Patents by Inventor Rajendra Patrikar

Rajendra Patrikar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for testing a semiconductor chip
    Publication number: 20040253754
    Abstract: A method for testing a semiconductor chip is provided. The method begins by selecting a sampling circuit having an ideal supply current. A test circuit is provided by fabricating the sampling circuit onto the semiconductor chip. After fabrication has been completed, a test supply current is measured from the test circuit. The test supply current is then compared with the ideal supply current to determine whether there is a defect in the chip as well as to identify any such defect.
    Type: Application
    Filed: June 16, 2003
    Publication date: December 16, 2004
    Applicant: AGENCY FOR SCIENCE TECHNOLOGY AND RESEARCH
    Inventors: Wenjun Zhuang, Rajendra Patrikar