Abstract: A microscope includes a light source(s) which produce an illumination beam path comprising light in a plurality of wavelength regions. A dichroic beam splitter arrangement having a dichroic mirror surface is arranged between objective optics and a tube lens in a beam path portion to produce a reflected partial beam and a transmitted partial beam. The beam splitter arrangement changes a propagation direction of the reflected partial beam relative to the illumination beam path by a specified deflection angle. The mirror surface is arranged at an angle of 22.5±7.5°. The beam splitter arrangement includes a further mirror(s) arranged in the reflected beam path. The propagation direction of the reflected partial beam is changed by the specified deflection angle using the sum of all reflections on the mirror surface and the further mirror(s).

Abstract: An illumination device for an optical device, a microscope or a macroscope includes a first illumination source configured to emit light which is directed via an illumination beam path onto an object to be illuminated that is arranged in an object plane. At least one second illumination source is positionable in the illumination beam path, and is transparent or semitransparent as well as self-luminous. The at least one second illumination source is configured to allow light emitted from the first illumination source to pass through at least in part. The object plane having the object to be illuminated is configured to be illuminated both by the first and by the at least one second illumination source.

Abstract: A microscope includes a light source(s) which produce an illumination beam path comprising light in a plurality of wavelength regions. A dichroic beam splitter arrangement having a dichroic mirror surface is arranged between objective optics and a tube lens in a beam path portion to produce a reflected partial beam and a transmitted partial beam. The beam splitter arrangement changes a propagation direction of the reflected partial beam relative to the illumination beam path by a specified deflection angle. The mirror surface is arranged at an angle of 22.5±7.5°. The beam splitter arrangement includes a further mirror(s) arranged in the reflected beam path. The propagation direction of the reflected partial beam is changed by the specified deflection angle using the sum of all reflections on the mirror surface and the further mirror(s).

Abstract: A method for autofocusing in microscopic examination of a specimen located at the focus of a microscope objective uses an autofocus beam path, the autofocus beam path being directed, via a deflection device arranged on the side of the microscope objective facing away from the specimen, toward the microscope objective, and from there onto a reflective autofocus interface in the specimen region. The autofocus beam path is reflected at the autofocus interface and directed via the microscope objective and the deflection device toward an autofocus detector. The deflection device comprises two regions spaced apart from one another in a propagation direction of the autofocus beam path. Each region reflects the autofocus beam path. The autofocus detector is arranged in a plane conjugated with the microscope objective pupil to acquire an interference pattern. The focus of the microscope is adjusted as a function of the acquired interference pattern.

Abstract: An illumination device for an optical device, a microscope or a macroscope includes a first illumination source configured to emit light which is directed via an illumination beam path onto an object to be illuminated that is arranged in an object plane. At least one second illumination source is positionable in the illumination beam path, and is transparent or semitransparent as well as self-luminous. The at least one second illumination source is configured to allow light emitted from the first illumination source to pass through at least in part. The object plane having the object to be illuminated is configured to be illuminated both by the first and by the at least one second illumination source.

Abstract: A microscope includes: an objective turret holding a micro and a macro objective for rotation to operational positions along an optical axis; observation optics in an imaging beam path, and an illumination device including a beam splitter for generating an illumination beam path and coupling the illumination beam path into the imaging beam path, the macro objective including a first subsystem attachable to the objective turret, and a second subsystem insertable into the imaging beam path between the turret and the observation optics when the first subsystem is operational, the illumination device allowing a telecentric beam path with an illumination pupil produced by either the micro objective or the macro objective, and adjustment optics in the illumination beam path having positive refractive power and causing the illumination pupil to be shifted to a rear exit pupil, located between the first optical subsystem and the beam splitter, of the macro objective.

