Abstract: A system and a method for characterizing a dielectric material are provided. The system and method generally include applying an excitation signal to electrodes on opposing sides of the dielectric material to evaluate a property of the dielectric material. The method can further include measuring the capacitive impedance across the dielectric material, and determining a variation in the capacitive impedance with respect to either or both of a time domain and a frequency domain. The measured property can include pore size and surface imperfections. The method can still further include modifying a processing parameter as the dielectric material is formed in response to the detected variations in the capacitive impedance, which can correspond to a non-uniformity in the dielectric material.

Abstract: A system and a method for characterizing a dielectric material are provided. The system and method generally include applying an excitation signal to electrodes on opposing sides of the dielectric material to evaluate a property of the dielectric material. The method can further include measuring the capacitive impedance across the dielectric material, and determining a variation in the capacitive impedance with respect to either or both of a time domain and a frequency domain. The measured property can include pore size and surface imperfections. The method can still further include modifying a processing parameter as the dielectric material is formed in response to the detected variations in the capacitive impedance, which can correspond to a non-uniformity in the dielectric material.

Abstract: A computer executing a software algorithm may be used to detect a depression in a temperature profile. The temperature profile may be smoothed to eliminate noise. Next, the temperature profile's center may be extracted. A polynomial may be fitted to extracted data. An algorithm used to fit the polynomial may guarantee that the fitted curve's peak may be below the actual temperature data's peak. Next, residuals may be calculated by subtracting the fitted curve from the actual data. If there is a dip at the center, then the residuals in the center may be less than zero. The software algorithm executing on the computer may then make a decision based on a sign of the residuals. For example, residuals less than zero may indicate bar porosity. Residuals above zero may indicate no porosity. The magnitude of the residuals may then be used to classify a size of a detected defect.

Abstract: A computer executing a software algorithm may be used to detect a depression in a temperature profile. The temperature profile may be smoothed to eliminate noise. Next, the temperature profile's center may be extracted. A polynomial may be fitted to extracted data. An algorithm used to fit the polynomial may guarantee that the fitted curve's peak may be below the actual temperature data's peak. Next, residuals may be calculated by subtracting the fitted curve from the actual data. If there is a dip at the center, then the residuals in the center may be less than zero. The software algorithm executing on the computer may then make a decision based on a sign of the residuals. For example, residuals less than zero may indicate bar porosity. Residuals above zero may indicate no porosity. The magnitude of the residuals may then be used to classify a size of a detected defect.

Abstract: A computer executing a software algorithm may be used to detect a depression in a temperature profile. The temperature profile may be smoothed to eliminate noise. Next, the temperature profile's center may be extracted. A polynomial may be fitted to extracted data. An algorithm used to fit the polynomial may guarantee that the fitted curve's peak may be below the actual temperature data's peak. Next, residuals may be calculated by subtracting the fitted curve from the actual data. If there is a dip at the center, then the residuals in the center may be less than zero. The software algorithm executing on the computer may then make a decision based on a sign of the residuals. For example, residuals less than zero may indicate bar porosity. Residuals above zero may indicate no porosity. The magnitude of the residuals may then be used to classify a size of a detected defect.

Abstract: A computer executing a software algorithm may be used to detect a depression in a temperature profile. The temperature profile may be smoothed to eliminate noise. Next, the temperature profile's center may be extracted. A polynomial may be fitted to extracted data. An algorithm used to fit the polynomial may guarantee that the fitted curve's peak may be below the actual temperature data's peak. Next, residuals may be calculated by subtracting the fitted curve from the actual data. If there is a dip at the center, then the residuals in the center may be less than zero. The software algorithm executing on the computer may then make a decision based on a sign of the residuals. For example, residuals less than zero may indicate bar porosity. Residuals above zero may indicate no porosity. The magnitude of the residuals may then be used to classify a size of a detected defect.

Abstract: A coupon for measuring the corrosion rates of metals in a hostile environment, including two or more thin-film resistive conductors formed on a substrate and positioned in close physical proximity so that they are subjected to essentially the same physical environment. One or more of the thin-film resistive conductors is directly exposed to the potentially corrosive environment while at least one of the thin-film elements is protected from the corrosive nature of the environment. The element or elements that are protected from corrosion are either shielded from the corrosive effects of the environment by the presence of a thermally thin protective layer or by being isolated from the corrosive environment while being maintained at essentially the same temperature as the elements exposed to the corrosive environment. The invention is also directed to a system for measuring the corrosion rate by measuring the change in resistance of the exposed conductor in comparison to the protected chamber.

Abstract: An alloy substrate is protected by a thermal barrier coating formed from a layer of metallic bond coat and a top coat formed from generally hollow ceramic particles dispersed in a matrix bonded to the bond coat.