Patents by Inventor Rajen Sud
Rajen Sud has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20190383953Abstract: Methods for discriminating among x-ray beams of distinct energy content. A first volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides that convert the scintillation light to light of a longer wavelength. An x-ray beam initially incident upon the first volume of scintillation medium and traversing the first volume is then incident on a second volume of scintillation medium. The first and second scintillation media may be separated by an absorber or one or more further volumes of scintillation medium, and may also have differential spectral sensitivities. Scintillation light from the first and second scintillation volumes is detected in respective detectors and processed to yield a measure of respective low energy and high-energy components of the incident x-ray beam.Type: ApplicationFiled: January 8, 2019Publication date: December 19, 2019Inventors: Anatoli Arodzero, Joseph Callerame, Dan-Cristian Dinca, Rajen Sud, Lee Grodzins, Martin Rommel, Peter Rothschild, Jeffrey Schubert, Aaron Couture, Jeffrey M. Denker, Jonathan Edward Everett
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Patent number: 10209372Abstract: Methods for discriminating among x-ray beams of distinct energy content. A first volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides that convert the scintillation light to light of a longer wavelength. An x-ray beam initially incident upon the first volume of scintillation medium and traversing the first volume is then incident on a second volume of scintillation medium. The first and second scintillation media may be separated by an absorber or one or more further volumes of scintillation medium, and may also have differential spectral sensitivities. Scintillation light from the first and second scintillation volumes is detected in respective detectors and processed to yield a measure of respective low energy and high-energy components of the incident x-ray beam.Type: GrantFiled: April 18, 2017Date of Patent: February 19, 2019Assignee: American Science and Engineering, Inc.Inventors: Anatoli Arodzero, Joseph Callerame, Dan-Cristian Dinca, Rajen Sud, Lee Grodzins, Martin Rommel, Peter Rothschild, Jeffrey Schubert, Aaron Couture, Jeffrey M. Denker, Jonathan Edward Everett
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Publication number: 20170315242Abstract: Methods for discriminating among x-ray beams of distinct energy content. A first volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides that convert the scintillation light to light of a longer wavelength. An x-ray beam initially incident upon the first volume of scintillation medium and traversing the first volume is then incident on a second volume of scintillation medium. The first and second scintillation media may be separated by an absorber or one or more further volumes of scintillation medium, and may also have differential spectral sensitivities. Scintillation light from the first and second scintillation volumes is detected in respective detectors and processed to yield a measure of respective low energy and high-energy components of the incident x-ray beam.Type: ApplicationFiled: April 18, 2017Publication date: November 2, 2017Inventors: Anatoli Arodzero, Joseph Callerame, Dan-Christian Dinca, Rajen Sud, Lee Grodzins, Martin Rommel, Peter Rothschild, Jeffrey Schubert
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Patent number: 9658343Abstract: Methods for discriminating among x-ray beams of distinct energy content. A first volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides that convert the scintillation light to light of a longer wavelength. An x-ray beam initially incident upon the first volume of scintillation medium and traversing the first volume is then incident on a second volume of scintillation medium. The first and second scintillation media may be separated by an absorber or one or more further volumes of scintillation medium, and may also have differential spectral sensitivities. Scintillation light from the first and second scintillation volumes is detected in respective detectors and processed to yield a measure of respective low energy and high-energy components of the incident x-ray beam.Type: GrantFiled: February 23, 2016Date of Patent: May 23, 2017Assignee: American Science and Engineering, Inc.Inventors: Anatoli Arodzero, Joseph Callerame, Dan-Christian Dinca, Rajen Sud, Lee Grodzins, Martin Rommel, Peter Rothschild, Jeffrey Schubert
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Publication number: 20160170044Abstract: Methods for discriminating among x-ray beams of distinct energy content. A first volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides that convert the scintillation light to light of a longer wavelength. An x-ray beam initially incident upon the first volume of scintillation medium and traversing the first volume is then incident on a second volume of scintillation medium. The first and second scintillation media may be separated by an absorber or one or more further volumes of scintillation medium, and may also have differential spectral sensitivities. Scintillation light from the first and second scintillation volumes is detected in respective detectors and processed to yield a measure of respective low energy and high-energy components of the incident x-ray beam.Type: ApplicationFiled: February 23, 2016Publication date: June 16, 2016Inventors: Anatoli Arodzero, Joseph Callerame, Dan-Christian Dinca, Rajen Sud, Lee Grodzins, Martin Rommel, Peter Rothschild, Jeffrey Schubert
