Abstract: A web page or group of pages can be automatically generated based on images selected by a user. The images are analyzed for color and groups of colors for the page background and image framing are determined. Images are analyzed to determine the shapes of the images and the images are placed within appropriate shapes on a page on the web. Click-through rate can be estimated for images and this click-through rate used during the web page generation. Important sections are evaluated in the images and cropping may occur for the images on a page. Text and video can be part of the web page. Software applications can be accessed from the web page as well. The online web pages can be tailored for presentation on a mobile device.

Abstract: A web page or group of pages can be automatically generated based on images selected by a user. The images are analyzed for color and groups of colors for the page background and image framing are determined. Images are analyzed to determine the shapes of the images and the images are placed within appropriate shapes on a page on the web. Click-through rate can be estimated for images and this click-through rate used during the web page generation. Important sections are evaluated in the images and cropping may occur for the images on a page. Text and video can be part of the web page. Software applications can be accessed from the web page as well. The online web pages can be tailored for presentation on a mobile device.

Abstract: An integrated circuit random access memory includes a built in self-test ("BIST") system that has separate address counters and scan registers positioned adjacent each of a plurality of memory blocks. A controller is included as part of the test system for generating test patterns, providing an output that indicates whether the memory blocks have passed the test, and for performing other test control functions. The scan registers can also be alternatively used for testing the memory with external test vectors. The test system is designed into an integrated circuit by providing various database files of test system blocks from which a combination may be made to meet the requirements of various types of memory modules and provide a desired BIST algorithm. In designing such a circuit, the designer specifies certain information, such as the memory type to be used, the BIST algorithm to be implemented, and similar high level information.