Abstract: An actuator comprising a movable electrode and a static electrode is disclosed. An exemplary actuator is actuateable using an electrical potential difference that is applied between the movable electrode and the static electrode. The actuator comprises static bridge contacts with conductive surfaces, and a contact area with a conductive surface facing said bridge contacts located on the movable electrode. An electrically conductive contact is established between the bridge contacts, when the movable electrode contacts the static electrode. The movable electrode comprises at least two elements, a first element and a second element. The second element is movable with respect to the first element.

Abstract: A probe system is provided that includes a linear and/or two-dimensional sensor array for obtaining information regarding a test piece. The sensor elements of the sensor array may include ultrasonic, eddy current, magnetic, and/or piezoelectric elements. The sensor array may be utilized to detect movement of the probe with respect to the test piece, and may be further utilized to obtain data regarding the test piece, such as image data, for example with respect to a characteristic of the test piece in detecting and locating flaws. A CAD type file or other graphical or image file of the test piece may be displayed concurrently with image data of the test piece obtained by the probe for example to assist an operator in navigating the probe with respect to the test piece, and/or to determine a coordinate location of characteristics of the test piece with respect to the CAD type file.

Abstract: Briefly, in accordance with one or more embodiments, a probe of a probe systems may comprise a linear and/or two-dimensional sensor array for obtaining information regarding a test piece. The sensor elements of the sensor array may comprise ultrasonic, Eddy Current, magnetic, and/or piezoelectric elements or the like. The sensor array may be utilized to detect movement of the probe with respect to the test piece, and may be further utilized to obtain data regarding the test piece, such as image data, for example with respect to a characteristic of the test piece in detecting and locating flaws. A CAD type file or other graphical or image file of the test piece may be displayed concurrently with image data of the test piece obtained by the probe for example to assist an operator in navigating the probe with respect to the test piece, and/or to determine a coordinate location of characteristics of the test piece with respect to the CAD type file.

Abstract: The subject of the invention is a passive indicator of voltage presence used to indicate voltage in electrical conductors, electrically powered devices, power distribution devices and transmission lines of high, medium and low voltage. The indicator according to the invention is characterized in that it has form of a multilayer plate comprising two electrically conductive layers (2, 4) and an intermediate layer (3) of a structure manifesting electrooptical properties, located between them, wherein the intermediate layer is a display element of the indicator, while the conductive layers are electrodes of that display element and they are electrically connected by means of a diode (5), and one of the conductive layers is at least partially transparent.

Abstract: A bistable structure provided by the invention is characterized as including a deflection element that has mechanically constrained end points and a compliant span between the end points that is substantially free to deflect between two stable positions when a force is applied at a point along the span. The deflection element span is provided, as-fabricated, curved in one of the two stable positions and in a mechanically unstressed condition along the length of the span. The as-fabricated curve of the deflection element span includes a curve maxima at a point along the span length that is at least about ¼ of the span length from the end points of the span. The deflection element span is constrained to substantially prohibit development of a second bending mode that is characteristic for the span as the element deflects between the two stable positions.

Abstract: A bistable structure provided by the invention is characterized as including a deflection element that has mechanically constrained end points and a compliant span between the end points that is substantially free to deflect between two stable positions when a force is applied at a point along the span. The deflection element span is provided, as-fabricated, curved in one of the two stable positions and in a mechanically unstressed condition along the length of the span. The as-fabricated curve of the deflection element span includes a curve maxima at a point along the span length that is at least about ¼ of the span length from the end points of the span. The deflection element span is constrained to substantially prohibit development of a second bending mode that is characteristic for the span as the element deflects between the two stable positions.