Abstract: A measuring device to measure a magnetic field having at least one measuring coil and at least one sensor to measure low-frequency magnetic fields, which measuring coil and which sensor have their planes of extension each positioned or positionable transverse to the flux direction of the magnetic field. The measuring coil and the sensor are connected to a signal processing device with which, depending on a first measurement signal provided by the measuring coil and a second measurement signal provided by the sensor, an output signal that essentially corresponds to the magnetic field can be generated. The measuring coil, the sensor, and the signal processing device are monolithically integrated into a semiconductor chip. The measuring coil may also be formed by means of traces of a printed circuit board on which the semiconductor chip that has the sensor and the signal processing device is located.

Abstract: A measuring device to measure a magnetic field having at least one measuring coil and at least one sensor to measure low-frequency magnetic fields, which measuring coil and which sensor have their planes of extension each positioned or positionable transverse to the flux direction of the magnetic field. The measuring coil and the sensor are connected to a signal processing device with which, depending on a first measurement signal provided by the measuring coil and a second measurement signal provided by the sensor, an output signal that essentially corresponds to the magnetic field can be generated. The measuring coil, the sensor, and the signal processing device are monolithically integrated into a semiconductor chip. The measuring coil may also be formed by means of traces of a printed circuit board on which the semiconductor chip that has the sensor and the signal processing device is located.

Abstract: A method for testing a Hall magnetic field sensor on a wafer includes generating a current flow in a Hall plate of the Hall magnetic field sensor. At least one voltage value across first and second nodes is measured and a measured voltage signal is provided indicative thereof. An electrical resistance based upon the measured voltage and the current is then determined, in the absence of an applied test magnet field.

Abstract: A method for testing a Hall magnetic field sensor on a wafer includes generating a current flow in a Hall plate of the Hall magnetic field sensor. At least one voltage value across first and second nodes is measured and a measured voltage signal is provided indicative thereof. An electrical resistance based upon the measured voltage and the current is then determined, in the absence of an applied test magnet field.

Abstract: A sensor system with variable sensor-signal processing comprises an integrated circuit sensor unit. The integrated circuit sensor unit includes a sensor element that provides a sensed signal in response to a measurement variable, and a memory device that stores adjustable coefficient values. The integrated circuit sensor units also includes a sensor signal processing unit that processes the sensed signal using adjustable coefficient values to provide a sensor output signal on a output line. The sensor system receives updated adjustable coefficient values via the output line and stores the updated adjustable coefficient values in the memory device.

Abstract: The invention relates to an integrated circuit with a single sensor element (1) for converting a physical variable into an electrical signal, comprising a comparator unit (4) by which means the electrical signal of the sensor element (1) can be compared with various different threshold values in order to produce different discreet circuit states and an output unit (5) for outputting an output signal representing the different discreet circuit states or the comparator unit (4). The threshold values of the comparators of the comparator unit (4) are stored in a storage unit of the integrated circuit in such a way that they can be regulated with a control device (3). The integrated circuit has a single output terminal (7a) on which the various circuit states of the electrical signal can be picked off in code.

Abstract: A sensor system includes a sensor signal processing unit and an analytical unit. The analytical unit is designed in such a way that at least one parameter for signal processing can be redefined on the basis of the output signals delivered by the sensor processing unit. At least one connecting line between a sensor-signal processing unit and the analytical unit establishes a connection for transmitting at least one of the newly defined parameters for processing the sensor signal to the sensor-signal processing unit. The sensor-signal processing unit is inventively designed in such a way that the newly transmitted parameters for processing the sensor signal replace the originally prescribed parameters.

Abstract: A sensor module (1) is constructed as a solid state integrated circuit (IC) and has a sensor (2) as well as at least one measuring amplifier (3), wherein the sensor module has external connections at least for the power supply and for the output measurement signal. In the sensor module an evaluation circuit (6) is provided that is connected to at least one internal measurement point of the circuit. The evaluation circuit (6) is connected to a modulator (10) for modulation of the supply current and/or the supply voltage and/or the output measurement signal, in order to output a diagnostic signal, which is formed from an internal circuit measurement value, via the available external connections of the sensor module.