Patents by Inventor Rajiv Giridharagopal

Rajiv Giridharagopal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Visible laser probing for circuit debug and defect analysis
    Patent number: 9651610
    Abstract: Visible laser probing is described. In one example a probe device has a laser configured to provide a laser beam at a visible wavelength, an objective lens positioned in front of the laser to focus the laser beam on an active region of an integrated circuit through a back side of an integrated circuit die, and a detector positioned to receive a reflected laser beam reflected from the active region through a back side of the die, through the objective lens. The detector is configured to detect an amplitude modulation of the reflected laser beam wherein the amplitude modulation is attributable to the electric field at the active region.
    Type: Grant
    Filed: June 29, 2013
    Date of Patent: May 16, 2017
    Assignee: Intel Corporation
    Inventors: Travis M. Eiles, Rajiv Giridharagopal, David Shykind
  • VISIBLE LASER PROBING FOR CIRCUIT DEBUG AND DEFECT ANALYSIS
    Publication number: 20150002182
    Abstract: Visible laser probing is described. In one example a probe device has a laser configured to provide a laser beam at a visible wavelength, an objective lens positioned in front of the laser to focus the laser beam on an active region of an integrated circuit through a back side of an integrated circuit die, and a detector positioned to receive a reflected laser beam reflected from the active region through a back side of the die, through the objective lens. The detector is configured to detect an amplitude modulation of the reflected laser beam wherein the amplitude modulation is attributable to the electric field at the active region.
    Type: Application
    Filed: June 29, 2013
    Publication date: January 1, 2015
    Inventors: Travis M. Eiles, Rajiv Giridharagopal, David Shykind
  • Sub-microsecond-resolution probe microscopy
    Patent number: 8686358
    Abstract: Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.
    Type: Grant
    Filed: September 14, 2011
    Date of Patent: April 1, 2014
    Assignee: University of Washington through its Center for Commercialization
    Inventors: David Ginger, Rajiv Giridharagopal, David Moore, Glennis Rayermann, Obadiah Reid
  • SUB-MICROSECOND-RESOLUTION PROBE MICROSCOPY
    Publication number: 20120079630
    Abstract: Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.
    Type: Application
    Filed: September 14, 2011
    Publication date: March 29, 2012
    Applicant: University of Washington through its Center for Commercialization
    Inventors: David Ginger, Rajiv Giridharagopal, David Moore, Glennis Rayermann, Obadiah Reid