Patents by Inventor Rajeev Sehgal

Rajeev Sehgal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11915835
    Abstract: Systems and methods are provided for selecting colony locations. Selecting colony locations can include determine a location of a selection tool on a culture plate image, determining a location of a potential source of error on the culture plate image, comparing the location of the selection tool to the location of the potential source of error; and determining an error when the location of the selection tool overlays the location of the potential source of error.
    Type: Grant
    Filed: April 29, 2022
    Date of Patent: February 27, 2024
    Assignee: BECTON, DICKINSON AND COMPANY
    Inventors: Strett Roger Nicolson, Rajeev Sehgal
  • Publication number: 20220254519
    Abstract: Systems and methods are provided for selecting colony locations. Selecting colony locations can include determine a location of a selection tool on a culture plate image, determining a location of a potential source of error on the culture plate image, comparing the location of the selection tool to the location of the potential source of error; and determining an error when the location of the selection tool overlays the location of the potential source of error.
    Type: Application
    Filed: April 29, 2022
    Publication date: August 11, 2022
    Inventors: Strett Roger Nicolson, Rajeev Sehgal
  • Patent number: 11322262
    Abstract: Systems and methods are provided for selecting colony locations. Selecting colony locations can include determine a location of a selection tool on a culture plate image, determining a location of a potential source of error on the culture plate image, comparing the location of the selection tool to the location of the potential source of error; and determining an error when the location of the selection tool overlays the location of the potential source of error.
    Type: Grant
    Filed: November 9, 2017
    Date of Patent: May 3, 2022
    Assignee: BECTON, DICKINSON AND COMPANY
    Inventors: Strett Roger Nicolson, Rajeev Sehgal
  • Publication number: 20200185113
    Abstract: Systems and methods are provided for selecting colony locations. Selecting colony locations can include determine a location of a selection tool on a culture plate image, determining a location of a potential source of error on the culture plate image, comparing the location of the selection tool to the location of the potential source of error; and determining an error when the location of the selection tool overlays the location of the potential source of error.
    Type: Application
    Filed: November 9, 2017
    Publication date: June 11, 2020
    Inventors: Strett Roger Nicolson, Rajeev Sehgal
  • Patent number: 9703916
    Abstract: This application discloses a computing system implementing tools and mechanisms that can incorporate a validation system into a circuit design. The validation system can be configured to monitor at least a portion of an electronic device described in the circuit design. The tools and mechanisms can identify one or more trace signals associated with the electronic device to route to the validation system, and identify one or more trigger signals associated with the electronic device to route to the validation system. The tools and mechanisms can configure the validation system to detect a conditional event corresponding a state of the one or more trigger signals, and to transmit the trace signals associated with the electronic device for debugging in response to the detected conditional event.
    Type: Grant
    Filed: August 29, 2014
    Date of Patent: July 11, 2017
    Assignee: Mentor Graphics Corporation
    Inventors: Rajeev Sehgal, Srinivas Mandavilli, Pradish Mathews, Ajit Singh, Henry Potts
  • Patent number: 9673819
    Abstract: This application discloses a system to detect meta-stable glitches in a signal, such as an output of latch or other storage element. The system can include a sampling circuit configured to sample an output of a storage element. The system can include a mono-shot circuit configured to monitor the output of the storage element and generate a pulse when the monitored output of the storage element differs from the sampled output. The system can include a drive circuit configured to generate a glitch signal based, at least in part, on the sampled output, and to output the glitch signal in response to the pulse from the mono-shot circuit. The system can include an error detection circuit configured to receive the sampled output from the sampling circuit and the glitch signal from the drive circuit, and to generate an error signal when the sampled output differs from the glitch signal.
    Type: Grant
    Filed: August 29, 2014
    Date of Patent: June 6, 2017
    Assignee: Mentor Graphics Corporation
    Inventors: Rajeev Sehgal, Srinivas Mandavilli, Pradish Mathews, Ajit Singh, Henry Potts
  • Publication number: 20170141764
    Abstract: This application discloses a system to detect meta-stable glitches in a signal, such as an output of latch or other storage element. The system can include a sampling circuit configured to sample an output of a storage element. The system can include a mono-shot circuit configured to monitor the output of the storage element and generate a pulse when the monitored output of the storage element differs from the sampled output. The system can include a drive circuit configured to generate a glitch signal based, at least in part, on the sampled output, and to output the glitch signal in response to the pulse from the mono-shot circuit. The system can include an error detection circuit configured to receive the sampled output from the sampling circuit and the glitch signal from the drive circuit, and to generate an error signal when the sampled output differs from the glitch signal.
