Abstract: Various embodiments provide a content addressable memory (CAM) architecture that utilizes non-bit addressable memory, such as a single or dual port random access memory. The CAM includes a first non-bit addressable memory, a second non-bit addressable memory, a multiplexer, a write operation encoder, a read operation encoder, and a match signal generator. In contrast to bit addressable memories, non-bit addressable memories are widely available, have high performance frequency, and are area efficient as compared to bit addressable memories. Accordingly, the CAM architecture described herein has low costs and time to market, increased processing time, and improved area efficiency.

Abstract: CRC generation circuitry includes a lookup-table storing N-bit CRC values for M one-hot data frames. N AND gates for each bit of a M-bit data frame receive that bit of the M-bit data frame and a different bit of a N-bit CRC value from the lookup-table corresponding to a position of the bit in the M-bit data frame. N exclusive-OR gates each receive output from one of the N AND gates for each bit of the M-bit data frame. The N exclusive-OR gates generate a final N-bit CRC value for the M-bit data frame. The CRC value is therefore generated with a purely combinational circuit, without clock cycle latency. Area consumption is small due to the small lookup-table, which itself permits use of any generator polynomial, and is independent of the width of the received data frame. This device can also generate a combined CRC for multiple frames.

Abstract: Various embodiments provide a content addressable memory (CAM) architecture that utilizes non-bit addressable memory, such as a single or dual port random access memory. The CAM includes a first non-bit addressable memory, a second non-bit addressable memory, a multiplexer, a write operation encoder, a read operation encoder, and a match signal generator. In contrast to bit addressable memories, non-bit addressable memories are widely available, have high performance frequency, and are area efficient as compared to bit addressable memories. Accordingly, the CAM architecture described herein has low costs and time to market, increased processing time, and improved area efficiency.

Abstract: Disclosed herein is a test circuit for testing a device under test (DUT). The test circuit receives a test pattern output by the DUT. A content addressable memory (CAM) stores expected test data at a plurality of address locations, receives the test pattern, and outputs an address of the CAM containing expected test data matching the received test pattern. A memory also stores the expected test data at address locations corresponding to the address locations of the CAM. A control circuit causes the memory to output the expected test data stored therein at the address output by the CAM. Comparison circuitry receives the test pattern from the input, and compares that received test pattern to the expected test data output by the control circuit, and generates an error count as a function of a number of bit mismatches between the received test pattern and the expected test data.

Abstract: Disclosed herein is a test apparatus for a device under test. The test apparatus includes a voltage translator coupled to receive test data from the device under test, over a physical interface, using one of a plurality of I/O standards, with the voltage translator being capable of communication using each of the plurality of I/O standards. A programmable interface is configured to receive the test data from the voltage translator. A bit error rate determination circuit is configured to receive the test data from the programmable interface and to determine a bit error rate of reception of the test data over the physical interface based upon a comparison of the test data to check data.

Abstract: Disclosed herein is a digital to analog converter including a first dynamic latch receiving a data signal and an inverse of the data signal. The first dynamic latch is clocked by a clock signal and configured to generate first and second quad switching control signals as a function of the data signal and the inverse of the data signal. A second dynamic latch receives the data signal and the inverse of the data signal, is clocked by an inverse of the clock signal, and is configured to generate third and fourth quad switching control signals as a function of the data signal and the inverse of the data signal. A quad switching bit cell is configured to generate an analog representation of the data signal as a function of the first, second, third, and fourth quad switching signals.

Abstract: Disclosed herein is a digital to analog converter including a first dynamic latch receiving a data signal and an inverse of the data signal. The first dynamic latch is clocked by a clock signal and configured to generate first and second quad switching control signals as a function of the data signal and the inverse of the data signal. A second dynamic latch receives the data signal and the inverse of the data signal, is clocked by an inverse of the clock signal, and is configured to generate third and fourth quad switching control signals as a function of the data signal and the inverse of the data signal. A quad switching bit cell is configured to generate an analog representation of the data signal as a function of the first, second, third, and fourth quad switching signals.