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Patent number: 9285488Abstract: A detector and methods for inspecting material on the basis of scintillator coupled by wavelength-shifting optical fiber to one or more photo-detectors, with a temporal integration of the photo-detector signal. An unpixelated volume of scintillation medium converts energy of incident penetrating radiation into scintillation light which is extracted from a scintillation light extraction region by a plurality of optical waveguides. This geometry provides for efficient and compact detectors, enabling hitherto unattainable geometries for backscatter detection and for energy discrimination of incident radiation. Additional energy-resolving transmission configurations are enabled as are skew- and misalignment compensation.Type: GrantFiled: February 4, 2013Date of Patent: March 15, 2016Assignee: American Science and Engineering, Inc.Inventors: Anatoli Arodzero, Joseph Callerame, Dan-Cristian Dinca, Rajen Sud, Lee Grodzins, Martin Rommel, Peter Rothschild, Jeffrey Schubert
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Patent number: 8457274Abstract: Methods and systems for x-ray inspection of an object using pulses whose spectral composition varies during the course of each pulse. A temporal sequence of pulses of penetrating radiation is generated such that the spectral content of each pulse evolves with time. The pulses are formed into a beam that is scanned across the object and detected after traversing the object. The detector signal is processed to derive at least one material characteristic of the object, such as effective atomic number, on the basis of temporal evolution of the detector signal during the course each pulse of the sequence of pulses. The time intervals may be predetermined, or else adapted based on features of the detected signal.Type: GrantFiled: October 17, 2011Date of Patent: June 4, 2013Assignee: American Science and Engineering, Inc.Inventors: Anatoli Arodzero, Martin Rommel, Aleksandr Saverskiy, Rajen Sud
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Publication number: 20120093289Abstract: Methods and systems for x-ray inspection of an object using pulses whose spectral composition varies during the course of each pulse. A temporal sequence of pulses of penetrating radiation is generated, each pulse characterized by an onset and by a spectral content that evolves with time subsequent to the onset. The pulses are formed into a beam that is scanned across the object. The penetrating radiation from the beam that has traversed the object is detected, generating a detector signal. The detector signal is processed to derive at least one material characteristic of the object, such as effective atomic number, on the basis of temporal evolution of the detector signal during the course each pulse of the sequence of pulses. The detector signal is separately acquired for multiple time intervals relative to the pulse onset, and processed to obtain values corresponding to multiple-energy analysis of the transmitted radiation.Type: ApplicationFiled: October 17, 2011Publication date: April 19, 2012Applicant: AMERICAN SCIENCE AND ENGINEERING, INC.Inventors: Anatoli Arodzero, Martin Rommel, Aleksandr Saverskiy, Rajen Sud
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Patent number: 7005656Abstract: An ion implanter has an elongated evacuated chamber having a distal end along the path of travel of an ion beam. A planar multilayer printed circuit board (PCB) is located at the distal end of the chamber. The PCB has a first portion sealingly covering the distal end of the chamber and a second portion that extends outside the evacuated chamber, for example in the upward direction. An array of Faraday cups are arranged on a proximal surface of the first portion of the PCB within the chamber, and one or more multi-contact connectors (such as D-type connectors) are located on the second portion of the PCB outside the chamber. The individual contacts of the connector(s) are connected to respective Faraday cups by circuit traces of the PCB.Type: GrantFiled: February 1, 2005Date of Patent: February 28, 2006Assignee: Varian Semiconductor Equipment Associates, Inc.Inventors: Rajen Sud, Michael Fiorito, Thomas Schaefer
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Publication number: 20050133728Abstract: A systematic in-situ analysis is provided for ensuring that a uniform and accurate ion implantation dose for workpieces is being realized. Prior to implantation the system determines whether the calibration of a dose controller is within predetermined tolerance values. If the dose controller is outside of these values, the implantation process is halted so that the calibration can be remedied without further damaging any workpieces by mis-dosing.Type: ApplicationFiled: December 22, 2003Publication date: June 23, 2005Applicant: Varian Semiconductor Equipment Associates, Inc.Inventors: Tamer Onat, Rajen Sud, Gregory Gibilaro, Joseph Dzengeleski