Abstract: A static random access memory (SRAM) unit is provided having a read control module, a write control module, and a bypass. The read control module is configured to communicate a read signal defined to read from a first address in the SRAM unit. The write control module is configured to communicate a write signal defined to write to a second address in the SRAM unit. The bypass is disposed to connect the write control module to the read control module. The bypass is further configured to prevent a simultaneous communication of the read signal and the write signal when the first address and the second address are equivalent.

Abstract: A static random access memory (SRAM) unit is provided having a read control module, a write control module, and a bypass. The read control module is configured to communicate a read signal defined to read from a first address in the SRAM unit. The write control module is configured to communicate a write signal defined to write to a second address in the SRAM unit. The bypass is disposed to connect the write control module to the read control module. The bypass is further configured to prevent a simultaneous communication of the read signal and the write signal when the first address and the second address are equivalent.

Abstract: The present invention provides a system and method for performing a memory test algorithm with a static random access memory (SRAM) unit having a read control module with no read enable control and write control module with write enable control. The system and method conduct read and write operations to the SRAM unit by avoiding simultaneously reading and writing to the same memory address. Simultaneously reading and writing to the same memory address is avoided by offsetting the read and write signals provided to the SRAM unit.

Abstract: The present invention provides a system and method for reading a SRAM unit having a first SRAM way and a second SRAM way with a read control system, a way select macro and a word select macro. The word select control macro is configured to select one of the plurality of words. The way select control macro is configured to select either the first SRAM way or the second SRAM way. The system and method employ a read logic controller having a word select function and a way select function. The read logic controller is operatively coupled to a read counter, a word counter, and an address counter.

Abstract: A multi-core chip (MCC) having a plurality of processor cores includes a hierarchical testing architecture compliant with the IEEE 1149.1 Joint Test Action Group (JTAG) standard that leverages existing standard testing architectures within each processor core to allow for chip level access to schedule built-in self test (BIST) operations for the cores. The MCC includes boundary scan logic, a chip-level JTAG-compliant test access port (TAP) controller, a chip-level master BIST controller, and a test pin interface. Each processor core includes a JTAG-compliant TAP controller and one or more BIST enabled memory arrays. The chip TAP controller includes one or more user defined registers, including a core select register and a test mode register. The core select register stores a plurality of core select bits that select corresponding processor cores for BIST operations.