Patents by Inventor Ralf Kurch

Ralf Kurch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Metrological apparatus and method for adjusting the attitude of a rotation-symmetrical workpiece
    Patent number: 10239177
    Abstract: A metrological apparatus (15) is disposed for adjustment of an attitude of a workpiece (16) having an arcuate upper surface (17) relative to a rotary axis (C) of the metrological apparatus (15). The workpiece (16) is brought into a first rotary position (c1). A plurality of measured points within a measuring plane on the upper surface (17) is recorded. The workpiece (16) is moved into a further rotary position (c2) about the rotary axis (C), and again measured points in the measuring plane (E) on the upper surface (17) of the workpiece (16) are recorded. Based on these recorded measured points, the actual attitude (Li) of the workpiece (16) deviation from a specified target attitude (Ls) are determined. Adjustment parameters are determined, and an adjustment assembly (24) of the metrological apparatus (15) is activated as a function of the calculated adjustment parameters to adjust the workpiece (16).
    Type: Grant
    Filed: June 7, 2017
    Date of Patent: March 26, 2019
    Assignee: Carl Mahr Holding GmbH
    Inventors: Axel Wiegmann, Stefan Mika, Ralf Kurch
  • Metrological Apparatus and Method for Adjusting the Attitude of a Rotation-Symmetrical Workpiece
    Publication number: 20170348814
    Abstract: A metrological apparatus (15) is disposed for adjustment of an attitude of a workpiece (16) having an arcuate upper surface (17) relative to a rotary axis (C) of the metrological apparatus (15). The workpiece (16) is brought into a first rotary position (c1). A plurality of measured points within a measuring plane on the upper surface (17) is recorded. The workpiece (16) is moved into a further rotary position (c2) about the rotary axis (C), and again measured points in the measuring plane (E) on the upper surface (17) of the workpiece (16) are recorded. Based on these recorded measured points, the actual attitude (Li) of the workpiece (16) deviation from a specified target attitude (Ls) are determined. Adjustment parameters are determined, and an adjustment assembly (24) of the metrological apparatus (15) is activated as a function of the calculated adjustment parameters to adjust the workpiece (16).
    Type: Application
    Filed: June 7, 2017
    Publication date: December 7, 2017
    Inventors: Axel Wiegmann, Stefan Mika, Ralf Kurch