Abstract: Disclosed herein is a test apparatus for a device under test. The test apparatus includes a voltage translator coupled to receive test data from the device under test, over a physical interface, using one of a plurality of I/O standards, with the voltage translator being capable of communication using each of the plurality of I/O standards. A programmable interface is configured to receive the test data from the voltage translator. A bit error rate determination circuit is configured to receive the test data from the programmable interface and to determine a bit error rate of reception of the test data over the physical interface based upon a comparison of the test data to check data.

Abstract: CRC generation circuitry includes a lookup-table storing N-bit CRC values for M one-hot data frames. N AND gates for each bit of a M-bit data frame receive that bit of the M-bit data frame and a different bit of a N-bit CRC value from the lookup-table corresponding to a position of the bit in the M-bit data frame. N exclusive-OR gates each receive output from one of the N AND gates for each bit of the M-bit data frame. The N exclusive-OR gates generate a final N-bit CRC value for the M-bit data frame. The CRC value is therefore generated with a purely combinational circuit, without clock cycle latency. Area consumption is small due to the small lookup-table, which itself permits use of any generator polynomial, and is independent of the width of the received data frame. This device can also generate a combined CRC for multiple frames.

Abstract: Disclosed herein is a test circuit for testing a device under test (DUT). The test circuit receives a test pattern output by the DUT. A content addressable memory (CAM) stores expected test data at a plurality of address locations, receives the test pattern, and outputs an address of the CAM containing expected test data matching the received test pattern. A memory also stores the expected test data at address locations corresponding to the address locations of the CAM. A control circuit causes the memory to output the expected test data stored therein at the address output by the CAM. Comparison circuitry receives the test pattern from the input, and compares that received test pattern to the expected test data output by the control circuit, and generates an error count as a function of a number of bit mismatches between the received test pattern and the expected test data.

Abstract: A digital-to-analog converter has an output. An analog-to-digital converter senses a voltage at the output of the digital-to-analog converter and generates a digital voltage signal. A source mismatch estimator processes the digital voltage signal to output an error signal indicative of current source mismatch within the digital-to-analog converter. An error code generator generates a digital calibration signal from the error signal. The digital calibration signal is converted by a redundancy digital-to-analog converter to an analog compensation signal for application to the output of analog-to-digital converter to nullify effects of the current source mismatch.

Abstract: An asynchronous SAR ADC converts an analog signal into a series of digital pulses in an efficient, low power manner. In synchronous SAR ADC circuits, a separate and cumbersome clock signal is used to trigger the internal circuitry of the SAR ADC. Instead of triggering the components of the SAR DAC synchronously with a clock signal, the asynchronous solution uses its own internal signals to trigger its components in an asynchronous cyclic manner. Further, in order to increase efficiency and guard against circuit failures due to difficulties arising from transient signals, the asynchronous SAR ADC may also include a delay circuit for introducing a variable delay to the SAR ADC cycle.

Abstract: An asynchronous SAR ADC converts an analog signal into a series of digital pulses in an efficient, low power manner. In synchronous SAR ADC circuits, a separate and cumbersome clock signal is used to trigger the internal circuitry of the SAR ADC. Instead of triggering the components of the SAR DAC synchronously with a clock signal, the asynchronous solution uses its own internal signals to trigger its components in an asynchronous cyclic manner. Further, in order to increase efficiency and guard against circuit failures due to difficulties arising from transient signals, the asynchronous SAR ADC may also include a delay circuit for introducing a variable delay to the SAR ADC cycle.

Abstract: An asynchronous SAR ADC to convert an analog signal into a series of digital pulses in an efficient, low power manner. In synchronous SAR ADC circuits, a separate and cumbersome clock signal is used to trigger the internal circuitry of the SAR ADC. Instead of triggering the components of the SAR DAC synchronously with a clock signal, the asynchronous solution uses its own internal signals to trigger its components in an asynchronous cyclic manner. Further, in order to increase efficiency and guard against circuit failures due to difficulties arising from transient signals, the asynchronous SAR ADC may also include a delay circuit for introducing a variable delay to the SAR ADC cycle.