Abstract: The present invention relates to an autofocus aperture stop (5, 6) in a triangulating autofocusing device (21) for a microscope (40), wherein the autofocus aperture stop (5, 6) comprises at least one diaphragm opening (3, 4) with which a measuring beam pencil (34) used for the autofocusing and running in the direction of the optical axis (18) of the autofocusing device (21) can be limited in its cross section, wherein the diaphragm opening (3, 4) of the autofocus aperture stop (5, 6) is arranged in a decentred position at a spacing from the optical axis (18) of the autofocusing device (21), wherein a decentred autofocus measuring beam (36) can be generated by the diaphragm opening (3, 4) in one half of the cross section (17) of the measuring beam pencil (34).

Abstract: A method for autofocusing in microscopic examination of a specimen located at the focus of a microscope objective uses an autofocus beam path, the autofocus beam path being directed, via a deflection device arranged on the side of the microscope objective facing away from the specimen, toward the microscope objective, and from there onto a reflective autofocus interface in the specimen region. The autofocus beam path is reflected at the autofocus interface and directed via the microscope objective and the deflection device toward an autofocus detector. The deflection device comprises two regions spaced apart from one another in a propagation direction of the autofocus beam path. Each region reflects the autofocus beam path. The autofocus detector is arranged in a plane conjugated with the microscope objective pupil to acquire an interference pattern. The focus of the microscope is adjusted as a function of the acquired interference pattern.

Abstract: An inverted microscope for the high-contrast imaging of objects includes multiple objectives configured to be disposable in an imaging beam path. Each objective has a respective objective pupil associated therewith. A lens system is also provided for generating respective intermediate images of the respective objective pupils. A modulator disposing device, which includes a plurality of modulators, is configured to dispose the modulators at predetermined respective locations on an optical axis corresponding to the locations of the respective intermediate images of the respective objective pupils so as to contrast an object image.

Abstract: The present invention relates to a microscope (18), including an objective turret (14) for holding at least one micro objective (15) which can be rotated into an operation position on an optical axis (3), further including observation optics (9) in an imaging beam path (29), and a macro objective (5) composed of a plurality of optical subsystems (5a, 5b); a first optical subsystem (5a) being attachable to the objective turret (14), and a second optical subsystem (5b) being insertable into the imaging beam path (29) between the objective turret (14) and the observation optics (9); provision being made for an incident illumination device (20) generating a telecentric illumination beam path (28) and including a beam splitter (12) for coupling the illumination beam path (28) into the imaging beam path (29); said incident illumination device allowing an illumination beam path (28) with an illumination pupil (26) on the objective side to be produced both by a micro objective (15) in its operating position and, alte

Abstract: The present invention relates to an autofocus aperture stop (5, 6) in a triangulating autofocusing device (21) for a microscope (40), wherein the autofocus aperture stop (5, 6) comprises at least one diaphragm opening (3, 4) with which a measuring beam pencil (34) used for the autofocusing and running in the direction of the optical axis (18) of the autofocusing device (21) can be limited in its cross section, wherein the diaphragm opening (3, 4) of the autofocus aperture stop (5, 6) is arranged in a decentred position at a spacing from the optical axis (18) of the autofocusing device (21), wherein a decentred autofocus measuring beam (36) can be generated by the diaphragm opening (3, 4) in one half of the cross section (17) of the measuring beam pencil (34).

Abstract: The present invention relates to an imaging device (1) for imaging microscopic or macroscopic objects (5). The imaging device (1) comprises a light source (2), an illumination beam path (6), an imaging beam path (7) and an imaging optical means (4), in particular in the form of an objective. The illumination beam path (6) extends from the light source (2) to the object (5). The imaging beam path (7) extends from the object (5) to a detector or a tube (3). At least one polarization means (9) is provided in the illumination beam path (6), which polarization means (9) can be used to convert the light of the light source to a prescribable polarization state. An analyzer means (10) is provided in the imaging beam path (7), with the analyzer means (10) and the polarization means (9) being able to be adjusted in relation to one another in such a manner that the light entering the imaging beam path (7) cannot pass through the analyzer means (10).

