Patents by Inventor Raju Muktaji WALUNJ

Raju Muktaji WALUNJ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10251850
    Abstract: The present invention provides process for preparation of cysteamine bitartrate comprising reacting cysteamine or its salt with tartaric acid. The present invention further provides crystalline form L1 of cysteamine bitartrate having characteristic diffraction peaks at 10.36, 14.54, 17.23, 18.03, 19.24, 20.76, 21.20, 22.02, 23.37, 23.64, 27.71, 28.28, 29.26, 31.33, 32.84, 33.83, 35.51, 36.74±0.2 degree two theta in an X-ray diffraction pattern and process for preparation thereof. The present invention provides crystalline form L2 of cysteamine bitartrate having characteristic diffraction peaks at 7.4, 10.3, 11.0, 11.4, 14.4, 14.9, 18.6, 19.4, 20.1, 20.8, 21.9, 22.3, 22.5, 23.5±0.2 degree two theta in an X-ray diffraction pattern and process for preparation thereof.
    Type: Grant
    Filed: January 11, 2018
    Date of Patent: April 9, 2019
    Assignee: LUPIN LIMITED
    Inventors: Pankaj Ramchandra Chaudhari, Sukhdeo Sampat Gunjal, Raju Muktaji Walunj, Anurag Trivedi, Rajinder Singh Siyan, Nandu Baban Bhise, Girij Pal Singh
  • Publication number: 20180193292
    Abstract: The present invention provides process for preparation of cysteamine bitartrate comprising reacting cysteamine or its salt with tartaric acid. The present invention further provides crystalline form L1 of cysteamine bitartrate having characteristic diffraction peaks at 10.36, 14.54, 17.23, 18.03, 19.24, 20.76, 21.20, 22.02, 23.37, 23.64, 27.71, 28.28, 29.26, 31.33, 32.84, 33.83, 35.51, 36.74±0.2 degree two theta in an X-ray diffraction pattern and process for preparation thereof. The present invention provides crystalline form L2 of cysteamine bitartrate having characteristic diffraction peaks at 7.4, 10.3, 11.0, 11.4, 14.4, 14.9, 18.6, 19.4, 20.1, 20.8, 21.9, 22.3, 22.5, 23.5±0.2 degree two theta in an X-ray diffraction pattern and process for preparation thereof.
    Type: Application
    Filed: January 11, 2018
    Publication date: July 12, 2018
    Inventors: Pankaj Ramchandra CHAUDHARI, Sukhdeo Sampat GUNJAL, Raju Muktaji WALUNJ, Anurag TRIVEDI, Rajinder Singh SIYAN, Nandu Baban BHISE, Girij Pal SINGH