Patents by Inventor Ralph Gerald Isaacs
Ralph Gerald Isaacs has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8045181Abstract: An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to produce a grating image after the light passes through the grating. The phase shifting unit is configured to form and reflect a plurality of phase shifted patterns of the grating image onto an object surface to form a plurality of projected phase shifting patterns. The imager is configured to obtain image data of the projected phase shifted patterns. The processor is configured to reconstruct the object surface from the image data. An inspection method and a phase shifting projector are also presented.Type: GrantFiled: May 21, 2009Date of Patent: October 25, 2011Assignee: General Electric CompanyInventors: Gil Abramovich, Kevin George Harding, Ralph Gerald Isaacs, Guiju Song, Joseph Benjamin Ross, Jianming Zheng
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Patent number: 7925075Abstract: A method for inspecting a feature of a part is provided. The method includes obtaining a profile corresponding to the feature using a sensor and projecting the profile onto a compensation plane normal to the feature for generating an updated profile. The method also includes using the updated profile for reducing a measurement error caused by an orientation of the sensor. An inspection system is also provided. The inspection system includes a sensor configured to capture a fringe image of a feature on a part. The inspection system further includes a processor configured to process the fringe image to obtain an initial profile of the feature and to project the initial profile onto a compensation plane normal to the feature.Type: GrantFiled: May 7, 2007Date of Patent: April 12, 2011Assignee: General Electric CompanyInventors: Ming Jia, Guiju Song, Jianming Zheng, Yu Ning, Kevin George Harding, Gil Abramovich, Joseph Benjamin Ross, Ralph Gerald Isaacs
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Patent number: 7888932Abstract: A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.Type: GrantFiled: November 5, 2007Date of Patent: February 15, 2011Assignee: General Electric CompanyInventors: William Stewart McKnight, Ui Suh, Yuri Plotnikov, Changting Wang, Ralph Gerald Isaacs
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Publication number: 20100296104Abstract: An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to produce a grating image after the light passes through the grating. The phase shifting unit is configured to form and reflect a plurality of phase shifted patterns of the grating image onto an object surface to form a plurality of projected phase shifting patterns. The imager is configured to obtain image data of the projected phase shifted patterns. The processor is configured to reconstruct the object surface from the image data. An inspection method and a phase shifting projector are also presented.Type: ApplicationFiled: May 21, 2009Publication date: November 25, 2010Applicant: GENERAL ELECTRIC COMPANYInventors: Gil Abramovich, Kevin George Harding, Ralph Gerald Isaacs, Guiju Song, Joseph Benjamin Ross, Jianming Zheng
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Publication number: 20090115410Abstract: A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.Type: ApplicationFiled: November 5, 2007Publication date: May 7, 2009Inventors: William Stewart McKnight, Ui Suh, Yuri Plotnikov, Changting Wang, Ralph Gerald Isaacs
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Patent number: 7499830Abstract: A computer-implemented method, system, and computer program code are provided for characterizing an edge break, e.g., part features and/or geometric discontinuities that could give rise to edge sharpness, as may be encountered in a chamfer, bevel, fillet and other part features. The methodology enables to accurately and consistently determine in a manufacturing setting, for example, any applicable geometric parameter for characterizing the edge break.Type: GrantFiled: November 15, 2005Date of Patent: March 3, 2009Assignee: General Electric CompanyInventors: Kevin George Harding, Jianming Zheng, Yongqing Li, Ming Jia, Guiju Song, Joseph Benjamin Ross, Ralph Gerald Isaacs
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Publication number: 20080281543Abstract: A method for inspecting a feature of a part is provided. The method includes obtaining a profile corresponding to the feature using a sensor and projecting the profile onto a compensation plane normal to the feature for generating an updated profile. The method also includes using the updated profile for reducing a measurement error caused by an orientation of the sensor. An inspection system is also provided. The inspection system includes a sensor configured to capture a fringe image of a feature on a part. The inspection system further includes a processor configured to process the fringe image to obtain an initial profile of the feature and to project the initial profile onto a compensation plane normal to the feature.Type: ApplicationFiled: May 7, 2007Publication date: November 13, 2008Applicant: GENERAL ELECTRIC COMPANYInventors: Ming Jia, Guiju Song, Jianming Zheng, Yu Ning, Kevin George Harding, Gil Abramovich, Joseph Benjamin Ross, Ralph Gerald Isaacs