Abstract: The present invention relates to a polarization interference microscope (1) for imaging objects (5). The polarization interference microscope (1) comprises a light source (2), an illumination beam path (6), an imaging beam path (7) and an objective (4). The illumination beam path (6) extends from the light source (2) to the object (5). The imaging beam path (7) extends from the object (5) to a detector or a tube (3). At least one polarization means (9) is provided in the illumination beam path (6) and/or in the imaging beam path (7), by which at least one polarization means the light of the respective beam path (6, 7) can be converted into a predeterminable polarization state. An analyzer means (10) is provided in the imaging beam path (7). A birefringent component is provided between the polarization means (9) and the analyzer means (10), by which birefringent component the light polarized by the polarization means (9) can be divided into two partial beams (13, 14) having different polarization directions.

Abstract: An inverted microscope for the high-contrast imaging of objects includes multiple objectives configured to be disposable in an imaging beam path. Each objective has a respective objective pupil associated therewith. A lens system is also provided for generating respective intermediate images of the respective objective pupils. A modulator disposing device, which includes a plurality of modulators, is configured to dispose the modulators at predetermined respective locations on an optical axis corresponding to the locations of the respective intermediate images of the respective objective pupils so as to contrast an object image.

Abstract: The invention concerns an apparatus for implementing phase-contrast or modulation-contrast observation on microscopes with the aid of a modulator (7) arranged in each pupil plane in the observation beam path and containing at least one layer modifying the phase or amplitude, and of a stop (3) arranged in the illumination beam path. For stepless adaptation of the phase shift, the modulator (7) is mounted tiltably. The invention further concerns a method for implementing a defined phase shift.

Abstract: A microscope (10) is disclosed, having a revolving nosepiece (12) on which are mounted multiple objectives. The objectives (11) comprise multiple components 211, . . . 21n). A light-intensity-reducing layer (40) is applied onto at least one component of an objective. The light-intensity-reducing layer (40) is configured in such a way that for each objective introduced into the illumination beam path, the brightness behind it is of the same magnitude.

Abstract: A method for combining a first and a second ray bundle includes forming a first partial beam and a second partial beam by the first ray bundle interacting with a first beam-splitter layer, and forming a third partial beam and a fourth partial beam by the second ray bundle interacting with the first beam-splitter layer. The first, second, third and fourth partial beams are superimposed into an outgoing ray bundle by the first, second, third and fourth partial beams interacting with a second beam-splitter layer so that, in the outgoing ray bundle, the number of occurring reflections and transmissions of the first and second partial beams are basically the same as the number of occurring reflections and transmissions of the third and fourth partial beams.

Abstract: The present invention concerns a microscope and an illumination device for a microscope that ensure optimal illumination in the standard (10×–100×), scanning (1.6×–5×), and macro (1×–1.6×) ranges. The illumination system comprises only one condenser head that can be switched in or out and that can optimally illuminate the entire range from 1× to 100×, and a movably arranged focusing lens that ensures optimal adaptation of the illumination to the entrance pupil for all ranges.

Abstract: A microscope (10) is disclosed, having a revolving nosepiece (12) on which are mounted multiple objectives. The objectives (11) comprise multiple components 211, . . . 21n). A light-intensity-reducing layer (40) is applied onto at least one component of an objective. The light-intensity-reducing layer (40) is configured in such a way that for each objective introduced into the illumination beam path, the brightness behind it is of the same magnitude.

Abstract: A method for combining a first and a second ray bundle includes forming a first partial beam and a second partial beam by the first ray bundle interacting with a first beam-splitter layer, and forming a third partial beam and a fourth partial beam by the second ray bundle interacting with the first beam-splitter layer. The first, second, third and fourth partial beams are superimposed into an outgoing ray bundle by the first, second, third and fourth partial beams interacting with a second beam-splitter layer so that, in the outgoing ray bundle, the number of occurring reflections and transmissions of the first and second partial beams are basically the same as the number of occurring reflections and transmissions of the third and fourth partial beams.