Abstract: Systems and methods to optimize a layout based on the yield analysis is disclosed. The method includes generating an integrated circuit layout having two or more layers of wire interconnect to form net segments and having one or more via contact layers to couple net segments in the wire interconnect together. The method further includes performing a yield analysis of the net segments in the integrated circuit layout and displaying the net segments with a visual depiction of the yield analysis using multiple levels of opacity to reflect yield scores of the net segments in the integrated circuit layout.

Abstract: According to various embodiments of the invention electronic circuit design information can be presented to a designer by determining an electronic circuit comprising at least two gates and by determining a distance of one gate relative to another gate in a stage. A visual indicator for the stage can be calculated based on the distances between at least two gates in the stage. The visual indicator can then be displayed. The visual indicator can be a color and the relative distance can be indicated by brightness, hue or saturation, etc. Alternatively, the visual indicator can be a pattern and the relative distance between at least two gates can be indicated by darkness of the pattern.

Abstract: Disclosed are methods, systems and apparatus for automatically placing decoupling capacitors in an integrated circuit to compensate for voltage drops that might otherwise occur in a power grid. In one embodiment of the invention, the method includes generating one or more regions of the integrated circuit design, with each region having one or more cells, determining an amount of decoupling capacitance required in each region of the integrated circuit design by analyzing each cell in the region, and adding sufficient decoupling capacitor cells to the region to compensate for the potential voltage drop.