Patents by Inventor Ralf Gothel

Ralf Gothel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Calibrating wafer and method for the production of a calibrating wafer
    Patent number: 6050125
    Abstract: A calibrating wafer and a method for the production of a calibrating wafer having polymer microspheres. The polymer microspheres are subjected to a heat treatment in a temperature range in which the polymer microspheres start to soften.
    Type: Grant
    Filed: August 27, 1998
    Date of Patent: April 18, 2000
    Assignee: Siemens Aktiengesellschaft
    Inventors: Stefan Geyer, Michael Horn, Ralf Gothel, Kathrin Kurth