Patents by Inventor Rajiv Dama

Rajiv Dama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200219307
    Abstract: A method of co-registration of a plurality sensors configured for sensing impact to a body part of a user may include establishing a location and an orientation of the plurality of sensors relative to one another and establishing a location and an orientation of the plurality of sensors relative to an anatomical feature of the body part. Establishing a location and an orientation of the plurality of sensors relative to one another may be performed using a 2D image or analytically by analyzing sensor results.
    Type: Application
    Filed: January 8, 2020
    Publication date: July 9, 2020
    Inventors: Adam Bartsch, Rajiv Dama
  • Patent number: 9902027
    Abstract: An instrument changing assembly includes a magazine having one or more probe assembly stations. The assembly further includes at least one probe change tool including a receptacle socket. One or more probe assemblies are retained within the one or more probe assembly stations. The one or more probe assemblies each include a probe receptacle including a probe retention recess and a common socket fitting configured for complementary fitting with a common receptacle socket. The probe change tool is configured to install or extract the respective probes from a mechanical testing instrument according to the complementary fit between the common socket fitting and the common receptacle socket of the probe assemblies. Alternatively, the instrument changing assembly includes an instrument array housing including a plurality of instruments. Each of the one or more instruments (probe and transducer combination) are deployed relative to the instrument array housing with an instrument deployment actuator.
    Type: Grant
    Filed: August 1, 2014
    Date of Patent: February 27, 2018
    Assignee: Hysitron, Inc.
    Inventors: Rajiv Dama, Svetlana Zigelman
  • Publication number: 20160169718
    Abstract: An instrument changing assembly includes a magazine having one or more probe assembly stations. The assembly further includes at least one probe change tool including a receptacle socket. One or more probe assemblies are retained within the one or more probe assembly stations. The one or more probe assemblies each include a probe receptacle including a probe retention recess and a common socket fitting configured for complementary fitting with a common receptacle socket. The probe change tool is configured to install or extract the respective probes from a mechanical testing instrument according to the complementary fit between the common socket fitting and the common receptacle socket of the probe assemblies. Alternatively, the instrument changing assembly includes an instrument array housing including a plurality of instruments. Each of the one or more instruments (probe and transducer combination) are deployed relative to the instrument array housing with an instrument deployment actuator.
    Type: Application
    Filed: August 1, 2014
    Publication date: June 16, 2016
    Inventors: Rajiv Dama, Svetlana Zigelman
  • Publication number: 20150075264
    Abstract: An objective testing module includes a module base configured for coupling with an objective turret of a microscope. The objective testing module includes a mechanical testing assembly. The mechanical testing assembly is configured to mechanically test a sample at macro scale or less, and quantitatively determine one or more properties of the sample based on the mechanical testing. The mechanical testing assembly optionally includes a probe and one or more transducers coupled with the probe. The transducer measures one or more of force applied to a sample by the probe or displacement of the probe within the sample. In operation, an optical instrument locates a test location on a sample and the objective testing module mechanically tests at the test location with the mechanical testing assembly at a macro scale or less. The mechanical testing assembly further determines one or more properties of the sample according to the mechanical test.
    Type: Application
    Filed: March 13, 2013
    Publication date: March 19, 2015
    Inventors: Syed Amanulla Syed Asif, Rajiv Dama, Ryan Major