Abstract: A method and apparatus for detecting diffraction radiation from a charged particle beam in order to measure parameters that characterize the charged particle beam. The charged particle beam passes near one or more edges, apertures, or interfaces between media of different dielectric constants such that the beam is not intercepted. This generates forward diffraction radiation and reflected diffraction radiation at an angle relative to the direction of the beam. The radiation passes through a focusing system and onto a detector which measures a desired parameter.

Abstract: The invention is a device to measure the emittance of a charged particle beam. The device is capable of providing precise time resolution limited only by the chosen detector. The device allows a complete emittance determination as a function of time. The preferred embodiment of the invention comprises a plurality of thin foils 11 which generate an optical transistion radiation (OTR) pattern 13; a lens system 14 to collect the OTR pattern 13 from the said foils 11: an optical mask 16 to allow passage of the OTR pattern 13 :and a detector array 17 or similar device placed behind the mask 16 which intercepts, senses and measures the point source OTR pattern 13 for each perforation in the mask.

Abstract: A transition radiation interference spectrometer for measuring the energy and divergence of a charged particle beam. Transition radiation is created by placing an interferometer in the path of the charged particle beam. The resulting interference pattern is focused and masked to define an angular element at a fixed angle with respect to the direction of specular reflection. The radiation in the angular element is dispersed into wavelength components. The intensity or amplitude of the wavelength components as a function of wavelength is indicative of the beam's energy and divergence.