    Type: Application
    Filed: August 29, 2014
    Publication date: May 18, 2017
    Inventors: Rajeev Sehgal, Srinivas Mandavilli, Pradish Mathews, Ajit Singh, Henry Potts
  • Publication number: 20150220677
    Abstract: This application discloses a computing system implementing tools and mechanisms that can incorporate a validation system into a circuit design. The validation system can be configured to monitor at least a portion of an electronic device described in the circuit design. The tools and mechanisms can identify one or more trace signals associated with the electronic device to route to the validation system, and identify one or more trigger signals associated with the electronic device to route to the validation system. The tools and mechanisms can configure the validation system to detect a conditional event corresponding a state of the one or more trigger signals, and to transmit the trace signals associated with the electronic device for debugging in response to the detected conditional event.
    Type: Application
    Filed: August 29, 2014
    Publication date: August 6, 2015
    Inventors: Rajeev Sehgal, Srinivas Mandavilli, Pradish Mathews, Ajit Singh, Henry Potts
  • Publication number: 20150214933
    Abstract: This application discloses a system to detect meta-stable glitches in a signal, such as an output of latch or other storage element. The system can include a sampling circuit configured to sample an output of a storage element. The system can include a mono-shot circuit configured to monitor the output of the storage element and generate a pulse when the monitored output of the storage element differs from the sampled output. The system can include a drive circuit configured to generate a glitch signal based, at least in part, on the sampled output, and to output the glitch signal in response to the pulse from the mono-shot circuit. The system can include an error detection circuit configured to receive the sampled output from the sampling circuit and the glitch signal from the drive circuit, and to generate an error signal when the sampled output differs from the glitch signal.
    Type: Application
    Filed: August 29, 2014
    Publication date: July 30, 2015
    Inventors: Rajeev Sehgal, Srinivas Mandavilli, Pradish Mathews, Ajit Singh, Henry Potts
  • Patent number: 8504953
    Abstract: The invention concerns the generation of schematics from analog netlists. Various implementations of the invention provide that an analog netlist defining a number of hardware components and the connectivity between the hardware components is identified. Subsequently, the netlist is sorted and partitioned into component groups. The component groups are arranged and lines are routed between the component groups. The corresponding hardware components are arranged within the component groups and a schematic corresponding to the arranged hardware components is generated.
    Type: Grant
    Filed: October 6, 2009
    Date of Patent: August 6, 2013
    Assignee: Mentor Graphics Corporation
    Inventors: Bikram Garg, Rajeev Sehgal, Amarpal Singh
  • Publication number: 20100095262
    Abstract: The invention concerns the generation of schematics from analog netlists. Various implementations of the invention provide that an analog netlist defining a number of hardware components and the connectivity between the hardware components is identified. Subsequently, the netlist is sorted and partitioned into component groups. The component groups are arranged and lines are routed between the component groups. The corresponding hardware components are arranged within the component groups and a schematic corresponding to the arranged hardware components is generated.
    Type: Application
    Filed: October 6, 2009
    Publication date: April 15, 2010
    Inventors: Bikram Garg, Rajeev Sehgal, Amarpal Singh
  • Patent number: 7313087
    Abstract: A system for responding to failures of connections in a network. In one embodiment, there is a system for responding to destination failures involving SPVx (switched-permanent virtual circuit) connections includes a primary source node. The system includes a primary source switch for producing an SPVx connection, the primary source node in communication with the primary source switch. The system includes a primary destination node. The system includes a primary destination switch for receiving the SPVx connection, the primary destination node in communication with the primary destination switch, the connection following a primary path between the primary source node and the primary destination node. The system includes an alternate destination node. The primary destination switch redirects automatically the primary connection to the alternate destination node along an alternate path when the primary destination switch detects a failure of the primary path.
    Type: Grant
    Filed: June 20, 2003
    Date of Patent: December 25, 2007
    Assignee: Ericsson AB
    Inventors: Lingaraj S. Patil, Barton J. Milburn, Harmeet Singh Sahni, Rajeev Sehgal, Harry Ostaffe
  • Publication number: 20050002339
    Abstract: A system for responding to failures of connections in a network. A system for responding to destination failures involving SPVx connections. A system for responding to source failures involving SPVx connections A system for responding to failures involving SPVx connections. A method for responding to failures involving SPVx connections. A method for responding to destination failures involving SPVx connections. A method for responding to source failures involving SPVx connections. A method for responding to failures of connections in a network.
    Type: Application
    Filed: June 20, 2003
    Publication date: January 6, 2005
    Inventors: Lingaraj Patil, Barton Milburn, Harmeet Sahni, Rajeev Sehgal, Harry Ostaffe