Patents by Inventor Ralf REITERER

Ralf REITERER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10761140
    Abstract: A method for producing a semiconductor device is described. In accordance with one example embodiment, the method comprises providing a virtual DUT in the form of a behavior model of the semiconductor device and developing at least one test in a test development environment for an automatic test equipment (ATE). In this case, commands are generated by means of the test development environment, which commands are converted into test signals by means of a software interface, which test signals are fed to the virtual DUT and are processable by the latter. The software interface processes response signals of the virtual DUT and reports information dependent on the response signals back to the test development environment.
    Type: Grant
    Filed: July 18, 2018
    Date of Patent: September 1, 2020
    Assignee: Infineon Technologies AG
    Inventors: Oliver Frank, Christoph Hazott, Georg Krebelder, Bruno Mariacher, Otto Pfabigan, Sebastian Pointner, Ralf Reiterer, Florian Starzer
  • Publication number: 20190033373
    Abstract: A method for producing a semiconductor device is described. In accordance with one example embodiment, the method comprises providing a virtual DUT in the form of a behavior model of the semiconductor device and developing at least one test in a test development environment for an automatic test equipment (ATE). In this case, commands are generated by means of the test development environment, which commands are converted into test signals by means of a software interface, which test signals are fed to the virtual DUT and are processable by the latter. The software interface processes response signals of the virtual DUT and reports information dependent on the response signals back to the test development environment.
    Type: Application
    Filed: July 18, 2018
    Publication date: January 31, 2019
    Inventors: Oliver FRANK, Christoph HOZOTT, Georg KREBELDER, Bruno MARIACHER, Otto PFABIGAN, Sebastian POINTNER, Ralf REITERER, Florian STARZER