Abstract: An asynchronous SAR ADC to convert an analog signal into a series of digital pulses in an efficient, low power manner. In synchronous SAR ADC circuits, a separate and cumbersome clock signal is used to trigger the internal circuitry of the SAR ADC. Instead of triggering the components of the SAR DAC synchronously with a clock signal, the asynchronous solution uses its own internal signals to trigger its components in an asynchronous cyclic manner. Further, in order to increase efficiency and guard against circuit failures due to difficulties arising from transient signals, the asynchronous SAR ADC may also include a delay circuit for introducing a variable delay to the SAR ADC cycle.

Abstract: A device for implementing a sum-of-products expression includes a first set of 2-input Shift-and-Add (2SAD) blocks receiving a coefficient set/complex sum-of-products expression for generating a first set of partially optimized expression terms by applying recursive optimization therein, a second set of 1-input Shift-and-Add (1SAD) blocks receiving response from the 2SAD blocks for generating a second set of partially optimized expression terms by applying vertical optimization therein, a third set of 2SAD blocks receiving recursively and vertically optimized response from the first set of 2SAD block and the second set of 1SAD blocks for generating a third set of partially optimized expression terms by applying horizontal optimization therein, a fourth set of 2SAD blocks receiving response from the blocks for generating a fourth set of partially optimized expression terms by applying decomposition and factorization, and a fifth set of 2SAD blocks receiving response from the fourth set of 2SAD blocks, for gene

Abstract: Embodiments of the present invention disclose operational amplifiers which demonstrate good settling behavior with minimum over-shoot or ringing for improving settling behavior. The amplifiers include one or more amplification stages connected to form a symmetric structure. The amplification stage includes a boosting amplifier, a MOS transistor and a compensation capacitor. The MOS transistor can be an NMOS transistor and a PMOS transistor. Using this scheme pole-zero doublets are rearranged in a manner to improve the transient settling response.

Abstract: A minimal area integrated polyphase interpolation filter uses a symmetry of coefficients for a channel of input data. The filter includes an input interface block for synchronizing the input signal to a first internal clock signal; a memory block for providing multiple delayed output signals; a multiplexer input interface block for outputting a selected plurality of signals for generating mirror image coefficient sets in response to a second set of internal control signals, a coefficient block for generating mirror image and/or symmetric coefficient sets, and to output a plurality of filtered signals, an output multiplexer block for performing selection, gain control and data width control on said plurality of filtered signals, an output register block synchronizing the filtered signals, and a control block generating clock signals for realization of the filter and to delay between two channels to access a coefficient set, thereby minimizing hardware in the filter.

Abstract: A continuous time common mode feedback module is capable of operating in a wide range of input voltages. The common mode feedback module includes a common mode detector and an amplifier for computing and amplifying the difference of a reference voltage and a common mode voltage of a first input signal and a second input signal. The common-mode feedback module includes a common mode resolver and a control voltage generating module coupled to each other to provide a common mode feedback voltage. The common mode feedback module provides a good linearity and a wide bandwidth, without compensation requirements. The common mode feedback module also provides small process corner dependence of bias current and a common mode offset.

Abstract: Embodiments of the present invention provide a low voltage continuous time common mode feedback (CMFB) module, for low voltage operational amplifiers, providing good linearity, wide bandwidth and low systematic offset. The common mode feedback module includes a controlling module and an initializing module. The controlling module and the initializing module are parallel common mode feedback loops. The controlling module is a main CMFB loop and the initializing module is an auxiliary CMFB loop and both the loops work simultaneously. The controlling module and the initializing module receive a first differential input voltage and a second differential input voltage supplied by differential outputs of a main differential amplifier. Both the CMFB loops are low gain amplifiers in order to provide operation as linear as possible over the entire differential output operating range of the main differential amplifier.