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Publication number: 20080159477Abstract: A method of radiographic inspection of an object includes the steps of: providing a radiation source and a radiation detector located on opposite sides of the object; positioning the radiation detector to receive radiation transmitted through the object from the radiation source; radiographically imaging an region of interest of the object with the radiation source and the radiation detector, using an set of initial imaging parameters, to produce a test image; obtaining at least one quality measurement of the test image; comparing the quality measurement to predetermined image quality limits; and in response to the quality measurement exceeding the predetermined image quality limits, changing at least one of the initial imaging parameters to generate a new set of image parameters. The process may be repeated iteratively until a final set of imaging parameters is obtained.Type: ApplicationFiled: December 29, 2006Publication date: July 3, 2008Applicant: GENERAL ELECTRIC COMPANYInventors: Thomas William Birdwell, Ralph Gerald Isaacs, Joseph M. Portaz, Ronald Cecil McFarland
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Patent number: 6985238Abstract: A non-contact measurement system employing a non-contact optical sensor and an edge detection sensor with a positioning system for moving the sensors over the surface and edges of a part (A) held in a predetermined, fixed position. The part is aligned in a co-ordinate system for obtaining accurate measurements of the part's surface (S) and edges (E). For parts smaller than the optical sensor's field of view, the part is rotated about an axis so both sides of the part are viewed by the sensor. If required, the part can also be shifted linearly along a horizontal axis (X) parallel to the sensor. For parts larger in size than the sensor's field of view, the part is moved along a vertical axis (Y) in predetermined segments so all of the part is exposed to viewing by the sensor.Type: GrantFiled: September 25, 2002Date of Patent: January 10, 2006Assignee: General Electric CompanyInventors: Ralph Gerald Isaacs, John Charles Janning, Francis Howard Little, James Robert Reinhardt, Joseph Benjamin Ross
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Publication number: 20040057057Abstract: A non-contact measurement system employing a non-contact optical sensor and an edge detection sensor with a positioning system for moving the sensors over the surface and edges of a part (A) held in a predetermined, fixed position. The part is aligned in a co-ordinate system for obtaining accurate measurements of the part's surface (S) and edges (E). For parts smaller than the optical sensor's field of view, the part is rotated about an axis so both sides of the part are viewed by the sensor. If required, the part can also be shifted linearly along a horizontal axis (X) parallel to the sensor. For parts larger in size than the sensor's field of view, the part is moved along a vertical axis (Y) in predetermined segments so all of the part is exposed to viewing by the sensor.Type: ApplicationFiled: September 25, 2002Publication date: March 25, 2004Applicant: General Electric CompanyInventors: Ralph Gerald Isaacs, John Charles Janning, Francis Howard Little, James Robert Reinhardt, Joseph Benjamin Ross
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Patent number: 6711235Abstract: An X-ray inspection system is provided having an X-ray source and first and second collimators. The first and second collimators are arranged in relation to the source and the target such that the portion of the target actually illuminated by The X-ray beam is substantially equal to the size of a selected inspection zone.Type: GrantFiled: May 31, 2002Date of Patent: March 23, 2004Assignee: General Electric CormpanyInventors: Andrew Joseph Galish, Thomas William Birdwell, Ralph Gerald Isaacs, Francis Howard Little
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Publication number: 20030223547Abstract: An X-ray inspection system is provided having an X-ray source and first and second collimators. The first and second collimators are arranged in relation to the source and the target such that the portion of the target actually illuminated by The X-ray beam is substantially equal to the size of a selected inspection zone.Type: ApplicationFiled: May 31, 2002Publication date: December 4, 2003Applicant: General Electric CompanyInventors: Andrew Joseph Galish, Thomas William Birdwell, Ralph Gerald Isaacs, Francis Howard Little
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Patent number: 6167110Abstract: A detector (20) for high voltage x-rays includes a plurality of sensor elements (22) with each sensor element being aligned along a respective focal axis (25) with respect to a high voltage x-ray source (24). A fiber optic scintillator (34) is optically coupled to each of said sensor elements and is disposed to receive incident x-ray radiation passing from the object to be imaged. Optical fibers of the scintillator are positioned such that their optical axes are perpendicular to incident x-rays. Each sensor element has a length along the focal axis sufficiently long for the fibers to absorb substantially all incident x-rays. Each sensor element comprises an array of amorphous silicon photosensors disposed to detect light generated by the scintillator.Type: GrantFiled: November 3, 1997Date of Patent: December 26, 2000Assignee: General Electric CompanyInventors: Gerorge Edward Possin, Andrew Joseph Galish, Ralph Gerald Isaacs, Douglas Albagli, Ching-Yeu Wei, Thomas William Birdwell, Francis Howard Little, Sung Su Han