turn-off sub-circuit coupled to the output node, a fast turn-on sub-circuit coupled to the third and fourth nodes, and a node initialization sub-circuit coupled to the first, second, and fourth nodes and the fast turn-on sub-circuit.

Abstract: A trim/test interface in a packaged integrated circuit device prevents high through-current between pins of the IC device and trim/test interface digital logic within the IC device using a floating-pin-tolerant always-on CMOS input buffer. The always-on buffer uses a coupling capacitor at its input to block signals at DC and a weak-latch feedback path to ensure that intermediate or floating inputs are provided through the buffer only at one of two digital levels (e.g., those provided by a ground pin GND and by a high supply voltage pin VDD). The described interfaces and methods provide for false-entry-free test mode activation for IC devices with a low pin count, where there are a limited number of pins to cover all test/trim functions, or in which only analog, no-connect, or failsafe pins are available for trim or test mode entry control or trim or test data input.

Abstract: In an example method of trimming a voltage reference circuit, the method includes: setting the circuit to a first temperature; trimming a first resistor (RDEGEN) of a differential amplifier stage of the circuit; and trimming a first resistor (R1) of a scaling amplifier stage of the circuit. The trimming equalizes current flow through the differential amplifier stage and the scaling amplifier stage. The method includes: trimming a second resistor (R2) of the scaling amplifier stage to set an output voltage of the circuit to a target voltage at the first temperature; setting the circuit to a second temperature; and trimming a second resistor (RPTAT) of the differential amplifier stage, a third resistor (R1PTAT) of the scaling amplifier stage, and a fourth resistor (R2PTAT) of the scaling amplifier stage to set the output voltage of the circuit to the target voltage at the second temperature.

Abstract: In an example method of trimming a voltage reference circuit, the method includes: setting the circuit to a first temperature; trimming a first resistor (RDEGEN) of a differential amplifier stage of the circuit; and trimming a first resistor (R1) of a scaling amplifier stage of the circuit. The trimming equalizes current flow through the differential amplifier stage and the scaling amplifier stage. The method includes: trimming a second resistor (R2) of the scaling amplifier stage to set an output voltage of the circuit to a target voltage at the first temperature; setting the circuit to a second temperature; and trimming a second resistor (RPTAT) of the differential amplifier stage, a third resistor (R1PTAT) of the scaling amplifier stage, and a fourth resistor (R2PTAT) of the scaling amplifier stage to set the output voltage of the circuit to the target voltage at the second temperature.

Abstract: Described embodiments include a circuit for controlling a voltage drop. The circuit includes a resistor coupled between an output voltage terminal and a reference voltage terminal. First, second and third switches each have respective first, second and third switch terminals. The respective second switch terminals are connected together and are coupled to the output voltage terminal. The respective third switch terminals are connected together and are coupled to the reference voltage terminal. A first transistor is coupled between a supply voltage terminal and the first switch. A second transistor is coupled between the supply voltage terminal and the second switch. A third transistor is coupled between the supply voltage terminal and the third switch. Control terminals of the first, second and third transistors are coupled to a gate control terminal.

Abstract: In described examples, a circuit includes a current mirror circuit. A first stage is coupled to the current mirror circuit. A second stage is coupled to the current mirror circuit and to the first stage. A voltage divider network is coupled to the second stage. The circuit includes an output transistor having first and second terminals, in which the first terminal of the output transistor is coupled to the first stage, and the second terminal of the output transistor is coupled to the voltage divider network.

Abstract: In described examples, a circuit includes a current mirror circuit. A first stage is coupled to the current mirror circuit. A second stage is coupled to the current mirror circuit and to the first stage. An output transistor is coupled to the first stage and to the current mirror circuit.

Abstract: One example relates to a monitoring circuit that includes a capacitive digital-to-analog converter that receives a binary code, a reference voltage, a monitored voltage, and a ground reference, the capacitive digital-to-analog converter outputting an analog signal based on the binary code, the reference voltage, the monitored voltage, and the ground reference. The monitoring circuit further includes a comparator including a first input coupled to receive the analog signal and a second input coupled to the reference voltage, the comparator comparing the analog signal to the reference voltage and outputting a comparator signal based on the comparison. The monitoring circuit yet further includes a binary code generator that generates the binary code based on the comparator signal, the binary code approximating a magnitude of the monitored voltage.

Abstract: A trim/test interface in a packaged integrated circuit device prevents high through-current between pins of the IC device and trim/test interface digital logic within the IC device using a floating-pin-tolerant always-on CMOS input buffer. The always-on buffer uses a coupling capacitor at its input to block signals at DC and a weak-latch feedback path to ensure that intermediate or floating inputs are provided through the buffer only at one of two digital levels (e.g., those provided by a ground pin GND and by a high supply voltage pin VDD). The described interfaces and methods provide for false-entry-free test mode activation for IC devices with a low pin count, where there are a limited number of pins to cover all test/trim functions, or in which only analog, no-connect, or failsafe pins are available for trim or test mode entry control or trim or test data input.

Abstract: One example relates to a monitoring circuit that includes a capacitive digital-to-analog converter that receives a binary code, a reference voltage, a monitored voltage, and a ground reference, the capacitive digital-to-analog converter outputting an analog signal based on the binary code, the reference voltage, the monitored voltage, and the ground reference. The monitoring circuit further includes a comparator including a first input coupled to receive the analog signal and a second input coupled to the reference voltage, the comparator comparing the analog signal to the reference voltage and outputting a comparator signal based on the comparison. The monitoring circuit yet further includes a binary code generator that generates the binary code based on the comparator signal, the binary code approximating a magnitude of the monitored voltage.

Abstract: Provided are methods, compositions, and kits that are useful for long-term stabilization of biospecimens at ambient and elevated temperatures that are resilient to degradation by environmental factors and contaminants In some embodiments, the presently disclosed subject matter can be employed for long-term storage of biospecimens that would typically require low and/or ultra-low storage conditions, but as a consequence of employing the presently disclosed compositions and/or methods, the need for cryo-and/or sub-zero refrigeration is not needed in order to get similar if not superior stability of the biospecimen.

Abstract: An electronic circuit includes a first transistor, a second transistor, and a variable resistor. The first transistor has a first threshold voltage. The second transistor has a second threshold voltage that is different from the first threshold voltage. The second transistor is coupled to the first transistor. The variable resistor is coupled to the first transistor and the second transistor. The variable resistor is configured to adjust a temperature coefficient of the electronic circuit. The electronic circuit is configured to generate a reference voltage based on a difference of the first threshold voltage and the second threshold voltage.

Abstract: Aspects of the disclosure provide for a circuit. In some examples, the circuit includes a Zener diode, a first current source, a first n-type field effect transistor (FET), a first inverter circuit, and a second current source. The Zener diode has a cathode coupled to a first node and an anode coupled to a second node. The first current source has a first terminal coupled to the second node and a second terminal coupled to a ground terminal. The first n-type FET has a gate terminal coupled to the second node, a source terminal coupled to the ground terminal, and a drain terminal coupled to a third node. The first inverter circuit has an input coupled to the third node and an output coupled to a fourth node. The second current source has a first terminal coupled to a fifth node and a second terminal coupled to the third node.