Patents by Inventor Ralf Steinmann

Ralf Steinmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Process and device for the parameterization of measuring device
    Patent number: 8874401
    Abstract: In a measuring device, the measured data of a data recording component (10) are transmitted to an evaluating component via an output device (12). Parameters of the measuring device are stored in a memory (18). For the purpose of parameterization, parameters from the evaluating component can be stored in the memory (18) over a data cable for transmitting the measured data. To this end, the output device (12) for this data cable (Z) is operated at high impedance.
    Type: Grant
    Filed: January 18, 2008
    Date of Patent: October 28, 2014
    Assignee: Sick Stegmann GmbH
    Inventors: Josef Siraky, Willibald Stobbe, Ralf Steinmann
  • Process and device for the parameterization of measuring device
    Publication number: 20080177494
    Abstract: In a measuring device, the measured data of a data recording component (10) are transmitted to an evaluating component via an output device (12). Parameters of the measuring device are stored in a memory (18). For the purpose of parameterization, parameters from the evaluating component can be stored in the memory (18) over a data cable for transmitting the measured data. To this end, the output device (12) for this data cable (Z) is operated at high impedance.
    Type: Application
    Filed: January 18, 2008
    Publication date: July 24, 2008
    Inventors: Josef Siraky, Willibald Stobbe, Ralf Steinmann